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Index by Author: Volume 71, Issue 4 (April 2001) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abcarian, Herand [Abstract] [Full Text]; Acker, Michael A. [Full Text]; Adachi, Hideo [Abstract] [Full Text]; Adams, David H. [Abstract] [Full Text]; Akhter, Shahab A. [Abstract] [Full Text]; Akimoto, Hiroji [Abstract] [Full Text]; Akinci, Esat [Abstract] [Full Text]; Alifano, Marco [Abstract] [Full Text]; Almodovar, Melvin [Abstract] [Full Text]; Altmann, Karen [Abstract] [Full Text]; Anees, Raza [Abstract] [Full Text]; Angelini, Gianni D. [Abstract] [Full Text]; Askin, Frederic B. [Abstract] [Full Text]
B: Bacha, Emile A. [Abstract] [Full Text]; Baehrel, Bernard [Abstract] [Full Text]; Barner, Hendrick B. [Full Text]; Barner, Hendrick B. [Abstract] [Full Text]; Baskett, Roger J.F. [Full Text]; Basri Erdogan, Hasan [Abstract] [Full Text]; Benbrahem, Cedrik [Abstract] [Full Text]; Benedetti, Enrico [Abstract] [Full Text]; Bennett, W. Frederick [Abstract] [Full Text]; Bennink, Ger B.W.E. [Abstract] [Full Text]; Bentley, Michael J. [Abstract] [Full Text]; Bergsland, Jacob [Full Text]; Bessho, Ryuzo [Abstract] [Full Text]; Bittner, Hartmuth B. [Abstract] [Full Text]; Blanco, Sandra [Full Text]; Blewett, Christopher J. [Abstract] [Full Text]; Blom, Nico A. [Abstract] [Full Text]; Bodnar, Endre [Full Text]; Bolling, Steven F. [Full Text]; Bots, Michiel L. [Abstract] [Full Text]; Bozbuga, Nilgün [Abstract] [Full Text]; Brenot, Roger [Abstract] [Full Text]; Buratta, Maria Michela [Full Text]; Burke, Redmond P. [Abstract] [Full Text]; Butchart, Eric G. [Full Text]; Buxton, Brian F. [Abstract] [Full Text]
C: Calafiore, Antonio M. [Abstract] [Full Text]; Calderon, Moisés C. [Abstract] [Full Text]; Cale, Alexander R.J. [Abstract] [Full Text]; Caliandro, Raffaele [Abstract] [Full Text]; Caputo, Massimo [Abstract] [Full Text]; Carpentier, Alain F. [Abstract] [Full Text]; Casselman, Filip P. [Abstract] [Full Text]; Casula, Roberto P. [Abstract] [Full Text]; Catarino, Pedro A. [Abstract] [Full Text]; Chachlani, Naresh [Abstract] [Full Text]; Chachques, Juan Carlos [Abstract] [Full Text]; Chamberlain, Martin H. [Abstract] [Full Text]; Chandra, Amit [Full Text]; Chen, Edward P. [Abstract] [Full Text]; Chen, Raymond H. [Abstract] [Full Text]; Chen, Qiang [Abstract] [Full Text]; Cheng, Tsung O. [Abstract] [Full Text]; Cheng, Tsung O. [Full Text]; Cherian, Kotturathu Mammen [Abstract] [Full Text]; Chiariello, Luigi [Abstract] [Full Text]; Chiariello, Luigi [Full Text]; Christenson, Jan T. [Full Text]; Ciulli, Franco [Abstract] [Full Text]; Colagrande, Luisa [Full Text]; Conklin, Lori D. [Abstract] [Full Text]; Conroy, Brendan P. [Abstract] [Full Text]; Copeland, Jack G. [Abstract] [Full Text]; Coselli, Joseph S. [Abstract] [Full Text]; Cramer, Bernhard M. [Abstract] [Full Text]; Craver, Joseph M. [Abstract] [Full Text]; Cutz, Ernest [Abstract] [Full Text]
D: D’Agostino, Robert [Abstract] [Full Text]; D’Alessandro, Stefano [Abstract] [Full Text]; D’Ancona, Giuseppe [Full Text]; Dabboussi, Maher [Abstract] [Full Text]; Daebritz, Sabine H. [Abstract] [Full Text]; Damiano, Ralph J., Jr [Abstract] [Full Text]; Danel, Claire [Abstract] [Full Text]; David, Michel [Abstract] [Full Text]; Davila, Richard M. [Abstract] [Full Text]; Davis, R. Duane [Abstract] [Full Text]; de la Torre, Mercedes [Full Text]; De Matteis, Giovanni M. [Full Text]; De Matteis, Giovanni Maria [Abstract] [Full Text]; De Paulis, Ruggero [Full Text]; De Paulis, Ruggero [Abstract] [Full Text]; Debrosse, Denis [Abstract] [Full Text]; DeCamp, Malcolm M. [Abstract] [Full Text]; del Nido, Pedro J. [Abstract] [Full Text]; Del Rizzo, Dario F. [Abstract] [Full Text]; Deloche, Alain [Abstract] [Full Text]; Demmy, Todd L. [Abstract] [Full Text]; Desiron, Quentin [Full Text]; DeWitt, Douglas S. [Abstract] [Full Text]; Dhasmana, Janardan P. [Full Text]; Di Bella, Isidoro [Abstract] [Full Text]; Di Donato, Roberto M. [Full Text]; Di Giammarco, Gabriele [Abstract] [Full Text]; Di Mauro, Michele [Abstract] [Full Text]; Dion, Robert A.E. [Abstract] [Full Text]; Driever, Rudolf [Abstract] [Full Text]; Dujon, Antoine [Abstract] [Full Text]; Dunning, John [Abstract] [Full Text]; Duurkens, Vincent A.M. [Abstract] [Full Text]
E: Early, Gerald L. [Full Text]; Edwards, Vernon [Abstract] [Full Text]; Eicher, Jean Christophe [Abstract] [Full Text]; Eng, Philip C.T. [Abstract] [Full Text]; Engelhardt, Wolfgang [Abstract] [Full Text]; Ernst, Sjef M. [Abstract] [Full Text]
F: Ferguson, Mark K. [Abstract] [Full Text]; Fischer, Stefan [Abstract] [Full Text]; Fiser, Steven M. [Abstract] [Full Text]; Friedl, Reinhard [Abstract] [Full Text]; Fujii, Masahiro [Abstract] [Full Text]; Fujii, Masahiro [Abstract] [Full Text]; Fujiwara, Keiichi [Abstract] [Full Text]
G: Güler, Mustafa [Abstract] [Full Text]; Gaeta, Filoteo [Abstract] [Full Text]; Gale, Stephen C. [Abstract] [Full Text]; Gallina, Sabina [Abstract] [Full Text]; Gay, William A., Jr [Abstract] [Full Text]; Gaynor, J. William [Full Text]; Geha, Alexander S. [Abstract] [Full Text]; Gersony, Welton M. [Abstract] [Full Text]; Ghati, William A. [Full Text]; Ghosh, Luna [Abstract] [Full Text]; Girard, Philippe [Abstract] [Full Text]; Gorman, Grace D. [Abstract] [Full Text]; Gossot, Dominique [Abstract] [Full Text]; Grafe, Marjorie R. [Abstract] [Full Text]; Grenade, Thierry [Full Text]; Griffith, Bartley P. [Full Text]; Grinda, Jean-Michel [Abstract] [Full Text]; Grunenwald, Dominique [Abstract] [Full Text]; Grunkemeier, Gary L. [Abstract] [Full Text]
H: Hacker, Robert W. [Abstract] [Full Text]; Hahn, Joar [Abstract] [Full Text]; Hannan, Robert L. [Abstract] [Full Text]; Hannekum, Andreas [Abstract] [Full Text]; Harris, David G. [Abstract] [Full Text]; Hatori, Nobuo [Abstract] [Full Text]; Hatori, Nobuo [Abstract] [Full Text]; Hazekamp, Mark G. [Abstract] [Full Text]; Hazelrigg, Steven J. [Abstract] [Full Text]; Head, Harold D. [Full Text]; Heitmiller, Richard F. [Abstract] [Full Text]; Higami, Tetsuya [Abstract] [Full Text]; Hirsch, Gregory M. [Full Text]; Hitchcock, Francois J. [Abstract] [Full Text]; Hokama, Jason Y. [Abstract] [Full Text]; Hollis, Donna R. [Abstract] [Full Text]; Holman, William L. [Full Text]; Honma, Hiroshi [Abstract] [Full Text]; Hopkinson, David [Abstract] [Full Text]; Hordof, Allan J. [Abstract] [Full Text]; Howard, Randy B. [Abstract] [Full Text]; Hsu, Anne A.L. [Abstract] [Full Text]; Huddleston, Charles B. [Abstract] [Full Text]; Hutter, Paul [Abstract] [Full Text]
I: Iacò, Angela L. [Abstract] [Full Text]; Ichikawa, Hajime [Abstract] [Full Text]; Imai, Katsuhiko [Abstract] [Full Text]; Ino, Takashi [Abstract] [Full Text]; Ishii, Osamu [Abstract] [Full Text]; Itano, Hideki [Abstract] [Full Text]; Iwahashi, Kazuhiko [Abstract] [Full Text]
J: Jacobs, Jeffrey P. [Abstract] [Full Text]; Jaquez, Arturo [Abstract] [Full Text]; Jenkins, Larry W. [Abstract] [Full Text]; Jessen, Michael E. [Full Text]; Johnston, Michael R. [Abstract] [Full Text]; Johnston, William E. [Abstract] [Full Text]; Jonas, Richard A. [Abstract] [Full Text]; Jouan, Jerome [Abstract] [Full Text]
K: Köksoy, Cüneyt [Abstract] [Full Text]; Kabiri, Hassan [Abstract] [Full Text]; Kadner, Alexander [Abstract] [Full Text]; Karamanoukian, Hratch L. [Full Text]; Kato, Harubumi [Abstract] [Full Text]; Kawaguchi, Naomasa [Abstract] [Full Text]; Kawahito, Koji [Abstract] [Full Text]; Kaza, Aditya K. [Abstract] [Full Text]; Keles, Cüneyt [Abstract] [Full Text]; Kempkes, Udo [Abstract] [Full Text]; Kern, John A. [Abstract] [Full Text]; Keshavjee, Shaf [Abstract] [Full Text]; Knaepen, Paul J. [Abstract] [Full Text]; Koch, Walter J. [Abstract] [Full Text]; Koike, Teruaki [Abstract] [Full Text]; Komai, Hiroyoshi [Abstract] [Full Text]; Kondo, Takashi [Abstract] [Full Text]; Kong, Lawrence [Abstract] [Full Text]; Kouchoukos, Nicholas T. [Full Text]; Krasna, Mark J. [Abstract] [Full Text]; Krishna, Lingaraj [Abstract] [Full Text]; Krishnanaik, Shivaprakasha [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Kron, Irving L. [Full Text]
L: Löwbeer, Christian [Abstract] [Full Text]; Landreneau, Rodney J. [Abstract] [Full Text]; Latremouille, Christian [Abstract] [Full Text]; Le Pimpec-Barthes, Françoise [Abstract] [Full Text]; Lee, Daniel C. [Abstract] [Full Text]; LeMaire, Scott A. [Abstract] [Full Text]; Lensen, Ruud [Abstract] [Full Text]; Levasseur, Philippe [Abstract] [Full Text]; Levitsky, Sidney [Abstract] [Full Text]; Li, Guohu [Abstract] [Full Text]; Li, Hui-Hua [Abstract] [Full Text]; Liberman, Leonardo [Abstract] [Full Text]; Limet, Raymond [Full Text]; Lin, Cheng Y. [Abstract] [Full Text]; Lin, Susan X. [Abstract] [Full Text]; Liu, Mingyao [Abstract] [Full Text]; Lo, Constance P.L. [Abstract] [Full Text]; Long, Stewart M. [Abstract] [Full Text]; Lopushinsky, Steven R. [Abstract] [Full Text]; Lozano, Victor M. [Abstract] [Full Text]; Luketich, James D. [Abstract] [Full Text]
M: Macherey, Robin S. [Abstract] [Full Text]; Mack, Michael J. [Abstract] [Full Text]; MacLean, Alexandra A. [Abstract] [Full Text]; Magdeleinat, Pierre [Abstract] [Full Text]; Manac’h, Dominique [Abstract] [Full Text]; Manso, Ana M. [Abstract] [Full Text]; Marín, Jesús [Abstract] [Full Text]; Mariani, Massimo A. [Abstract] [Full Text]; Maselli, Daniele [Abstract] [Full Text]; Massad, Malek G. [Abstract] [Full Text]; Matsuda, Hikaru [Abstract] [Full Text]; Mayer, John E., Jr [Abstract] [Full Text]; Mayer, Robert J. [Abstract] [Full Text]; Mazzei, Valerio [Abstract] [Full Text]; McCarthy, Timothy J. [Abstract] [Full Text]; McConaghey, Todd W. [Abstract] [Full Text]; McCully, James D. [Abstract] [Full Text]; McDonagh, Paul F. [Abstract] [Full Text]; McKesey, Paul [Abstract] [Full Text]; Medioni, Jacques [Abstract] [Full Text]; Menasché, Philippe [Full Text]; Merriman, Kelly W. [Abstract] [Full Text]; Mertens, Heinrich [Abstract] [Full Text]; Messmer, Bruno J. [Abstract] [Full Text]; Miller, John D. [Abstract] [Full Text]; Miller, Charles C., III [Abstract] [Full Text]; Miller, D. Craig [Abstract] [Full Text]; Minzioni, Gaetano [Abstract] [Full Text]; Mitchell, R. Scott [Abstract] [Full Text]; Miyaji, Kagami [Abstract] [Full Text]; Modry, Dennis L. [Abstract] [Full Text]; Mohanakumar, Thalachallour [Abstract] [Full Text]; Mohanty, Smruti Ranjan [Abstract] [Full Text]; Molenschot, Mirella [Abstract] [Full Text]; Monro, James L. [Full Text]; Monro, James L. [Abstract] [Full Text]; Moon, Michael C. [Abstract] [Full Text]; Moon, Marc R. [Abstract] [Full Text]; Moon, Marc R. [Abstract] [Full Text]; Moore, Kathleen A. [Abstract] [Full Text]; Moses, Peter L. [Abstract] [Full Text]; Motoyoshi, Naotaka [Abstract] [Full Text]; Mullen, John C. [Abstract] [Full Text]; Mullen, John B.M. [Abstract] [Full Text]; Murrah, C. Patrick [Abstract] [Full Text]; Murthy, Kona Samba [Abstract] [Full Text]
N: Naito, Yasuaki [Abstract] [Full Text]; Nardi, Paolo [Abstract] [Full Text]; Naunheim, Keith S. [Abstract] [Full Text]; Nedzwiecki, Donna [Abstract] [Full Text]; Ng, Wai-Lin [Abstract] [Full Text]; Ngaage, Dumbor L. [Abstract] [Full Text]; Nishimura, Motonobu [Abstract] [Full Text]; Nohara, Hideaki [Abstract] [Full Text]
O: Özalp, Faruk [Abstract] [Full Text]; Ochi, Masami [Abstract] [Full Text]; Ochi, Masami [Abstract] [Full Text]; Ochsenfahrt, Christoph [Abstract] [Full Text]; Oda, Makoto [Abstract] [Full Text]; Ogawa, Kyoichi [Abstract] [Full Text]; Ohmi, Mikio [Abstract] [Full Text]; Ohtake, Shigeaki [Abstract] [Full Text]; Ojito, Jorge W. [Abstract] [Full Text]; Oka, Shigeteru [Abstract] [Full Text]; Okada, Kenji [Abstract] [Full Text]; Ootaki, Yoshio [Abstract] [Full Text]; Orihashi, Kazumasa [Abstract] [Full Text]; Oshima, Yoshihiro [Abstract] [Full Text]; Oyer, Phillip E. [Abstract] [Full Text]; Oz, Mehmet C. [Abstract] [Full Text]
P: Pacheco, María E. [Abstract] [Full Text]; Page, Richard [Full Text]; Pagura, Marco E. [Abstract] [Full Text]; Pasque, Michael K. [Abstract] [Full Text]; Pasquino, Stefano [Abstract] [Full Text]; Pass, Robert H. [Abstract] [Full Text]; Patel, Manisha A. [Abstract] [Full Text]; Patterson, G. Alexander [Abstract] [Full Text]; Perrault, Louis P. [Full Text]; Pisters, Katherine M. [Abstract] [Full Text]; Polisca, Patrizio [Abstract] [Full Text]; Poncet, Anne [Abstract] [Full Text]; Porrello, Calogero [Abstract] [Full Text]; Poullis, Mike [Full Text]; Putnam, Joe B., Jr [Abstract] [Full Text]; Puyo, Philippe [Abstract] [Full Text]
Q: Quaegebeur, Jan M. [Abstract] [Full Text]
R: Radermecker, Marc A. [Full Text]; Rawles, Thomas [Abstract] [Full Text]; Redondo, Juliana [Abstract] [Full Text]; Reed, Carolyn E. [Abstract] [Full Text]; Regnard, Jean François [Abstract] [Full Text]; Reitz, Bruce A. [Abstract] [Full Text]; Resnick, Daniel [Abstract] [Full Text]; Ricci, Marco [Full Text]; Riquet, Marc [Abstract] [Full Text]; Ritter, Jon H. [Abstract] [Full Text]; Ritter, Leslie S. [Abstract] [Full Text]; Rivas de Andrés, Juan J. [Full Text]; Robbins, Robert C. [Abstract] [Full Text]; Roberts, Shauna R. [Full Text]; Rokkas, Chris K. [Full Text]; Rossouw, Gawie J. [Abstract] [Full Text]; Roth, Jack A. [Abstract] [Full Text]; Ruengsakulrach, Permyos [Abstract] [Full Text]
S: Saade, Yves Assad [Abstract] [Full Text]; Sachweh, Jörg S. [Abstract] [Full Text]; Sadahiro, Mitsuaki [Abstract] [Full Text]; Sagawa, Motoyasu [Abstract] [Full Text]; Saji, Yoshiaki [Abstract] [Full Text]; Saji, Yoshiaki [Abstract] [Full Text]; Sakurai, Masahiro [Abstract] [Full Text]; Salaices, Mercedes [Abstract] [Full Text]; Saleh, Mountajab [Abstract] [Full Text]; Salerno, Tomas A. [Full Text]; Santucci, Tibetha S. [Abstract] [Full Text]; Sato, Masami [Abstract] [Full Text]; Sawa, Yoshiki [Abstract] [Full Text]; Schalij, Martin J. [Abstract] [Full Text]; Schmittling, Zachary C. [Abstract] [Full Text]; Schmoker, Joseph D. [Abstract] [Full Text]; Schoof, Paul H. [Abstract] [Full Text]; Schumacher, Bernd A. [Abstract] [Full Text]; Shackcloth, Michael [Full Text]; Shida, Tsutomu [Abstract] [Full Text]; Shumway, Norman E. [Abstract] [Full Text]; Siegenthaler, Michael P. [Abstract] [Full Text]; Sismanoglu, Mesut [Abstract] [Full Text]; Smith, Edward E.J. [Abstract] [Full Text]; Smythe, W. Roy [Abstract] [Full Text]; Solowiejczyk, David E. [Abstract] [Full Text]; Soo, Tan Bien [Abstract] [Full Text]; Spaggiari, Lorenzo [Abstract] [Full Text]; Sreeram, Narayanswami [Abstract] [Full Text]; Stinson, Edward B. [Abstract] [Full Text]; Stoica, Serban C. [Abstract] [Full Text]; Sueda, Taijiro [Abstract] [Full Text]; Sugarbaker, David J. [Abstract] [Full Text]; Sundt, Thoralf M., III [Abstract] [Full Text]; Swisher, Stephen G. [Abstract] [Full Text]
T: Tähepôld, Peeter [Abstract] [Full Text]; Tabayashi, Koichi [Abstract] [Full Text]; Tabayashi, Koichi [Abstract] [Full Text]; Taketani, Satoshi [Abstract] [Full Text]; Tanaka, Shigeo [Abstract] [Full Text]; Tanaka, Shigeo [Abstract] [Full Text]; Tatou, Etienne [Abstract] [Full Text]; Tiete, Andreas R. [Abstract] [Full Text]; Ting, Windsor [Abstract] [Full Text]; Tofukuji, Motohisa [Abstract] [Full Text]; Tokuno, Shinichi [Abstract] [Full Text]; Torka, Marius [Abstract] [Full Text]; Toyoda, Yoshiya [Abstract] [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]; Tsuchiya, Ryosuke [Abstract] [Full Text]; Tsuru, Yusuke [Abstract] [Full Text]; Turpin, Timothy A. [Abstract] [Full Text]
U: Uemura, Shigeru [Abstract] [Full Text]; Underwood, Malcolm J. [Abstract] [Full Text]; Urbanski, Paul [Abstract] [Full Text]; Urschel, John D. [Abstract] [Full Text]
V: Vaage, Jarle [Abstract] [Full Text]; Valen, Guro [Abstract] [Full Text]; van Boven, Wim J. [Abstract] [Full Text]; Van Lommel, Willem [Abstract] [Full Text]; van Swieten, Henry A. [Abstract] [Full Text]; Vaporciyan, Ara A. [Abstract] [Full Text]; Varghese, Roy [Abstract] [Full Text]; Vela, Alejandro H. [Abstract] [Full Text]; Vermeulen, Freddy E.E. [Abstract] [Full Text]; Vetter, Herbert O. [Abstract] [Full Text]; Viganò, Mario [Abstract] [Full Text]; Villaseñor, Cesar [Abstract] [Full Text]; von Bernuth, Götz [Abstract] [Full Text]
W: Wagner, William R. [Full Text]; Wagner-Mann, Colette C. [Abstract] [Full Text]; Wallwork, John [Abstract] [Full Text]; Walsh, Garrett L. [Abstract] [Full Text]; Wang, Yi Shan [Abstract] [Full Text]; Watari, Masanobu [Abstract] [Full Text]; Weinberg, Alan D. [Abstract] [Full Text]; Werner, Jeffrey P. [Abstract] [Full Text]; Wessel, David L. [Abstract] [Full Text]; White, Jeffrey A. [Abstract] [Full Text]; Wiechmann, Robert J. [Abstract] [Full Text]; Wilson, Chad [Abstract] [Full Text]; Wisheart, James D. [Full Text]
Y: Yakut, Cevat [Abstract] [Full Text]; Yamaguchi, Masahiro [Abstract] [Full Text]; Yamaguchi, Atsushi [Abstract] [Full Text]; Yamashita, Teruo [Abstract] [Full Text]; Yew, Nelson S. [Abstract] [Full Text]; Yokoyama, Hitoshi [Abstract] [Full Text]; Yoshimura, Naoki [Abstract] [Full Text]
Z: Zahradka, Peter [Abstract] [Full Text]; Zhang, Wanjiang [Abstract] [Full Text]; Zurakowski, David [Abstract] [Full Text]