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Index by Author: Volume 74, Issue 2 (August 2002) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abdel-Rahman, Ulf [Abstract] [Full Text]; Abe, Tomio [Full Text]; Ackemann, Juergen [Abstract] [Full Text]; Addis, Bruce [Abstract] [Full Text]; Ahrens, Peter [Abstract] [Full Text]; Alexiou, Christos [Abstract] [Full Text]; Alifano, Marco [Abstract] [Full Text]; Angelini, Gianni D. [Abstract] [Full Text]; Angelini, Gianni D. [Abstract] [Full Text]; Aretz, H. Thomas [Abstract] [Full Text]; Arusoglu, Latif [Abstract] [Full Text]; Ascione, Raimondo [Abstract] [Full Text]; Aubert, Françoise [Abstract] [Full Text]; Aviérinos, Jean-François [Abstract] [Full Text]
B: Badia, Alain [Abstract] [Full Text]; Bafi, Ammar S. [Abstract] [Full Text]; Barmettler, Hanna [Abstract] [Full Text]; Bartels, Claus [Abstract] [Full Text]; Bauer, Matthias [Abstract] [Full Text]; Baumgartner, William A. [Full Text]; Bavaria, Joseph E. [Abstract] [Full Text]; Bechtel, J.F. Matthias [Abstract] [Full Text]; Becker, Horst Peter [Abstract] [Full Text]; Belkind, Noam [Abstract] [Full Text]; Berdat, Pascal A. [Abstract] [Full Text]; Berrebi, Alain J. [Abstract] [Full Text]; Bessho, Ryuzo [Abstract] [Full Text]; Bhagia, Suresh T. [Abstract] [Full Text]; Bhan, Anil [Abstract] [Full Text]; Bigley, Joyce E. [Abstract] [Full Text]; Biki, Barbara [Abstract] [Full Text]; Bird, Shawn J. [Abstract] [Full Text]; Blauth, Christopher I. [Full Text]; Boehm, Dieter H. [Abstract] [Full Text]; Bolotin, Gil [Abstract] [Full Text]; Bolotin, Gil [Abstract] [Full Text]; Bonan, Raoul [Abstract] [Full Text]; Bonnet, Jean-Louis [Abstract] [Full Text]; Bove, Kevin E. [Abstract] [Full Text]; Bové, Thierry [Abstract] [Full Text]; Boyce, Steven W. [Abstract] [Full Text]; Braxton, John H. [Abstract] [Full Text]; Brinster, Clay J. [Abstract] [Full Text]; Buenaventura, Percival O. [Abstract] [Full Text]; Busque, Stephan [Full Text]; Byrne, John G. [Abstract] [Full Text]
C: Caputo, Massimo [Abstract] [Full Text]; Carpentier, Alain F. [Abstract] [Full Text]; Carrel, Thierry P. [Abstract] [Full Text]; Chamberlain, Martin H. [Abstract] [Full Text]; Charlesworth, David C. [Abstract] [Full Text]; Chauvaud, Sylvain [Abstract] [Full Text]; Cheung, Albert T. [Abstract] [Full Text]; Chiariello, Luigi [Abstract] [Full Text]; Childers, Henry E. [Abstract] [Full Text]; Choudhary, Shiv Kumar [Abstract] [Full Text]; Christ, Frank [Abstract] [Full Text]; Christie, Neil A. [Abstract] [Full Text]; Clubb, Fred J., Jr [Abstract] [Full Text]; Colavolpe, Christian [Abstract] [Full Text]; Connolly, Mark W. [Abstract] [Full Text]; Coombs, Laura P. [Abstract] [Full Text]; Cooper, David S. [Abstract] [Full Text]; Cope, Jeffrey T. [Abstract] [Full Text]; Corso, Paul J. [Abstract] [Full Text]; Cyjon, Arnold [Abstract] [Full Text]; Czerny, Martin [Abstract] [Full Text]
D: Dacey, Lawrence J. [Abstract] [Full Text]; De Paulis, Ruggero [Abstract] [Full Text]; de Perrot, Marc [Full Text]; Deeb, Maher E. [Abstract] [Full Text]; Deloche, Alain [Abstract] [Full Text]; DeLong, Elizabeth R. [Abstract] [Full Text]; Demanet, Hélène [Abstract] [Full Text]; Deodhar, Anand P. [Abstract] [Full Text]; DeSimone, Joseph [Abstract] [Full Text]; Dessy, Hugues [Abstract] [Full Text]; Detter, Christian [Abstract] [Full Text]; Deuse, Tobias [Abstract] [Full Text]; Deuvaert, Frank E. [Abstract] [Full Text]; Devillé, Andrée [Abstract] [Full Text]; Dikmen, Erkan [Abstract] [Full Text]; Dizbay Sak, Serpil [Abstract] [Full Text]; Doukas, John [Abstract] [Full Text]; Drews, Thorsten [Abstract] [Full Text]; Dullum, Mercedes K.C. [Abstract] [Full Text]; Duranceau, Andre [Full Text]
E: Edmunds, L. Henry, Jr [Abstract] [Full Text]; Edwards, Fred H. [Abstract] [Full Text]; Ehlers, Raila [Abstract] [Full Text]; Eichstaedt, Harald C. [Abstract] [Full Text]; El-Banayosy, Aly [Abstract] [Full Text]; Eltzschig, Holger K. [Abstract] [Full Text]; Englberger, Lars [Abstract] [Full Text]; Escherich, Alison [Abstract] [Full Text]
F: Fabiani, Jean-Noel [Abstract] [Full Text]; Fabri, Brian M. [Abstract] [Full Text]; Fackeldey, Volker [Abstract] [Full Text]; Falk, Volkmar [Abstract] [Full Text]; Fasol, Roland [Abstract] [Full Text]; Febvre, Michel [Abstract] [Full Text]; Fenig, Eyal [Abstract] [Full Text]; Ferguson, T. Bruce [Abstract] [Full Text]; Fernando, Hiran C. [Abstract] [Full Text]; Ferraro, Pasquale [Full Text]; Fieguth, Hans Gerd [Abstract] [Full Text]; Fink, Gershon [Abstract] [Full Text]; Forlani, Stefano [Abstract] [Full Text]; Fraisse, Alain [Abstract] [Full Text]; Franke, Andreas [Abstract] [Full Text]; Franke, Axel [Abstract] [Full Text]; Fraser, Charles D., Jr [Abstract] [Full Text]; Fujii, Masahiro [Abstract] [Full Text]; Fukuda, Toyoki [Abstract] [Full Text]; Fullerton, David A. [Abstract] [Full Text]; Fung, Michael [Abstract] [Full Text]
G: Gal, Anthony A. [Abstract] [Full Text]; Galetta, Steven L. [Abstract] [Full Text]; Gebhard, Martha-Maria [Abstract] [Full Text]; Ghosh, Arup K. [Abstract] [Full Text]; Goldstein, Jacques P. [Abstract] [Full Text]; Gorman, Joseph H., III [Abstract] [Full Text]; Gorman, Robert C. [Abstract] [Full Text]; Gott, Vincent L. [Full Text]; Graham, Brian B. [Abstract] [Full Text]; Grayson, Antony D. [Abstract] [Full Text]; Green, G. Randall [Abstract] [Full Text]; Greene, Rodney [Abstract] [Full Text]; Grillo, Hermes C. [Abstract] [Full Text]; Grimm, Michael [Abstract] [Full Text]; Grinda, Jean-Michel [Abstract] [Full Text]; Gross, Wolfgang [Abstract] [Full Text]; Grover, Fred L. [Abstract] [Full Text]; Grunkemeier, Gary L. [Full Text]; Guy, T. Sloane [Abstract] [Full Text]
H: Habib, Gilbert [Abstract] [Full Text]; Handy, John R., Jr [Full Text]; Hanrath, Peter [Abstract] [Full Text]; Harada, Hideyuki [Full Text]; Harris, Patrick [Full Text]; Harrocks, Susan [Abstract] [Full Text]; Hasan, Ragheb [Abstract] [Full Text]; Hasegawa, Seiki [Abstract] [Full Text]; Haw, Marcus P. [Abstract] [Full Text]; Hayashi, Akihiro [Abstract] [Full Text]; Hayashida, Ryozo [Abstract] [Full Text]; Heller, Klaüs [Abstract] [Full Text]; Hernandez, Felix, Jr [Abstract] [Full Text]; Herzke, Corinna [Abstract] [Full Text]; Hetzer, Roland [Abstract] [Full Text]; Hetzer, Roland [Abstract] [Full Text]; Hetzer, Roland [Abstract] [Full Text]; Heurteaux, Catherine [Full Text]; Hill, Peter C. [Abstract] [Full Text]; Hirose, Hitoshi [Full Text]; Hogan, Michael S. [Abstract] [Full Text]; Horvath, Keith A. [Abstract] [Full Text]; Horváth, Örs Péter [Abstract] [Full Text]; Houser, Stuart L. [Abstract] [Full Text]; Hsu, Jeff [Abstract] [Full Text]; Hübler, Sabine [Abstract] [Full Text]
I: Ikramuddin, Sayeed [Abstract] [Full Text]; Imada, Tatsuya [Abstract] [Full Text]; Immer, Franz F. [Abstract] [Full Text]; Immer-Bansi, Alexsandra S. [Abstract] [Full Text]; Imura, Hajime [Abstract] [Full Text]; Isowa, Noritaka [Abstract] [Full Text]; Ito, Toshiro [Full Text]
J: Jablonski, Kathleen A. [Abstract] [Full Text]; Jackson, Benjamin M. [Abstract] [Full Text]; Jalali, Homayoun [Abstract] [Full Text]; Jaretzki, Alfred, III [Full Text]; Jin, Ruyun [Full Text]; Johnson, Mark J. [Abstract] [Full Text]; Johnston, Michael V. [Full Text]; Joshi, Raja [Abstract] [Full Text]; Jurmann, Michael J. [Abstract] [Full Text]
K: Kaiser, Larry R. [Abstract] [Full Text]; Kara, Murat [Abstract] [Full Text]; Kashima, Ichiro [Abstract] [Full Text]; Kasimir, Marie-Theres [Abstract] [Full Text]; Kaulbach, Hans G. [Abstract] [Full Text]; Kaulbach, Hans G. [Abstract] [Full Text]; Kavukçu, Sevket [Abstract] [Full Text]; Keenan, Daniel J.M. [Abstract] [Full Text]; Keshavjee, Shaf [Full Text]; Kiliç, Dalokay [Abstract] [Full Text]; Kilo, Juliane [Abstract] [Full Text]; Kitamura, Nobuo [Abstract] [Full Text]; Kitz, Richard [Abstract] [Full Text]; Kobayashi, Keita [Abstract] [Full Text]; Kobayashi, Takeshi [Full Text]; Komeda, Masashi [Abstract] [Full Text]; Körfer, Reiner [Abstract] [Full Text]; Köse, Serdal Kenan [Abstract] [Full Text]; Koster, Andreas [Abstract] [Full Text]; Krähenbühl, Eva S. [Abstract] [Full Text]; Kramer, Ludwig [Abstract] [Full Text]; Kramer, Mordechai R. [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Kucharczuk, John C. [Abstract] [Full Text]; Kuhlmann, Wolf Dieter [Abstract] [Full Text]; Kuppe, Hermann [Abstract] [Full Text]
L: Lahey, Stephen J. [Abstract] [Full Text]; Lambris, John D. [Full Text]; Lang-Lazdunski, Loïc [Full Text]; Lante, Wolfgang [Abstract] [Full Text]; Latremouille, Christian [Abstract] [Full Text]; Lazdunski, Michel [Full Text]; Le Pimpec-Barthes, Françoise [Abstract] [Full Text]; Leavitt, Bruce J. [Abstract] [Full Text]; Legman, Philippe [Abstract] [Full Text]; Leibold, T. Mark [Abstract] [Full Text]; Lim, Kelvin H.H. [Abstract] [Full Text]; Litwak, Robert S. [Full Text]; Liu, Jean Y. [Abstract] [Full Text]; Lorusso, Roberto [Abstract] [Full Text]; Lorusso, Roberto [Abstract] [Full Text]; Loulmet, Didier F. [Abstract] [Full Text]; Low, Donald E. [Abstract] [Full Text]; Lu, Chia-Yang J. [Abstract] [Full Text]; Lu, Meisheng [Abstract] [Full Text]; Luketich, James D. [Abstract] [Full Text]
M: Madl, Christian [Abstract] [Full Text]; Magdaleinat, Pierre [Abstract] [Full Text]; Mahdjoobian, Katja [Abstract] [Full Text]; Manning, Peter B. [Abstract] [Full Text]; Marban, Eduardo [Full Text]; Markewitz, Andreas [Abstract] [Full Text]; Marshall, M. Blair [Abstract] [Full Text]; Mathisen, Douglas J. [Abstract] [Full Text]; Matsuo, Toshihiro [Abstract] [Full Text]; Matsuo, Toshihiro [Abstract] [Full Text]; Mawatari, Tohru [Full Text]; McCabe, John C. [Abstract] [Full Text]; McClenathan, James E. [Full Text]; McGarvey, Michael L. [Abstract] [Full Text]; Meerkin, David [Abstract] [Full Text]; Menasché, Philippe [Full Text]; Messmer, Bruno J. [Abstract] [Full Text]; Mick, Rosemarie [Abstract] [Full Text]; Mihaljevic, Tomislav [Abstract] [Full Text]; Miller, Joseph I., Jr [Abstract] [Full Text]; Miller, Joseph I., Jr [Full Text]; Minami, Kazutomo [Abstract] [Full Text]; Mino, Mari [Abstract] [Full Text]; Mitsuoka, Masahiro [Abstract] [Full Text]; Miyagi, Yasuo [Abstract] [Full Text]; Miyazaki, Takako [Abstract] [Full Text]; Moainie, Sina L. [Abstract] [Full Text]; Modi, Paul [Abstract] [Full Text]; Molnar, Thomas F. [Abstract] [Full Text]; Moon, Marc R. [Abstract] [Full Text]; Morikawa, Yukihiko [Abstract] [Full Text]; Morimoto, Kojiro [Abstract] [Full Text]; Moritz, Anton [Abstract] [Full Text]; Mory, Martin [Abstract] [Full Text]; Mühler, Eberhard G. [Abstract] [Full Text]; Mumtaz, Muhammed [Abstract] [Full Text]; Musci, Michele [Abstract] [Full Text]
N: Nardi, Paolo [Abstract] [Full Text]; Nili, Moshe [Abstract] [Full Text]; Nishimura, Kazunobu [Abstract] [Full Text]; Noiseux, Nicolas [Full Text]; Nonaka, Kazuki [Abstract] [Full Text]
O: O’Brien, Mark F. [Abstract] [Full Text]; O’Connor, Gerald T. [Abstract] [Full Text]; Oda, Makoto [Abstract] [Full Text]; Oda, Takeshi [Abstract] [Full Text]; Ogasawara, Hidetugu [Abstract] [Full Text]; Ohnaka, Motoaki [Abstract] [Full Text]; Ohri, Sunil K. [Abstract] [Full Text]; Ohta, Yasuhiko [Abstract] [Full Text]; Ohtsuka, Shoji [Abstract] [Full Text]; Orhan, Diclehan [Abstract] [Full Text]
P: Paiement, Patrice [Abstract] [Full Text]; Parry, Andrew J. [Abstract] [Full Text]; Passage, Jurgen [Abstract] [Full Text]; Patel, Aashish R. [Abstract] [Full Text]; Patel, Nilesh U. [Abstract] [Full Text]; Patel, Nirav C. [Abstract] [Full Text]; Pawade, Ashwinikumar [Abstract] [Full Text]; Payne, Nicola [Full Text]; Pearl, Jeffrey M. [Abstract] [Full Text]; Peck, Eric A. [Full Text]; Pellegrino, Antonio [Abstract] [Full Text]; Pellerin, Michel [Abstract] [Full Text]; Penta de Peppo, Alfonso [Abstract] [Full Text]; Pepper, John [Full Text]; Peterson, Eric D. [Abstract] [Full Text]; Petro, Kathleen R. [Abstract] [Full Text]; Pettersson, Gosta [Abstract] [Full Text]; Pfister, Albert J. [Abstract] [Full Text]; Piéchaud, Jean-François [Abstract] [Full Text]; Pierce, Glenn F. [Abstract] [Full Text]; Plappert, Theodore [Abstract] [Full Text]; Potapov, Evgenij V. [Abstract] [Full Text]; Prosch, Joachim [Abstract] [Full Text]; Pullan, D. Mark [Abstract] [Full Text]
R: Rakowsky, Erica [Abstract] [Full Text]; Redmond, J. Mark [Full Text]; Reeves, Barnaby C. [Abstract] [Full Text]; Regnard, Jean-François [Abstract] [Full Text]; Reichart, Bruno [Abstract] [Full Text]; Reichenspurner, Hermann [Abstract] [Full Text]; Reul, George J. [Abstract] [Full Text]; Riess, Hanno [Abstract] [Full Text]; Riquet, Marc [Abstract] [Full Text]; Ross, Cathy S. [Abstract] [Full Text]; Roth, Thierry [Abstract] [Full Text]
S: Sabate, Carlos J. [Abstract] [Full Text]; Sahu, Arvind [Full Text]; Saji, Yoshiaki [Abstract] [Full Text]; Sakaguchi, Genichi [Abstract] [Full Text]; Sandbank, Judith [Abstract] [Full Text]; Sato, Masaaki [Abstract] [Full Text]; Scafuri, Antonio [Abstract] [Full Text]; Schaefer, Michael [Abstract] [Full Text]; Schauer, Philip R. [Abstract] [Full Text]; Schreuder, Jan J. [Abstract] [Full Text]; Schreuder, Jan J. [Abstract] [Full Text]; Schussler, Olivier [Abstract] [Full Text]; Seipelt, Ralf G. [Abstract] [Full Text]; Sezai, Akira [Abstract] [Full Text]; Shahian, David M. [Abstract] [Full Text]; Shake, Jay G. [Full Text]; Sheppard, Stuart V. [Abstract] [Full Text]; Shernan, Stanton K. [Abstract] [Full Text]; Shimizu, Shuji [Full Text]; Shinkawa, Takeshi [Abstract] [Full Text]; Shirouzu, Kazuo [Abstract] [Full Text]; Shrager, Joseph B. [Abstract] [Full Text]; Shroyer, A. Laurie [Abstract] [Full Text]; Shuntoh, Keisuke [Abstract] [Full Text]; Sievers, Hans-Hinrich [Abstract] [Full Text]; Simchuk, Eric J. [Abstract] [Full Text]; Siniawski, Hendrik [Abstract] [Full Text]; Smith, Brian [Abstract] [Full Text]; Sodian, Ralf [Abstract] [Full Text]; Sodian, Ralf [Abstract] [Full Text]; Song, Howard K. [Abstract] [Full Text]; Srock, Stefanie [Abstract] [Full Text]; St. John-Sutton, Martin G. [Abstract] [Full Text]; Stamou, Sotiris C. [Abstract] [Full Text]; Stauder, Michael J. [Abstract] [Full Text]; Stecker, Mark M. [Abstract] [Full Text]; Stiles, Geoffrey M. [Full Text]; Subramanian, Valavanur A. [Abstract] [Full Text]; Suleiman, M-Saadeh [Abstract] [Full Text]; Sulkes, Aaron [Abstract] [Full Text]; Sundt, Thoralf M., III [Abstract] [Full Text]; Suzuki, Takaaki [Abstract] [Full Text]
T: Tadamura, Eiji [Abstract] [Full Text]; Takahashi, Akihito [Full Text]; Takahashi, Akiyuki [Abstract] [Full Text]; Takamori, Shinzo [Abstract] [Full Text]; Tam, Robert K.W. [Abstract] [Full Text]; Tambara, Keiichi [Abstract] [Full Text]; Tanaka, Masao [Full Text]; Tanaka, Yoshihisa [Abstract] [Full Text]; Tang, Augustine T.M. [Abstract] [Full Text]; Tang, Augustine T.M. [Abstract] [Full Text]; Thode, Christian [Abstract] [Full Text]; Thomas, James D. [Abstract] [Full Text]; Torrillo, Lisa D. [Abstract] [Full Text]; Tracy, Thomas F., Jr [Full Text]; Troncoso, Juan C. [Full Text]; Tsunezuka, Yoshio [Abstract] [Full Text]
U: Uchiyama, Akihiko [Full Text]; Ueno, Masahiro [Abstract] [Full Text]; Ündar, Akif [Abstract] [Full Text]; Uretzky, Gideon [Abstract] [Full Text]
V: van der Veen, Frederik H. [Abstract] [Full Text]; van der Veen, Frederik H. [Abstract] [Full Text]; Vaughn, William K. [Abstract] [Full Text]; Vazquez-Jimenez, Jaime F. [Abstract] [Full Text]; Venugopal, Panangipalli [Abstract] [Full Text]; Viart, Pierre [Abstract] [Full Text]; Vlassak, Irmien [Abstract] [Full Text]; von Bernuth, Goetz [Abstract] [Full Text]
W: Wada, Hiromi [Abstract] [Full Text]; Wain, John C. [Abstract] [Full Text]; Watanabe, Go [Abstract] [Full Text]; Wauthy, Pierre [Abstract] [Full Text]; Weeden, David F. [Abstract] [Full Text]; Weintraub, Ronald M. [Abstract] [Full Text]; Weiss, Stuart J. [Abstract] [Full Text]; Weng, Yu-Guo [Abstract] [Full Text]; Weng, Yuguo [Abstract] [Full Text]; Wieselthaler, Georg M. [Abstract] [Full Text]; Wolner, Ernst [Abstract] [Full Text]; Wright, Cameron D. [Abstract] [Full Text]
Y: Yamagishi, Masaaki [Abstract] [Full Text]; Yamauchi, Shigeo [Abstract] [Full Text]; Yankah, Charles [Abstract] [Full Text]; Yim, Anthony P.C. [Abstract] [Full Text]; Yoshida, Shogo [Abstract] [Full Text]
Z: Zegdi, Rachid [Abstract] [Full Text]; Zimpfer, Daniel [Abstract] [Full Text]; Zurbrügg, Heinz R. [Abstract] [Full Text]