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Index by Author: Volume 70, Issue 3 (September 2000) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abramov, Dan [Abstract] [Full Text]; Absi, Tauriq [Abstract] [Full Text]; Ahmed, Omar [Abstract] [Full Text]; Ahmet, Ismayil [Abstract] [Full Text]; Airan, Balram [Abstract] [Full Text]; Akin, Jodi J. [Abstract] [Full Text]; Albertal, Jorge [Abstract] [Full Text]; Aldea, Gabriel S. [Abstract] [Full Text]; Aldousany, Abdul [Abstract] [Full Text]; Alexi-Meskishvili, Vladimir V. [Abstract] [Full Text]; Alferness, Clif [Abstract] [Full Text]; Alkon, Joseph D. [Abstract] [Full Text]; Allen, Bradley S. [Abstract] [Full Text]; Allen, Bradley S. [Abstract] [Full Text]; Ambrose, Gunaseelan [Abstract] [Full Text]; Angus, George L.D. [Abstract] [Full Text]; Applebaum, Robert M. [Abstract] [Full Text]; Arom, Kit V. [Abstract] [Full Text]; Arrigoni, Gianluigi [Abstract] [Full Text]; Artemiou, Omeros [Abstract] [Full Text]; Asahara, Takayuki [Abstract] [Full Text]; Autschbach, Rüdiger [Abstract] [Full Text]; Autschbach, Rüdiger [Abstract] [Full Text]; Autschbach, Rüdiger [Abstract] [Full Text]
B: Baldwin, Albert S., Jr [Abstract] [Full Text]; Bannon, Paul G. [Abstract] [Full Text]; Barnes, Mary J. [Abstract] [Full Text]; Barrett, Leonard O. [Abstract] [Full Text]; Baumgartner, Helmut [Abstract] [Full Text]; Bayfield, Matthew S. [Abstract] [Full Text]; Becit, Necip [Full Text]; Beck, James R. [Abstract] [Full Text]; Bennett, Kenneth R. [Abstract] [Full Text]; Bensky, Andrew S. [Abstract] [Full Text]; Berg, Hans F. [Abstract] [Full Text]; Beyer, Erik A.K. [Abstract] [Full Text]; Bhan, Anil [Abstract] [Full Text]; Bhatia, Devinder [Abstract] [Full Text]; Bhatnagar, Gopal [Abstract] [Full Text]; Blum, James M. [Abstract] [Full Text]; Blume, Elizabeth D. [Abstract] [Full Text]; Boden, Bryan D. [Abstract] [Full Text]; Bolling, Kirk S. [Abstract] [Full Text]; Bolling, Kirk S. [Abstract] [Full Text]; Bolman, R. Morton, III [Abstract] [Full Text]; Bonacchi, Massimo [Abstract] [Full Text]; Bortolotti, Uberto [Abstract] [Full Text]; Bortone, Alessandro S. [Abstract] [Full Text]; Bortone, Alessandro S. [Abstract] [Full Text]; Bousette, Nicolas [Abstract] [Full Text]; Boyd, W. Douglas [Abstract] [Full Text]; Brancaccio, Gianluca [Abstract] [Full Text]; Brands, Willem G.B. [Abstract] [Full Text]; Brindicci, Paolino [Abstract] [Full Text]; Broad, R. Michael [Abstract] [Full Text]; Brown, W. Morris, III [Abstract] [Full Text]; Brown, Elizabeth R. [Abstract] [Full Text]; Bucerius, Jan [Abstract] [Full Text]; Buczkowski, Piotr [Abstract] [Full Text]; Buffolo, Enio [Abstract] [Full Text]; Burke, Redmond P. [Abstract] [Full Text]; Burke, Redmond P. [Abstract] [Full Text]; Buttenheim, Patricia M. [Abstract] [Full Text]; Buxton, Brian F. [Abstract] [Full Text]; Buxton, Brian F. [Abstract] [Full Text]
C: Capannini, Gianni [Abstract] [Full Text]; Caramutti, Víctor M. [Abstract] [Full Text]; Carrel, Thierry [Abstract] [Full Text]; Carrier, Michel [Abstract] [Full Text]; Casselman, Filip [Abstract] [Full Text]; Cerfolio, Robert J. [Abstract] [Full Text]; Chang, Anthony C. [Abstract] [Full Text]; Chapelier, Alain R. [Abstract] [Full Text]; Cherian, Kottoorathu M. [Abstract] [Full Text]; Cherian, Meena [Abstract] [Full Text]; Choudhary, Shiv Kumar [Abstract] [Full Text]; Christakis, George T. [Abstract] [Full Text]; Christie, Neil A. [Abstract] [Full Text]; Cichon, Romuald [Abstract] [Full Text]; Cichon, Romuald [Abstract] [Full Text]; Cichon, Romuald [Abstract] [Full Text]; Cilley, Jonathan H., Jr [Abstract] [Full Text]; Clough, Robert A. [Abstract] [Full Text]; Coelho, Rafael [Abstract] [Full Text]; Cohen, David J. [Abstract] [Full Text]; Coles, John G. [Abstract] [Full Text]; Colvin, Stephen B. [Abstract] [Full Text]; Colvin, Stephen B. [Abstract] [Full Text]; Cope, Jeffrey T. [Full Text]; Craver, Joseph M. [Abstract] [Full Text]; Crawford, Fred A. [Abstract] [Full Text]; Crumbley, A. Jackson [Abstract] [Full Text]; Culliford, Alfred T. [Abstract] [Full Text]
D: D’Addabbo, Angelo [Abstract] [Full Text]; D’Agostino, Donato [Abstract] [Full Text]; D’Agostino, Donato [Abstract] [Full Text]; D’Ambra, Alyssa B. [Abstract] [Full Text]; Dähnert, Ingo [Abstract] [Full Text]; Dallan, Luís A. [Abstract] [Full Text]; Danielo, Rafael [Abstract] [Full Text]; Dartevelle, Philippe G. [Abstract] [Full Text]; Das, Dipak K. [Abstract] [Full Text]; De Carlo, Marco [Abstract] [Full Text]; de Luca Tupputi Schinosa, Luigi [Abstract] [Full Text]; de Luca Tupputi Schinosa, Luigi [Abstract] [Full Text]; del Nido, Pedro J. [Full Text]; DelRossi, Anthony J. [Abstract] [Full Text]; Denisi, Rocco [Abstract] [Full Text]; Derivaux, Christopher C. [Abstract] [Full Text]; Desai, Nimesh D. [Abstract] [Full Text]; Desjardins, Nathalie [Abstract] [Full Text]; Deville, Claude [Abstract] [Full Text]; Dicke, Frank P. [Abstract] [Full Text]; DiCorte, Charles J. [Full Text]; Diegeler, Anno [Abstract] [Full Text]; Diegeler, Anno [Abstract] [Full Text]; Dittrich, Sven [Abstract] [Full Text]; Doll, Nicolas [Abstract] [Full Text]; Duffy, Jodie Y. [Abstract] [Full Text]; Dulbecco, Eduardo A. [Abstract] [Full Text]; Dygert, James M. [Abstract] [Full Text]; Dyke, Cornelius M. [Abstract] [Full Text]; Dyszkiewicz, Wojciech [Abstract] [Full Text]
E: Early, Gerald L. [Full Text]; Edgerton, James R. [Abstract] [Full Text]; Egami, Jun [Abstract] [Full Text]; Elefteriades, John A. [Abstract] [Full Text]; Elliott, Gary T. [Abstract] [Full Text]; Emery, Robert W. [Abstract] [Full Text]; Engelman, Daniel T. [Abstract] [Full Text]; Engelman, Richard M. [Abstract] [Full Text]; Englberger, Lars [Abstract] [Full Text]; Erdem Toker, Mehmet [Abstract] [Full Text]
F: Fadel, Elie [Abstract] [Full Text]; Fahimi, Hossein [Abstract] [Full Text]; Falk, Volkmar [Abstract] [Full Text]; Falk, Volkmar [Abstract] [Full Text]; Falk, Volkmar [Abstract] [Full Text]; Fasol, Roland [Abstract] [Full Text]; Favaloro, Mariano R. [Abstract] [Full Text]; Fernando, Hiran C. [Abstract] [Full Text]; Flavin, Thomas F. [Abstract] [Full Text]; Flavin, Thomas F. [Abstract] [Full Text]; Fontes, Ricardo [Abstract] [Full Text]; Franga, Dion L. [Abstract] [Full Text]; Frank, Herbert [Abstract] [Full Text]; Frazier, O.H. [Abstract] [Full Text]; Fremes, Stephen E. [Abstract] [Full Text]; French, Bruce G. [Abstract] [Full Text]; Frischmeyer, Karen J. [Abstract] [Full Text]; Fujita, Masatoshi [Abstract] [Full Text]
G: Güler, Mustafa [Abstract] [Full Text]; Galloway, Aubrey C. [Abstract] [Full Text]; Galloway, Aubrey C. [Abstract] [Full Text]; Gaudino, Mario [Full Text]; Gerevini, Simonetta [Abstract] [Full Text]; Giaid, Adel [Abstract] [Full Text]; Giunti, Gabriele [Abstract] [Full Text]; Glower, Donald D. [Abstract] [Full Text]; Gnanamuthu, Roy [Abstract] [Full Text]; Goldman, Bernard S. [Abstract] [Full Text]; Gomyo, Yoshihito [Abstract] [Full Text]; Goracci, Massimo [Abstract] [Full Text]; Goss, J. Richard [Abstract] [Full Text]; Gott, John Parker [Abstract] [Full Text]; Gregoric, Igor [Abstract] [Full Text]; Grimm, Michael [Abstract] [Full Text]; Grist, Gary [Abstract] [Full Text]; Grossi, Eugene A. [Abstract] [Full Text]; Grossi, Eugene A. [Abstract] [Full Text]; Grover, Frederick L. [Abstract] [Full Text]; Groves, Bertron M. [Abstract] [Full Text]; Grunkemeier, Gary L. [Abstract] [Full Text]; Gulielmos, Vassilios [Abstract] [Full Text]; Gulielmos, Vassilios [Abstract] [Full Text]; Gulielmos, Vassilios [Abstract] [Full Text]; Guyton, Robert A. [Abstract] [Full Text]
H: Hammermeister, Karl E. [Abstract] [Full Text]; Hanjis, Costas D. [Abstract] [Full Text]; Hannan, Robert L. [Abstract] [Full Text]; Hare, David [Abstract] [Full Text]; Harringer, Wolfgang [Abstract] [Full Text]; Harrington, Robert A. [Abstract] [Full Text]; Hart, James C. [Abstract] [Full Text]; Hayashi, Jun-ichi [Abstract] [Full Text]; He, Guo-Wei [Full Text]; Heenan, Amie L. [Abstract] [Full Text]; Heitmiller, Richard F. [Full Text]; Helman, David N. [Abstract] [Full Text]; Hendel, P. Nicholas [Abstract] [Full Text]; Hernandez, Felix [Abstract] [Full Text]; Hetzer, Roland [Full Text]; Hetzer, Roland [Abstract] [Full Text]; Hindricks, Gerd [Abstract] [Full Text]; Hines, Michael H. [Abstract] [Full Text]; Hirata, Nobuaki [Abstract] [Full Text]; Hofer, Bradley O. [Abstract] [Full Text]; Hogeboom, Charissa [Abstract] [Full Text]; Holman, William L. [Abstract] [Full Text]; Hori, Takaki [Abstract] [Full Text]; Horton, Matthew [Abstract] [Full Text]; Hueb, Alexandre C. [Abstract] [Full Text]; Hughes, Clifford F. [Abstract] [Full Text]
I: Iavicoli, Nicola [Abstract] [Full Text]; Idir, Messaoud [Abstract] [Full Text]; Ikeguchi, Masahide [Abstract] [Full Text]; Ilbawi, Michel N. [Abstract] [Full Text]; Ilbawi, Michel N. [Abstract] [Full Text]; Imasaka, Kenichi [Abstract] [Full Text]; Iparraguirre, Eduardo [Abstract] [Full Text]; Isner, Jeffrey M. [Abstract] [Full Text]; Iwakura, Atsushi [Abstract] [Full Text]; Iyer, Ganeshakrishnan K.T. [Abstract] [Full Text]
J: Järvinen, Antero A. [Abstract] [Full Text]; Jacobowitz, Israel J. [Abstract] [Full Text]; Jacobs, Jeffrey P. [Abstract] [Full Text]; Jan van Boven, Wim [Abstract] [Full Text]; Janey, Patricia A. [Abstract] [Full Text]; Jansen, Erik W.L. [Abstract] [Full Text]; Jatene, Fabio B. [Abstract] [Full Text]; Jatene, Adib D. [Abstract] [Full Text]; Jatene, Fabio B. [Abstract] [Full Text]; Jin, Xu Yu [Abstract] [Full Text]; Johnston, G. Gilbert [Abstract] [Full Text]; Jonas, Richard A. [Full Text]; Jones, Ellis L. [Abstract] [Full Text]; Jones, David R. [Abstract] [Full Text]; Joubert-Hubner, Elrina [Abstract] [Full Text]
K: Kadoba, Keishi [Abstract] [Full Text]; Kaibara, Nobuaki [Abstract] [Full Text]; Kalangos, Afksendiyos [Full Text]; Kalka, Christoph [Abstract] [Full Text]; Kalra, Sanjeev [Abstract] [Full Text]; Kann, Brian R. [Abstract] [Full Text]; Kano, Masashi [Abstract] [Full Text]; Kappert, Utz [Abstract] [Full Text]; Kappert, Utz [Abstract] [Full Text]; Kappert, Utz [Abstract] [Full Text]; Karhunen, Pekka J. [Abstract] [Full Text]; Kasliwal, Ravi R. [Abstract] [Full Text]; Katholi, Charles R. [Abstract] [Full Text]; Katoh, Itsuo [Abstract] [Full Text]; Katsumata, Takahiro [Abstract] [Full Text]; Kawauchi, Motohiro [Abstract] [Full Text]; Keaney, John F., Jr [Abstract] [Full Text]; Keenan, Robert J. [Abstract] [Full Text]; Kiaii, Bob [Abstract] [Full Text]; Kim, William J. [Abstract] [Full Text]; Kipfer, Beat [Abstract] [Full Text]; Kirali, Kaan [Abstract] [Full Text]; Kitagawa, Tetsuya [Abstract] [Full Text]; Kitakaze, Masafumi [Abstract] [Full Text]; Klemperer, John D. [Abstract] [Full Text]; Klepetko, Walter [Abstract] [Full Text]; Kluytmans, Jan A.J.W. [Abstract] [Full Text]; Kluytmans-VandenBergh, Marjolein F.Q. [Abstract] [Full Text]; Knaut, Michael [Abstract] [Full Text]; Koçak, Hikmet [Full Text]; Komeda, Masashi [Abstract] [Full Text]; Korkola, Stephen J. [Abstract] [Full Text]; Kostelka, Martin [Abstract] [Full Text]; Kothari, Shyam Sunder [Abstract] [Full Text]; Kotsuka, Yutaka [Abstract] [Full Text]; Kottkamp, Hans [Abstract] [Full Text]; Krassói, Irén [Abstract] [Full Text]; Kratz, John M. [Abstract] [Full Text]; Krauss, Beate [Abstract] [Full Text]; Krishnan, Usha [Abstract] [Full Text]; Kron, Irving L. [Full Text]; Kronon, Michael T. [Abstract] [Full Text]; Kronon, Michael T. [Abstract] [Full Text]; Kshettry, Vibhu R. [Abstract] [Full Text]; Kun, Attila [Abstract] [Full Text]; Kurita, Akira [Abstract] [Full Text]
L: Lakew, Fitzum [Abstract] [Full Text]; Lamberti, John J. [Full Text]; Lancelin, Christophe [Abstract] [Full Text]; Lange, Peter E. [Abstract] [Full Text]; LaPietra, Angelo [Abstract] [Full Text]; Lau, Derick H.M. [Full Text]; Laudenberg, Bernd [Abstract] [Full Text]; Levantino, Maurizio [Abstract] [Full Text]; Li, Ren-Ke [Abstract] [Full Text]; Li, Guangming [Abstract] [Full Text]; Li, Hui-Hua [Abstract] [Full Text]; Li, Shou-jun [Abstract] [Full Text]; Lindenfeld, JoAnn [Abstract] [Full Text]; Lisagor, Philip G. [Abstract] [Full Text]; Liu, Ying-long [Abstract] [Full Text]; LoGerfo, James P. [Abstract] [Full Text]; Lonquist, James L. [Abstract] [Full Text]; Lorenz, Todd J. [Abstract] [Full Text]; Luketich, James D. [Abstract] [Full Text]
M: Macchiarini, Paolo [Abstract] [Full Text]; Machain, Alejandro [Abstract] [Full Text]; Mack, Michael J. [Abstract] [Full Text]; Mack, Michael J. [Abstract] [Full Text]; Mack, Michael J. [Full Text]; Macron, Donald S.F. [Abstract] [Full Text]; Madrid, Lee V. [Abstract] [Full Text]; Maeta, Michio [Abstract] [Full Text]; Malcolm, Janet [Abstract] [Full Text]; Malhotra, Rajneesh [Abstract] [Full Text]; Maniar, Hersh S. [Abstract] [Full Text]; Manning, Peter B. [Abstract] [Full Text]; Mansfield, Peter B. [Abstract] [Full Text]; Mariani, Massimo A. [Abstract] [Full Text]; Marino, Mario [Abstract] [Full Text]; Mariotti, Rita [Abstract] [Full Text]; Marques de Oliveira, Patrícia [Abstract] [Full Text]; Marra, Steven W. [Abstract] [Full Text]; Marso, Steven P. [Abstract] [Full Text]; Masuda, Yutaka [Abstract] [Full Text]; Masuda, Munetaka [Abstract] [Full Text]; Matheny, Robert G. [Abstract] [Full Text]; Mathison, Megumi [Abstract] [Full Text]; Matschke, Klaus [Abstract] [Full Text]; Matschke, Klaus [Abstract] [Full Text]; Matsuda, Hikaru [Abstract] [Full Text]; Matteucci, Giuseppe [Abstract] [Full Text]; Matuda, Hikaru [Abstract] [Full Text]; Maulik, Nilanjana [Abstract] [Full Text]; MaWhinney, Samantha [Abstract] [Full Text]; Mayer, John E., Jr [Abstract] [Full Text]; Mayo, Marty W. [Abstract] [Full Text]; McConaghey, Todd W. [Abstract] [Full Text]; McCrindle, Brian W. [Abstract] [Full Text]; McFadden, P. Michael [Full Text]; McKenzie, F. Neil [Abstract] [Full Text]; McMullan, David Michael [Abstract] [Full Text]; Mehta, Yatin [Abstract] [Full Text]; Menkis, Alan H. [Abstract] [Full Text]; Messmer, Bruno J. [Abstract] [Full Text]; Metz, Sebastian [Abstract] [Full Text]; Meyer, Rudolf [Abstract] [Full Text]; Mickle, Donald A.G. [Abstract] [Full Text]; Mickleborough, Lynda L. [Full Text]; Milano, Aldo D. [Abstract] [Full Text]; Mineo, Tommaso Claudio [Abstract] [Full Text]; Mineo, Tommaso Claudio [Abstract] [Full Text]; Miraldi, Fabio [Abstract] [Full Text]; Mishra, Yugal K. [Abstract] [Full Text]; Mishra, Anil [Abstract] [Full Text]; Mishra, Manisha [Abstract] [Full Text]; Miyaji, Kagami [Abstract] [Full Text]; Miyamoto, Tadaomi-Alfonso [Full Text]; Miyamoto, Koho-Julio [Full Text]; Mohr, Friedrich W. [Abstract] [Full Text]; Mohr, Friedrich W. [Abstract] [Full Text]; Mohr, Friedrich W. [Abstract] [Full Text]; Molinaro, Peter J. [Abstract] [Full Text]; Monden, Yasumasa [Full Text]; Morales, David L.S. [Abstract] [Full Text]; Morita, Shigeki [Abstract] [Full Text]; Moro, Katsumi [Abstract] [Full Text]
N: Nagano, Ichiro [Abstract] [Full Text]; Naka, Yoshihisa [Abstract] [Full Text]; Nakamura, Tatsuo [Abstract] [Full Text]; Nakata, Masao [Abstract] [Full Text]; Navia, Daniel [Abstract] [Full Text]; Negri, Giampiero [Abstract] [Full Text]; Nelson, David P. [Abstract] [Full Text]; Neri, Eugenio [Abstract] [Full Text]; Nguyen, Ninh T. [Abstract] [Full Text]; Nguyen, Duc Q. [Abstract] [Full Text]; Nickner, Caroline [Abstract] [Full Text]; Nielsen, James L. [Abstract] [Full Text]; Niibori, Tatsuru [Abstract] [Full Text]; Nishimura, Motonobu [Abstract] [Full Text]; Nishimura, Kazunobu [Abstract] [Full Text]; Nishimura, Motonobu [Abstract] [Full Text]; Nofroni, Italo [Abstract] [Full Text]; Nofroni, Italo [Abstract] [Full Text]; Novick, Richard J. [Abstract] [Full Text]; Noyez, Luc [Full Text]
O: O’Connor, Gerald T. [Full Text]; Obney, James A. [Abstract] [Full Text]; Ohtake, Shigeaki [Abstract] [Full Text]; Ohzeki, Hajime [Abstract] [Full Text]; Ojito, Jorge [Abstract] [Full Text]; Ojito, Jorge W. [Abstract] [Full Text]; Oka, Shinichi [Abstract] [Full Text]; Oko-Sarnowska, Zofia [Abstract] [Full Text]; Onnasch, Jörg-Friedrich [Abstract] [Full Text]; Ono, Minoru [Abstract] [Full Text]; Onoda, Koji [Abstract] [Full Text]; Oz, Mehmet C. [Abstract] [Full Text]
P: Pêgo-Fernandes, Paulo M. [Abstract] [Full Text]; Papp, Julius Gy. [Abstract] [Full Text]; Park, Soon J. [Abstract] [Full Text]; Parrens, Marie [Abstract] [Full Text]; Pasic, Miralem [Full Text]; Pataricza, János [Abstract] [Full Text]; Pawar, Nikunj [Abstract] [Full Text]; Payne, R. Mark [Abstract] [Full Text]; Pearl, Jeffrey M. [Abstract] [Full Text]; Penttilä, Antti [Abstract] [Full Text]; Perrault, Louis P. [Abstract] [Full Text]; Petersen, Rebecca J. [Abstract] [Full Text]; Pfannmüller, Bettina [Abstract] [Full Text]; Phillips, Richard C. [Abstract] [Full Text]; Phillips, Laurie [Abstract] [Full Text]; Piccinini, Fernando [Abstract] [Full Text]; Pompeo, Eugenio [Abstract] [Full Text]; Pompeo, Eugenio [Abstract] [Full Text]; Possati, Gianfederico [Full Text]; Power, John M. [Abstract] [Full Text]; Prasad, Sunil M. [Abstract] [Full Text]; Pratali, Stefano [Abstract] [Full Text]; Prifti, Edvin [Abstract] [Full Text]; Prifti, Edvin [Abstract] [Full Text]; Puskas, John D. [Abstract] [Full Text]; Pym, John [Abstract] [Full Text]
Q: Quaife, Robert A. [Abstract] [Full Text]
R: Radovancevic, Branislav [Abstract] [Full Text]; Raffaelli, Héctor A. [Abstract] [Full Text]; Rahman, Shaikh [Abstract] [Full Text]; Rahman, Shaikh [Abstract] [Full Text]; Raja, Siva [Abstract] [Full Text]; Raman, Jai S. [Abstract] [Full Text]; Raman, Jai S. [Abstract] [Full Text]; Ravikumar, Edwin [Abstract] [Full Text]; Rayman, Reiza [Abstract] [Full Text]; Reddy, Ramachandra C. [Abstract] [Full Text]; Regolo, Paolo [Abstract] [Full Text]; Reichenspurner, Hermann [Abstract] [Full Text]; Ribakove, Greg H. [Abstract] [Full Text]; Ribakove, Greg H. [Abstract] [Full Text]; Ricci, Marco [Full Text]; Roberts, Shauna R. [Full Text]; Robinson, Newell B. [Abstract] [Full Text]; Robinson, Philip G. [Full Text]; Rogers, Edwin W. [Abstract] [Full Text]; Roudaut, Raymond [Abstract] [Full Text]; Rousou, John A. [Abstract] [Full Text]; Rubini, Giuseppe [Abstract] [Full Text]; Rubini, Giuseppe [Abstract] [Full Text]; Ryan, William H. [Abstract] [Full Text]
S: Sabado, Mario F. [Abstract] [Full Text]; Saeki, Hideyuki [Abstract] [Full Text]; Sai Sudhakar, Chitoor B. [Abstract] [Full Text]; Saito, Satoshi [Abstract] [Full Text]; Sakaguchi, Genichi [Abstract] [Full Text]; Salerno, Tomas A. [Full Text]; Salica, Andrea [Abstract] [Full Text]; Salminen, Ulla-Stina [Abstract] [Full Text]; Sardaro, Vito [Abstract] [Full Text]; Sardaro, Vito [Abstract] [Full Text]; Sarnowski, Wojciech [Abstract] [Full Text]; Sassi, Carlo [Abstract] [Full Text]; Sato, Motoaki [Abstract] [Full Text]; Sawa, Yoshiki [Abstract] [Full Text]; Sawa, Yoshiki [Abstract] [Full Text]; Saxena, Anita [Abstract] [Full Text]; Schüler, Stephan [Abstract] [Full Text]; Schüler, Stephan [Abstract] [Full Text]; Schüler, Stephan [Abstract] [Full Text]; Schauer, Philip R. [Abstract] [Full Text]; Schena, Stefano [Abstract] [Full Text]; Schena, Stefano [Abstract] [Full Text]; Schermerhorn, Marc L. [Abstract] [Full Text]; Schneider, Felix [Abstract] [Full Text]; Schneider, Jens [Abstract] [Full Text]; Schneider, Jens [Abstract] [Full Text]; Schramm, Ina [Abstract] [Full Text]; Seipelt, Ralf G. [Abstract] [Full Text]; Sever, Jeri Y. [Abstract] [Full Text]; Shaftan, Gerald W. [Abstract] [Full Text]; Shah, Maully J. [Abstract] [Full Text]; Shah, Shaunak [Abstract] [Full Text]; Shankargowda, Shreyans [Abstract] [Full Text]; Shapira, Oz M. [Abstract] [Full Text]; Sharma, Krishna K. [Abstract] [Full Text]; Sharma, Rajesh [Abstract] [Full Text]; Shemin, Richard J. [Abstract] [Full Text]; Shennib, Hani [Abstract] [Full Text]; Shennib, Hani [Full Text]; Shennib, Hani [Abstract] [Full Text]; Shennib, Hani [Full Text]; Shimizu, Yasuhiko [Abstract] [Full Text]; Shimono, Takatsugu [Abstract] [Full Text]; Shimpo, Hideto [Abstract] [Full Text]; Shrivastava, Samir [Abstract] [Full Text]; Shroyer, A. Laurie W. [Abstract] [Full Text]; Siegel, Lawrence C. [Abstract] [Full Text]; Slepian, Marvin J. [Abstract] [Full Text]; Spanier, Talia B. [Abstract] [Full Text]; Spertus, John A. [Abstract] [Full Text]; Spooner, Ted H. [Abstract] [Full Text]; Stauffer, Edouard [Abstract] [Full Text]; Steinberg, Bryan M. [Abstract] [Full Text]; Stolf, Noedir A.G. [Abstract] [Full Text]; Stroud, Martha R. [Abstract] [Full Text]; Su, Jun-wu [Abstract] [Full Text]; Sun, Han-song [Abstract] [Full Text]; Sundar, Prem [Abstract] [Full Text]; Symes, James F. [Abstract] [Full Text]; Szyszka, Andrzej [Abstract] [Full Text]
T: Tabata, Yasuhiko [Abstract] [Full Text]; Taguchi, Shinichi [Abstract] [Full Text]; Takamoto, Shinichi [Abstract] [Full Text]; Takao, Motoshi [Abstract] [Full Text]; Takashima, Shigemitsu [Abstract] [Full Text]; Takiyama, Wataru [Abstract] [Full Text]; Tamariz, Miguel G. [Abstract] [Full Text]; Tanaka, Kuniyoshi [Abstract] [Full Text]; Tardiff, Barbara E. [Abstract] [Full Text]; Tayyab, N. Arif [Abstract] [Full Text]; Tehrani, Hassan [Abstract] [Full Text]; Thomas, Sarah [Abstract] [Full Text]; Thomas, Donald W. [Abstract] [Full Text]; Thourani, Vinod H. [Abstract] [Full Text]; Tidwell, Sandra L. [Abstract] [Full Text]; Toda, Koichi [Full Text]; Tominaga, Takashi [Abstract] [Full Text]; Tominaga, Ryuji [Abstract] [Full Text]; Torday, Ladislaus L. [Abstract] [Full Text]; Trehan, Naresh [Abstract] [Full Text]; Trehan, Naresh [Abstract] [Full Text]; Tripodi, Alberto [Abstract] [Full Text]; Tritapepe, Luigi [Abstract] [Full Text]; Tsuchida, Masanori [Abstract] [Full Text]; Tsujitani, Shunichi [Abstract] [Full Text]; Tucci, Antonella [Abstract] [Full Text]; Tucci, Enrico [Abstract] [Full Text]; Tugtekin, Sems M. [Abstract] [Full Text]; Tugtekin, Sems M. [Abstract] [Full Text]; Tugtekin, Sems M. [Abstract] [Full Text]
U: Uemura, Kazunori [Full Text]; Urschel, John D. [Full Text]; Urschel, Dorothy M. [Full Text]; Utoh, Junichi [Full Text]
V: Vaccarino, Guillermo [Abstract] [Full Text]; Vale, Peter R. [Abstract] [Full Text]; Vallely, Michael P. [Abstract] [Full Text]; Van Arsdell, Glen S. [Abstract] [Full Text]; van Geldorp, Theo R. [Abstract] [Full Text]; van Swieten, Henry [Abstract] [Full Text]; Vassiliades, Thomas A., Jr [Abstract] [Full Text]; Vazquez-Jimenez, Jaime F. [Abstract] [Full Text]; Venugopal, Panangipalli [Abstract] [Full Text]; Viecca, Maurizio [Abstract] [Full Text]; VillaNueva, Catherine [Abstract] [Full Text]; Vita, Joseph A. [Abstract] [Full Text]; Vitali, Richard M. [Abstract] [Full Text]; Vrancic, Juan Mariano [Abstract] [Full Text]
W: Walther, Claudia [Abstract] [Full Text]; Walther, Thomas [Abstract] [Full Text]; Walther, Thomas [Abstract] [Full Text]; Walther, Thomas [Abstract] [Full Text]; Wang, Tingrong [Abstract] [Full Text]; Wang, Tingrong [Abstract] [Full Text]; Warner, Bradley A. [Abstract] [Full Text]; Watanabe, Takehiro [Abstract] [Full Text]; Weigel, Tracey L. [Abstract] [Full Text]; Weinschelbaum, Ernesto E. [Abstract] [Full Text]; Weintraub, William S. [Abstract] [Full Text]; Weisel, Richard D. [Abstract] [Full Text]; Weman, Saara M. [Abstract] [Full Text]; Westaby, Stephen [Abstract] [Full Text]; White, Jeffrey A. [Abstract] [Full Text]; Whitten, Richard W. [Abstract] [Full Text]; Williams, William G. [Abstract] [Full Text]; Williams, Mathew R. [Abstract] [Full Text]; Wolner, Ernst [Abstract] [Full Text]
Y: Yada, Isao [Abstract] [Full Text]; Yakut, Cevat [Abstract] [Full Text]; Yamaguchi, Takahiro [Abstract] [Full Text]; Yamato, Yasushi [Abstract] [Full Text]; Yan, Jun [Abstract] [Full Text]; Yankah, Abraham C. [Abstract] [Full Text]; Yasuda, Fuyuhiko [Abstract] [Full Text]; Yasui, Hisataka [Abstract] [Full Text]; Yasuta, Osamu [Abstract] [Full Text]; Yau, Terrence M. [Abstract] [Full Text]; Yokoyama, Nobuji [Abstract] [Full Text]; Yoo, Kyung-Jong [Abstract] [Full Text]; Yoshida, Tetsuya [Abstract] [Full Text]; Yu, Cun-tao [Abstract] [Full Text]
Z: Zahn, Evan M. [Abstract] [Full Text]; Zannini, Piero [Abstract] [Full Text]; Zellner, James L. [Abstract] [Full Text]; Zhang, Hong-jia [Abstract] [Full Text]