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Index by Author: Volume 72, Issue 5 (November 2001) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abdel-Rahman, Ulf [Abstract] [Full Text]; Abdelnoor, Michel [Abstract] [Full Text]; Abe, Tomio [Abstract] [Full Text]; Adatia, Ian [Abstract] [Full Text]; Al Refai, Majed [Abstract] [Full Text]; Al-Abdullatief, Mohammad [Abstract] [Full Text]; Alexi-Meskishvili, Vladimir V. [Abstract] [Full Text]; Alexiou, Christos [Abstract] [Full Text]; Algar, Francisco Javier [Abstract] [Full Text]; Alifano, Marco [Abstract] [Full Text]; Alvarez, Antonio [Abstract] [Full Text]; Amahzoune, Brahim [Abstract] [Full Text]; Ando, Motomi [Abstract] [Full Text]; Aomi, Shigeyuki [Abstract] [Full Text]; Aranda, Jose Luis [Abstract] [Full Text]; Augé, Annie [Abstract] [Full Text]; Avidan, Michael S. [Abstract] [Full Text]; Azakie, Anthony [Abstract] [Full Text]; Azimzadeh, Agnes M. [Abstract] [Full Text]
B: Baamonde, Carlos [Abstract] [Full Text]; Baeza, Ricardo [Abstract] [Full Text]; Baliga, Ragavendra [Full Text]; Baribeau, Yvon R. [Abstract] [Full Text]; Bartoli, Jean-Michel [Abstract] [Full Text]; Baudot, Jérôme [Abstract] [Full Text]; Bellomo, Rinaldo [Abstract] [Full Text]; Bergs, Peter [Abstract] [Full Text]; Berreklouw, Eric [Abstract] [Full Text]; Bertel, Osmund [Abstract] [Full Text]; Birkmeyer, Nancy J.O. [Full Text]; Black, Michael D. [Full Text]; Boening, Andreas [Full Text]; Bonvicini, Marco [Abstract] [Full Text]; Borja, Marvin J. [Abstract] [Full Text]; Borri, Alessandro [Abstract] [Full Text]; Braile, Domingo M. [Full Text]; Brener, Bruce [Abstract] [Full Text]; Brinkman, William T. [Abstract] [Full Text]; Brown, John W. [Abstract] [Full Text]; Brunelli, Alessandro [Abstract] [Full Text]; Brunner-La Rocca, Hans Peter [Abstract] [Full Text]; Burns, Andrew C. [Abstract] [Full Text]; Butchart, Eric G. [Full Text]; Buxton, Brian [Full Text]; Buxton, Brian F. [Abstract] [Full Text]
C: Caianiello, Giuseppe [Full Text]; Calabrò, Raffaele [Full Text]; Calaritis, Christos [Abstract] [Full Text]; Candinas, Reto [Abstract] [Full Text]; Cao-Danh, Hung [Abstract] [Full Text]; Cassina, Paulo [Abstract] [Full Text]; Champsaur, Gerard [Abstract] [Full Text]; Charlesworth, David C. [Abstract] [Full Text]; Charlesworth, Phillip [Abstract] [Full Text]; Chastre, Jean [Abstract] [Full Text]; Chedrawy, Edgar [Abstract] [Full Text]; Choo, Suk Jung [Abstract] [Full Text]; Clarke, Peter [Abstract] [Full Text]; Clements, Stephen D. [Abstract] [Full Text]; Clough, Robert A. [Abstract] [Full Text]; Cohn, William E. [Abstract] [Full Text]; Cohnert, Tina U. [Full Text]; Coles, James A., Jr [Abstract] [Full Text]; Coles, John G. [Abstract] [Full Text]; Coloni, Giorgio Furio [Abstract] [Full Text]; Colvin, Stephen B. [Full Text]; Combes, Alain [Abstract] [Full Text]; Conte, John V. [Abstract] [Full Text]; Corkeron, Michael A. [Abstract] [Full Text]; Crawford, Fred A., Jr [Abstract] [Full Text]; Cremer, Jochen T. [Full Text]; Cybulsky, Irene J. [Abstract] [Full Text]
D: Dacey, Lawrence J. [Full Text]; De Giacomo, Tiziano [Abstract] [Full Text]; Deaton, David W. [Abstract] [Full Text]; Deck, Carlos [Abstract] [Full Text]; Decoene, Christophe [Abstract] [Full Text]; del Nido, Pedro J. [Abstract] [Full Text]; Dennis, Richard C. [Abstract] [Full Text]; Despotis, George J. [Abstract] [Full Text]; Despotis, George J. [Full Text]; Dieterich, Hans-Jürgen [Full Text]; Dihmis, Wald C. [Full Text]; Donatelli, Francesco [Abstract] [Full Text]; Donti, Andrea [Abstract] [Full Text]; Dunn, Geoffrey L. [Abstract] [Full Text]; Duru, Firat [Abstract] [Full Text]; Dusmet, Michael [Abstract] [Full Text]; Dutly, André [Abstract] [Full Text]
E: East, Christopher [Abstract] [Full Text]; Eckel, Lothar [Abstract] [Full Text]; Eijkemans, Marinus J.C. [Full Text]; Ellison, Norig [Abstract] [Full Text]; Ellison, Norig [Full Text]; Emani, Sitaram M. [Abstract] [Full Text]; Endara, Santiago A. [Abstract] [Full Text]; Endo, Masahiro [Abstract] [Full Text]; Engelman, Richard M. [Abstract] [Full Text]; Entrup, Michael H. [Abstract] [Full Text]; Ergin, M. Arisan [Abstract] [Full Text]
F: Fabre, Olivier H. [Abstract] [Full Text]; Feindel, Christopher [Full Text]; Fianchini, Aroldo [Abstract] [Full Text]; Flack, Joseph E., III [Abstract] [Full Text]; Flowerdew, Alistair D.S. [Abstract] [Full Text]; Formigari, Roberto [Abstract] [Full Text]; Francioni, Federico [Abstract] [Full Text]; Franke, Ulrich [Full Text]; Franklin, Rodney C.G. [Abstract] [Full Text]; Freedom, Robert M. [Full Text]; Freeman, William K. [Abstract] [Full Text]; Friehs, Ingeborg [Abstract] [Full Text]; Fuentes, Pierre [Abstract] [Full Text]; Fujimoto, Toshio [Abstract] [Full Text]; Fundarò, Pino [Abstract] [Full Text]
G: Galla, Jan D. [Full Text]; Gallagher, William J. [Abstract] [Full Text]; Galloway, Aubrey C. [Full Text]; Gandhi, Sanjiv K. [Abstract] [Full Text]; Garbe, Louise [Abstract] [Full Text]; Gargiulo, Gaetano [Abstract] [Full Text]; Geha, Alexander S. [Abstract] [Full Text]; Gerber, Andreas [Abstract] [Full Text]; Gibert, Claude [Abstract] [Full Text]; Gillinov, A. Marc [Full Text]; Giudicelli, Roger [Abstract] [Full Text]; Glower, Donald D. [Abstract] [Full Text]; Goh, Peter [Full Text]; Goldstein, Daniel J. [Abstract] [Full Text]; Gould, Jon C. [Abstract] [Full Text]; Grauhan, Onnen [Abstract] [Full Text]; Griepp, Randall B. [Abstract] [Full Text]; Griepp, Randall B. [Abstract] [Full Text]; Grossi, Adalberto [Abstract] [Full Text]; Grossi, Eugene A. [Full Text]; Grubitzsch, Herko [Abstract] [Full Text]; Guarda, Eduardo [Abstract] [Full Text]; Gutierrez, Fernando R. [Full Text]
H: Hachiro, Yoshikazu [Abstract] [Full Text]; Hagl, Christian [Abstract] [Full Text]; Hamilton, J.R. Leslie [Full Text]; Hampf, Heather M. [Abstract] [Full Text]; Harley, Alexander [Abstract] [Full Text]; Hasan, Asif [Full Text]; Hashizume, Kenichi [Abstract] [Full Text]; Haskard, Dorian O. [Abstract] [Full Text]; Hassan, Imran [Abstract] [Full Text]; Haw, Marcus P. [Abstract] [Full Text]; Hayat, Javed [Full Text]; Hayhoe, Matthew [Abstract] [Full Text]; Hayward, Stephen J. [Abstract] [Full Text]; Hechtman, Herbert B. [Abstract] [Full Text]; Hernandez, Felix [Abstract] [Full Text]; Hertz, Steven [Abstract] [Full Text]; Hetzer, Roland [Abstract] [Full Text]; Hillejan, Ludger [Abstract] [Full Text]; Hofmann, Michael [Abstract] [Full Text]; Hofstetter, Roland [Abstract] [Full Text]; Hogue, Charles W., Jr [Abstract] [Full Text]; Hollaus, Peter H. [Full Text]; Hosking, Shorland W. [Abstract] [Full Text]; Hsieh, Ming-Ju [Abstract] [Full Text]; Hussain, Ali [Abstract] [Full Text]
I: Iaizzo, Paul A. [Abstract] [Full Text]; Iino, Yoshimi [Abstract] [Full Text]; Inci, Ilhan [Abstract] [Full Text]; Ingu, Akira [Abstract] [Full Text]; Insolia, Stephanie [Abstract] [Full Text]; Irarrazaval, Manuel J. [Abstract] [Full Text]; Ishikawa, Takumi [Abstract] [Full Text]; Isobe, Fumitaka [Abstract] [Full Text]
J: Jahangiri, Marjan [Abstract] [Full Text]; Jamal, Al-Maleek [Abstract] [Full Text]; Jegger, David [Abstract] [Full Text]; Jegou, Bruno [Abstract] [Full Text]; Jhaveri, Rajiv M. [Abstract] [Full Text]
K: Kaddoura, Imad L. [Abstract] [Full Text]; Kang, Dong [Abstract] [Full Text]; Kang, Duk Hyun [Abstract] [Full Text]; Kao, Ming-Chien [Full Text]; Karanam, Ravindra [Abstract] [Full Text]; Karl, Tom R. [Full Text]; Karmy-Jones, Riyad [Full Text]; Kas, József [Abstract] [Full Text]; Kato, Yasuyuki [Abstract] [Full Text]; Kaushik, Shantesh [Abstract] [Full Text]; Kawada, Shiaki [Abstract] [Full Text]; Kawahira, Youichi [Abstract] [Full Text]; Kelishadi, Sean [Abstract] [Full Text]; Keogh, Brian [Abstract] [Full Text]; Kestenholz, Peter [Abstract] [Full Text]; Khaladj, Nawid [Abstract] [Full Text]; Khuri, Shukri F. [Abstract] [Full Text]; Kim, Ki-Bong [Full Text]; Kim, Kun Il [Abstract] [Full Text]; Kinugasa, Seiji [Abstract] [Full Text]; Kiowski, Wolfgang [Abstract] [Full Text]; Kiss, Dorottya [Abstract] [Full Text]; Kitamura, Soichiro [Abstract] [Full Text]; Klemperer, John D. [Abstract] [Full Text]; Klesius, Armin [Abstract] [Full Text]; Klotz, Stefan [Abstract] [Full Text]; Koch, Walter J. [Abstract] [Full Text]; Konstantinov, Igor E. [Abstract] [Full Text]; Korkola, Stephen J. [Abstract] [Full Text]; Korom, Stephan [Abstract] [Full Text]; Koster, Jurgen M. [Abstract] [Full Text]; Koyanagi, Hitoshi [Abstract] [Full Text]; Koyanagi, Tetsuya [Abstract] [Full Text]; Kulshrestha, Pankaj [Abstract] [Full Text]; Kumano, Hiroshi [Abstract] [Full Text]; Kuppe, Hermann [Abstract] [Full Text]
L: Laliberté, Eric [Abstract] [Full Text]; Laliberte, Eric [Abstract] [Full Text]; Landis, R. Clive [Abstract] [Full Text]; Landry, Michel [Abstract] [Full Text]; Langley, Stephen M. [Abstract] [Full Text]; LaPietra, Angelo [Full Text]; Lavoie, Josee [Abstract] [Full Text]; Lavoie, Josée [Abstract] [Full Text]; Lazar, Harold L. [Abstract] [Full Text]; Leach, William R. [Abstract] [Full Text]; LeCompte, Yves [Full Text]; Lee, Jae Won [Abstract] [Full Text]; Lee, Sang Kwon [Abstract] [Full Text]; Levy, Jerrold H. [Abstract] [Full Text]; Lima, Ricardo [Full Text]; Lin, Pyng-Jing [Abstract] [Full Text]; Lincoln, Christopher [Abstract] [Full Text]; Liu, Hui-Ping [Abstract] [Full Text]; Liu, Yun-Hen [Abstract] [Full Text]; Livesey, Steven A. [Abstract] [Full Text]; López–Pujol, Francisco Javier [Abstract] [Full Text]; Lucchese, Fernando A. [Full Text]; Lundblad, Runar [Abstract] [Full Text]; Luo, Chwan-Yau [Abstract] [Full Text]
M: Major, László [Abstract] [Full Text]; Malthaner, Richard A. [Abstract] [Full Text]; Mansour, Kamal A. [Abstract] [Full Text]; Marchant, Eugenio [Abstract] [Full Text]; Mason, Karen [Full Text]; Massad, Malek G. [Abstract] [Full Text]; Matayoshi, Toru [Abstract] [Full Text]; Matheis, Georg [Abstract] [Full Text]; McCarthy, Patrick M. [Full Text]; McGowan, Francis X., Jr [Abstract] [Full Text]; McGrath, Michael [Abstract] [Full Text]; Meharwal, Zile Singh [Abstract] [Full Text]; Meissner, Mark [Full Text]; Merklinger, Sandra L. [Abstract] [Full Text]; Mitsumaru, Atsuhiro [Abstract] [Full Text]; Mokhtari, Mourad [Abstract] [Full Text]; Molina-Navarro, Carlos [Abstract] [Full Text]; Moneta, Andrea [Abstract] [Full Text]; Monro, James L. [Abstract] [Full Text]; Monteverde, Marco [Abstract] [Full Text]; Moon, Marc R. [Abstract] [Full Text]; Moran, Sergio V. [Abstract] [Full Text]; Moretti, Marco [Abstract] [Full Text]; Morikawa, Masayuki [Abstract] [Full Text]; Moritz, Anton [Abstract] [Full Text]; Morton, Jeremy R. [Abstract] [Full Text]; Mouroux, Jérôme [Abstract] [Full Text]; Mroueh, Salman M. [Abstract] [Full Text]; Mueller, Xavier M. [Abstract] [Full Text]; Müller, Peter [Abstract] [Full Text]; Mulligan, Michael S. [Full Text]; Murkin, John M. [Abstract] [Full Text]; Murray, Gordon F. [Full Text]; Mutazz Diqer, Al [Abstract] [Full Text]; Myers, John L. [Abstract] [Full Text]
N: Nadolny, Edward M. [Abstract] [Full Text]; Nagamachi, Keima [Abstract] [Full Text]; Nakajima, Hiroyuki [Abstract] [Full Text]; Nandor, Sarah [Abstract] [Full Text]; Narula, Jagat [Full Text]; Nasser, Ali A. [Abstract] [Full Text]; Neal, Angus J. [Abstract] [Full Text]; Newman, Mark F. [Abstract] [Full Text]; Nimeh, Toni [Abstract] [Full Text]; Ninet, Jean [Abstract] [Full Text]; Nishida, Hiroshi [Abstract] [Full Text]; Nitta, Takashi [Full Text]
O: O’Connor, Gerald T. [Abstract] [Full Text]; O’Kane, Hugh O. [Abstract] [Full Text]; Obeid, Mounir Y. [Abstract] [Full Text]; Oeltgen, Peter R. [Abstract] [Full Text]; Ofoe, Victor D. [Abstract] [Full Text]; Oka, Shigeteru [Abstract] [Full Text]; Oka, Shigeteru [Abstract] [Full Text]; Okada, Yuji [Abstract] [Full Text]; Okita, Yutaka [Abstract] [Full Text]; Olmstead, Elaine M. [Abstract] [Full Text]; Onuzo, Obed [Abstract] [Full Text]; Ootaki, Yoshio [Abstract] [Full Text]; Ootaki, Yoshio [Abstract] [Full Text]; Orens, Jonathan B. [Abstract] [Full Text]; Oriol, Rafael [Abstract] [Full Text]; Oshima, Yoshihiro [Abstract] [Full Text]; Oshima, Yoshihiro [Abstract] [Full Text]; Osula, Serge [Abstract] [Full Text]; Ott, Michael C. [Abstract] [Full Text]
P: Pacileo, Giuseppe [Full Text]; Panos, Aristotelis [Abstract] [Full Text]; Paolillo, Joseph [Abstract] [Full Text]; Pasic, Miralem [Abstract] [Full Text]; Pate, James W. [Full Text]; Patel, Chandrahas B. [Abstract] [Full Text]; Pfeiffer, Steffen [Abstract] [Full Text]; Philip, Anie [Abstract] [Full Text]; Phillips-Bute, Barbara [Abstract] [Full Text]; Picchio, Fernando M. [Abstract] [Full Text]; Pierson, Richard N., III [Abstract] [Full Text]; Pigula, Frank A. [Abstract] [Full Text]; Pisacane, Carlo [Full Text]; Pivacek, Linda E. [Abstract] [Full Text]; Pocar, Marco [Abstract] [Full Text]; Prat, Alain [Abstract] [Full Text]; Pratap, Usha [Abstract] [Full Text]; Prendergast, Thomas [Abstract] [Full Text]; Puga, Francisco J. [Abstract] [Full Text]; Pugliese, Francesco [Abstract] [Full Text]
R: Rademakers, Phillip P.C. [Abstract] [Full Text]; Raffoul, Wassim [Abstract] [Full Text]; Ragno, Gina [Abstract] [Full Text]; Raman, Jai S. [Abstract] [Full Text]; Rao, Vivek [Full Text]; Rashid, Abbas [Abstract] [Full Text]; Rayner, Alan [Abstract] [Full Text]; Rebovich, Beverly [Abstract] [Full Text]; Reddy, Prabashni [Full Text]; Redecker, Hermann [Abstract] [Full Text]; Reich, David L. [Abstract] [Full Text]; Reid, Robert [Abstract] [Full Text]; Rendina, Erino A. [Abstract] [Full Text]; Reves, Joseph G. [Abstract] [Full Text]; Reyes, Teodoro U. [Abstract] [Full Text]; Reynaud-Gaubert, Martine [Abstract] [Full Text]; Ris, Hans-Beat [Abstract] [Full Text]; Risnes, Ivar [Abstract] [Full Text]; Robin, Jacques [Abstract] [Full Text]; Robinson, Barbara L.A.C. [Abstract] [Full Text]; Rose, Colin P. [Abstract] [Full Text]; Rötker, Jürgen [Abstract] [Full Text]; Rousou, John A. [Abstract] [Full Text]; Ruchat, Patrick [Abstract] [Full Text]; Russo, Maria Giovanna [Full Text]; Ruzmetov, Mark [Abstract] [Full Text]
S: Sade, Robert M. [Full Text]; Saez de Ibarra, Jose I. [Abstract] [Full Text]; Salati, Michele [Abstract] [Full Text]; Salerno, Tomas A. [Full Text]; Salvatierra, Angel [Abstract] [Full Text]; Santoro, Giuseppe [Full Text]; Sasaki, Yasuyuki [Abstract] [Full Text]; Saunders, Craig R. [Abstract] [Full Text]; Savoye, Christine [Abstract] [Full Text]; Scharf, Christoph [Abstract] [Full Text]; Scheld, Hans H. [Abstract] [Full Text]; Schmid, Christof [Abstract] [Full Text]; Schmidt, Christoph [Abstract] [Full Text]; Schneiter, Didier [Abstract] [Full Text]; Schurr, Michael A. [Abstract] [Full Text]; Seitz, Uwe [Abstract] [Full Text]; Shah, Ashish S. [Abstract] [Full Text]; Shanewise, Jack S. [Abstract] [Full Text]; Shapira, Oz M. [Full Text]; Shin, Hankei [Abstract] [Full Text]; Shukla, Vinayak [Full Text]; Shum-Tim, Dominique [Abstract] [Full Text]; Shum-Tim, Dominique [Abstract] [Full Text]; Sidhu, Pushpinder [Abstract] [Full Text]; Siewers, Ralph D. [Abstract] [Full Text]; Sigg, Daniel C. [Abstract] [Full Text]; Simon, Veronika [Abstract] [Full Text]; Slavik, Zdenek [Abstract] [Full Text]; Smallhorn, Jeffrey F. [Full Text]; Smith, Peter K. [Abstract] [Full Text]; Snow, Norman J. [Abstract] [Full Text]; Song, Hyun [Abstract] [Full Text]; Song, Jae Kwan [Abstract] [Full Text]; Song, Jessica [Full Text]; Song, Jong Min [Abstract] [Full Text]; Song, Meong Gun [Abstract] [Full Text]; Spielvogel, David [Abstract] [Full Text]; Spiess, Bruce D. [Abstract] [Full Text]; Stafford-Smith, Mark [Abstract] [Full Text]; Stamatis, Georgios [Abstract] [Full Text]; Stamm, Christof [Abstract] [Full Text]; Steyerberg, Ewout W. [Full Text]; Stroud, Martha R. [Abstract] [Full Text]; Sundt, Thoralf M., III [Full Text]; Sundt, Thoralf M., III [Abstract] [Full Text]; Svane, Sivert [Abstract] [Full Text]; Svastics, Egon [Abstract] [Full Text]; Svennevig, Jan L. [Abstract] [Full Text]; Svensson, Lars G. [Abstract] [Full Text]; Swaminathan, Madhav [Abstract] [Full Text]; Szobor, Albert [Abstract] [Full Text]
T: Takagi, Nobuyuki [Abstract] [Full Text]; Takkenberg, Johanna J.M. [Full Text]; Tatton, Nadine A. [Abstract] [Full Text]; Taylor, Kenneth M. [Abstract] [Full Text]; Tchervenkov, Christo I. [Abstract] [Full Text]; Tchervenkov, Christo I. [Abstract] [Full Text]; Tevaearai, Hendrik T. [Abstract] [Full Text]; Thomas, Pascal [Abstract] [Full Text]; Tolley, Elizabeth A. [Full Text]; Tore Baksaas, Svein [Abstract] [Full Text]; Trehan, Naresh [Abstract] [Full Text]; Triggiani, Michele [Abstract] [Full Text]; Trouillet, Jean-Louis [Abstract] [Full Text]; Tryzelaar, Joan F. [Abstract] [Full Text]; Tsamitros, Mary [Abstract] [Full Text]; Tsukui, Hiroyuki [Abstract] [Full Text]; Turina, Marko I. [Abstract] [Full Text]; Turrentine, Mark W. [Abstract] [Full Text]
U: Uemura, Hideki [Abstract] [Full Text]; Uysal, Suzan [Abstract] [Full Text]
V: Valeri, C. Robert [Abstract] [Full Text]; Van Arsdell, Glen S. [Abstract] [Full Text]; van der Wielen, Brigitte J.W. [Abstract] [Full Text]; van Leur, Linda [Abstract] [Full Text]; Venissac, Nicolas [Abstract] [Full Text]; Venuta, Federico [Abstract] [Full Text]; Vestring, Thomas [Abstract] [Full Text]; Vijay, Palaniswamy [Abstract] [Full Text]; Villa, Emmanuel [Abstract] [Full Text]; Vincentelli, Andre [Abstract] [Full Text]; von Segesser, Ludwig K. [Abstract] [Full Text]
W: Wahlers, Thorsten [Full Text]; Wait, Richard B. [Abstract] [Full Text]; Wan, Song [Full Text]; Warkentin, Theodore E. [Abstract] [Full Text]; Weber, Fred [Abstract] [Full Text]; Weder, Walter [Abstract] [Full Text]; Weisz, Donald J. [Abstract] [Full Text]; Westbrook, Benjamin M. [Abstract] [Full Text]; Westers, Paul [Abstract] [Full Text]; White, C. Michael [Full Text]; White, David C. [Abstract] [Full Text]; Williams, William G. [Abstract] [Full Text]; Wimmer-Greinecker, Gerhard [Abstract] [Full Text]; Wolf, Philippe [Abstract] [Full Text]; Wollert, Hans-Georg [Abstract] [Full Text]; Wong, Carl [Full Text]; Wu, Yi-Cheng [Abstract] [Full Text]
Y: Yagihara, Toshikatsu [Abstract] [Full Text]; Yamada, Naoaki [Abstract] [Full Text]; Yamaguchi, Masahiro [Abstract] [Full Text]; Yamaguchi, Masahiro [Abstract] [Full Text]; Yang, Steven C. [Abstract] [Full Text]; Yoshikawa, Yoshiro [Abstract] [Full Text]; Yoshimura, Naoki [Abstract] [Full Text]; Yoshimura, Naoki [Abstract] [Full Text]; Youssuf, Arshad M. [Abstract] [Full Text]; Yozu, Ryohei [Abstract] [Full Text]
Z: Zalaquett, Ricardo [Abstract] [Full Text]; Zehr, Kenton J. [Abstract] [Full Text]; Zhang, Ning [Abstract] [Full Text]; Zorn, George L., III [Abstract] [Full Text]