ATS -- Index by Author (Jul 1999; Volume 68, Number 1)

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Index by Author: Jul 1999; 68 (1) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abd-Elfattah, Anwar S. [Abstract] [Full Text]; Adams, David H. [Abstract] [Full Text]; Aidala, Enrico [Full Text]; Airan, Balram [Abstract] [Full Text]; Alexi-Meskishvili, Vladimir [Abstract] [Full Text]; Alexi-Meskishvili, Vladimir [Abstract] [Full Text]; Alexopoulos, Sophoclis [Abstract] [Full Text]; Alpard, Scott K. [Abstract] [Full Text]; Alpard, Scott K. [Full Text]; Alric, Pierre [Abstract] [Full Text]; Ambrogi, Vincenzo [Abstract] [Full Text]; Amin, Zahid [Abstract] [Full Text]; Angelini, Gianni D. [Abstract] [Full Text]; Annex, Brian H. [Full Text]; Aoki, Mitsuru [Abstract] [Full Text]
B: Babatasi, Gerard [Abstract] [Full Text]; Babatasi, Gerard [Full Text]; Babin-Ebell, Jörg [Abstract] [Full Text]; Backer, Carl L. [Abstract] [Full Text]; Bains, Manjit S. [Abstract] [Full Text]; Baldovinos, Ary [Abstract] [Full Text]; Balzer, David T. [Abstract] [Full Text]; Baskett, Roger J.F. [Abstract] [Full Text]; Beghetti, Maurice [Abstract] [Full Text]; Beranek, Jiri T. [Full Text]; Berger, Felix [Abstract] [Full Text]; Berry, James M. [Abstract] [Full Text]; Berthet, Jean-Philippe [Abstract] [Full Text]; Berul, Charles I. [Abstract] [Full Text]; Bhan, Anil [Abstract] [Full Text]; Bhan, Anil [Full Text]; Bhattacharya, Vishwanath [Abstract] [Full Text]; Bhoyroo, Satar [Abstract] [Full Text]; Bianchi, Paolo [Abstract] [Full Text]; Bidani, Akhil [Abstract] [Full Text]; Blain, Robert [Abstract] [Full Text]; BMed, [Full Text]; Bodnar, Endre [Full Text]; Boldt, Joachim [Abstract] [Full Text]; Borger, Michael A. [Abstract] [Full Text]; Borger, Michael A. [Abstract] [Full Text]; Boyle, Edward M., Jr [Full Text]; Breinholt, John P. [Abstract] [Full Text]; Bruce, Charles J. [Abstract] [Full Text]; Burnett, Omer L. [Abstract] [Full Text]
C: Calabrò, Raffaele [Abstract] [Full Text]; Canter, Charles E. [Abstract] [Full Text]; Cartier, Raymond [Abstract] [Full Text]; Casselman, Filip P. [Abstract] [Full Text]; Chai, Paul J. [Abstract] [Full Text]; Chaiyodsilp, Sant [Abstract] [Full Text]; Chang, Yu-Sheng [Abstract] [Full Text]; Chang, Chau-Hsiung [Abstract] [Full Text]; Chaubert, Pascal [Abstract] [Full Text]; Chen, Raymond H. [Abstract] [Full Text]; Cherian, Kottoourathu M. [Abstract] [Full Text]; Chiariello, Luigi [Abstract] [Full Text]; Cho, Bum Koo [Full Text]; Chopra, Priya [Abstract] [Full Text]; Choudhary, Shiv Kumar [Abstract] [Full Text]; Choudhary, Shiv Kumar [Full Text]; Chu, Jaw-Ji [Abstract] [Full Text]; Clayman, Julie A. [Abstract] [Full Text]; Cohen, Daniel M. [Abstract] [Full Text]; Cohen, Gideon [Abstract] [Full Text]; Conrad, Steven A. [Abstract] [Full Text]; Cosgrove, Delos M., III [Abstract] [Full Text]; Curtis, Jackie J. [Abstract] [Full Text]
D: D’Armini, Andrea M. [Abstract] [Full Text]; Dähnert, Ingo [Abstract] [Full Text]; Damiano, Ralph J., Jr [Abstract] [Full Text]; Daniels, Curt J. [Abstract] [Full Text]; Danielson, Gordon K. [Abstract] [Full Text]; Dato, Guglielmo M. Actis [Full Text]; David, Tirone E. [Full Text]; de Montpreville, Vincent Thomas [Abstract] [Full Text]; De Paulis, Ruggero [Abstract] [Full Text]; Deaton, David W. [Abstract] [Full Text]; Demmy, Todd L. [Abstract] [Full Text]; Dittrich, Sven [Abstract] [Full Text]; Downey, Robert J. [Abstract] [Full Text]; Duffy, C. Elise [Abstract] [Full Text]
E: Elert, Olaf [Abstract] [Full Text]; Endoh, Munemoto [Abstract] [Full Text]; Engelman, Richard M. [Abstract] [Full Text]; Ennen, Michael P. [Abstract] [Full Text]
F: Füssle, Roswita [Abstract] [Full Text]; Faidutti, Bernard [Abstract] [Full Text]; Fastenau, Dana R. [Abstract] [Full Text]; Fedorko, Ludwig [Abstract] [Full Text]; Feeley, Brian T. [Abstract] [Full Text]; Feindel, Christopher M. [Abstract] [Full Text]; Ferguson, Thomas B. [Full Text]; Finck, Sanford J. [Abstract] [Full Text]; Flack, Joseph E., III [Abstract] [Full Text]; Flege, John B., Jr [Abstract] [Full Text]; Flippin, Mindee J. [Abstract] [Full Text]; Frank, Adam [Abstract] [Full Text]; Frazier, O.H. [Full Text]; Fremes, Stephen E. [Abstract] [Full Text]; Fu, Yan [Abstract] [Full Text]; Fujita, Nao [Abstract] [Full Text]; Fukutomi, Takashi [Abstract] [Full Text]
G: Gao, Shi-Ping [Abstract] [Full Text]; Genton, Claude-Yves [Abstract] [Full Text]; Ghelma, Filippo [Abstract] [Full Text]; Gidding, Samuel S. [Abstract] [Full Text]; Gielchinsky, Isaac [Abstract] [Full Text]; Gillinov, A. Marc [Abstract] [Full Text]; Ginsberg, Robert J. [Abstract] [Full Text]; Goldberg, Melvyn [Abstract] [Full Text]; Goto, Yoshikazu [Abstract] [Full Text]; Goto, Fumio [Abstract] [Full Text]; Grande, Antonino M. [Abstract] [Full Text]; Green, Mark R. [Abstract] [Full Text]; Grier, Laurie R. [Abstract] [Full Text]; Griffith, James W. [Abstract] [Full Text]; Gu, Xiaoping [Abstract] [Full Text]; Guibert, Lionel [Abstract] [Full Text]; Guo, Jian-Hau [Abstract] [Full Text]
H: Haas, Nikolaus A. [Abstract] [Full Text]; Halpin, Dermot P. [Abstract] [Full Text]; Hawkins, John A. [Abstract] [Full Text]; Hayashida, Naoki [Abstract] [Full Text]; Hempelmann, Gunter [Abstract] [Full Text]; Hetzer, Roland [Abstract] [Full Text]; Hetzer, Roland [Abstract] [Full Text]; Hill, Ronald C. [Full Text]; Hillman, Neal D. [Abstract] [Full Text]; Hiramatsu, Takeshi [Abstract] [Full Text]; Hirose, Kunihiko [Abstract] [Full Text]; Hong-De Wu, Moses [Abstract] [Full Text]; Hooper, Timothy L. [Abstract] [Full Text]; Hoyt, E. Grant [Abstract] [Full Text]; Huddleston, Charles B. [Abstract] [Full Text]; Hughes, G. Chad [Full Text]
I: Icard, Philippe [Abstract] [Full Text]; Iguchi, Atsusi [Abstract] [Full Text]; Imai, Yasuharu [Abstract] [Full Text]; Imanaka, Kazuhito [Abstract] [Full Text]; Itoh, Tsuyoshi [Abstract] [Full Text]; Izzat, Mohammad Bashar [Abstract] [Full Text]
J: Jaggers, James J. [Abstract] [Full Text]; Jarvis, Jonathan C. [Abstract] [Full Text]; Jayawant, A. Mark [Abstract] [Full Text]; Jessen, Michael E. [Full Text]; Juneja, Rajnish [Abstract] [Full Text]
K: Kadipasaoglu, Kamuran A. [Full Text]; Kadner, Alexander [Abstract] [Full Text]; Kadoi, Yuji [Abstract] [Full Text]; Kalangos, Afksendiyos [Abstract] [Full Text]; Kamohara, Keiji [Abstract] [Full Text]; Kanaoka, Yuji [Abstract] [Full Text]; Karl, Tom R. [Full Text]; Karp, Robert B. [Full Text]; Karstaedt, Nolan [Abstract] [Full Text]; Kasegawa, Hitoshi [Full Text]; Kawahara, Fuminori [Abstract] [Full Text]; Kawakami, Kyousuke [Abstract] [Full Text]; Khayat, Andre [Abstract] [Full Text]; Killorn, Patrick [Abstract] [Full Text]; Kohman, Leslie J. [Abstract] [Full Text]; Kohno, Tadasu [Abstract] [Full Text]; Kondoh, Katsuyuki [Abstract] [Full Text]; Korst, Robert J. [Abstract] [Full Text]; Kothari, Shyam Sunder [Abstract] [Full Text]; Kotoh, Keijyu [Abstract] [Full Text]; Kotsuka, Yutaka [Abstract] [Full Text]; Kramer, Andrea [Abstract] [Full Text]; Krasna, Mark J. [Abstract] [Full Text]; Kunimoto, Fumio [Abstract] [Full Text]; Kuroki, Keiichiro [Abstract] [Full Text]
L: Lamers, Luke J. [Abstract] [Full Text]; Landolfo, Kevin P. [Full Text]; Lange, Peter E. [Abstract] [Full Text]; Lange, Peter E. [Abstract] [Full Text]; Langley, Stephen M. [Abstract] [Full Text]; LaNoue, Kathryn F. [Abstract] [Full Text]; Lazar, Harold L. [Full Text]; Le Page, Olivier [Abstract] [Full Text]; Lee, Tak Wai [Abstract] [Full Text]; Lefurgey, Ann [Abstract] [Full Text]; LeMaire, Scott A. [Full Text]; Levasseur, Philippe [Abstract] [Full Text]; LeVoyer, Thomas E. [Abstract] [Full Text]; Lin, Pyng Jing [Abstract] [Full Text]; Lindsay, Thomas F. [Abstract] [Full Text]; Liu, Ke-Xiang [Abstract] [Full Text]; Lodge, Andrew J. [Abstract] [Full Text]; Lowe, James E. [Full Text]
M: Magdeleinat, Pierre [Abstract] [Full Text]; Mahgoub, Mahmoud A. [Abstract] [Full Text]; Maluf, Miguel A. [Full Text]; Mantovani, Angelo [Abstract] [Full Text]; Martini, Nael [Abstract] [Full Text]; Marty-Ané, Charles-Henri [Abstract] [Full Text]; Mary, Henri [Abstract] [Full Text]; Massetti, Massimo [Full Text]; Massetti, Massimo [Abstract] [Full Text]; Mathur, Alok [Abstract] [Full Text]; Matte, Gregory S. [Abstract] [Full Text]; Mattox, Kenneth L. [Full Text]; Mault, James R. [Abstract] [Full Text]; Mavroudis, Constantine [Abstract] [Full Text]; Mayer, John E., Jr [Full Text]; McDonald, Monica L. [Abstract] [Full Text]; McIntyre, John A. [Abstract] [Full Text]; Mehran, Reza John [Abstract] [Full Text]; Melero, José M. [Abstract] [Full Text]; Mendeloff, Eric N. [Abstract] [Full Text]; Menzoian, James O. [Full Text]; Messmer, Bruno J. [Full Text]; Meyer, Dan M. [Full Text]; Mezzetti, Maurizio [Abstract] [Full Text]; Miller, Sara E. [Abstract] [Full Text]; Mineo, Tommaso Claudio [Abstract] [Full Text]; Minich, LuAnn [Abstract] [Full Text]; Minzioni, Gaetano [Abstract] [Full Text]; Misaki, Takuro [Abstract] [Full Text]; Misoph, Martina R. [Abstract] [Full Text]; Miyaji, Kagami [Abstract] [Full Text]; Mokarapong, Pirapat [Abstract] [Full Text]; Montgomery, Richard C. [Abstract] [Full Text]; Montorsi, Marco [Abstract] [Full Text]; Morita, Toshihiro [Abstract] [Full Text]; Mueller, Xavier M. [Abstract] [Full Text]; Murakami, Takashi [Abstract] [Full Text]; Murali, Renuka [Abstract] [Full Text]; Murphy, Paula R. [Abstract] [Full Text]; Murphy, David A. [Abstract] [Full Text]; Mutabagani, Khaled H. [Abstract] [Full Text]
N: Naficy, Sepehre [Abstract] [Full Text]; Naito, Kozo [Abstract] [Full Text]; Nakajima, Jun [Abstract] [Full Text]; Nakazawa, Makoto [Abstract] [Full Text]; Natsuaki, Masafumi [Abstract] [Full Text]; Naylor, C. David [Abstract] [Full Text]; Naylor, Margaret F. [Abstract] [Full Text]; Nishimura, Rick A. [Abstract] [Full Text]; Nofroni, Italo [Abstract] [Full Text]; Norita, Hiroaki [Abstract] [Full Text]; Nugent, William C. [Abstract] [Full Text]
O: Oda, Katsushi [Abstract] [Full Text]; Ogoshi, Shohei [Abstract] [Full Text]; Ohmi, Mikio [Abstract] [Full Text]; Ohtsuka, Toshiya [Abstract] [Full Text]; Olak, Jemi [Abstract] [Full Text]; Olalla, Eduardo [Abstract] [Full Text]; Orsmond, Garth S. [Abstract] [Full Text]
P: Paavonen, Karri J.A. [Full Text]; Pacileo, Giuseppe [Abstract] [Full Text]; Pairolero, Peter C. [Full Text]; Pandurangi, Ulhas M. [Abstract] [Full Text]; Park, Aric K. [Abstract] [Full Text]; Pasqualetti, Patrizio [Abstract] [Full Text]; Payne, Douglas D. [Abstract] [Full Text]; Pederzolli, Carlo [Abstract] [Full Text]; Pegis, Jean-Dominique [Abstract] [Full Text]; Penta de Peppo, Alfonso [Abstract] [Full Text]; Peters, Kevin G. [Full Text]; Piper, Sven [Abstract] [Full Text]; Pisacane, Carlo [Abstract] [Full Text]; Pistolese, Chiara [Abstract] [Full Text]; Polisca, Patrizio [Abstract] [Full Text]; Porras, Carlos [Abstract] [Full Text]; Poston, Robert S., Jr [Abstract] [Full Text]; Prophet, George A. [Abstract] [Full Text]
R: Régnard, Jean-François [Abstract] [Full Text]; Radke, Peter W. [Full Text]; Rao, Vivek [Abstract] [Full Text]; Rati, Miguel [Full Text]; Reardon, Michael J. [Full Text]; Reed, Carolyn E. [Full Text]; Reed, Carolyn E. [Abstract] [Full Text]; Reents, Wilko [Abstract] [Full Text]; Rinaldi, Mauro [Abstract] [Full Text]; Riquet, Marc [Full Text]; Ritter, Saskia [Abstract] [Full Text]; Robbins, Robert C. [Abstract] [Full Text]; Rocchini, Albert P. [Abstract] [Full Text]; Rodriguez, Isabel [Abstract] [Full Text]; Ross, David B. [Abstract] [Full Text]; Rousou, John A. [Abstract] [Full Text]; Rouvière, Philippe [Abstract] [Full Text]; Ruble, Susan E. [Abstract] [Full Text]; Rusch, Valerie W. [Full Text]; Rusch, Valerie W. [Abstract] [Full Text]; Russo, Maria Giovanna [Abstract] [Full Text]
S: Sadahiro, Mitsuaki [Abstract] [Full Text]; Saito, Shigeru [Abstract] [Full Text]; Salmons, Stanley [Abstract] [Full Text]; Salter, David D. [Abstract] [Full Text]; Sangchote, Surapot [Abstract] [Full Text]; Santambrogio, Roberto [Abstract] [Full Text]; Santoro, Giuseppe [Abstract] [Full Text]; Sasajima, Tadahiro [Abstract] [Full Text]; Sauvage, Lester R. [Abstract] [Full Text]; Saxena, Anita [Abstract] [Full Text]; Schaff, Hartzell V. [Abstract] [Full Text]; Schwarzkopf, Andreas [Abstract] [Full Text]; Seki, Keiji [Abstract] [Full Text]; Sekine, Satoshi [Abstract] [Full Text]; Seo, Kazuhiro [Abstract] [Full Text]; Shaddy, Robert E. [Abstract] [Full Text]; Shah, Maully J. [Abstract] [Full Text]; Sharma, Rajesh [Abstract] [Full Text]; Sharma, Rajesh [Full Text]; Sharratt, Geoffrey P. [Abstract] [Full Text]; Shernan, Stanton K. [Full Text]; Shi, Qun [Abstract] [Full Text]; Sirivella, Srikrishna [Abstract] [Full Text]; Smith, Michael R. [Full Text]; Smith, Craig R. [Abstract] [Full Text]; Snow, Norman [Abstract] [Full Text]; Sommariva, Luigi [Abstract] [Full Text]; Spanier, Talia B. [Abstract] [Full Text]; Stephenson, Edward R., Jr [Abstract] [Full Text]; Stiller, Brigitte [Abstract] [Full Text]; Such, Miguel [Abstract] [Full Text]; Sugarbaker, David J. [Abstract] [Full Text]
T: Tabayashi, Koichi [Abstract] [Full Text]; Taher, Mohiuddin M. [Abstract] [Full Text]; Tajik, A. Jamil [Abstract] [Full Text]; Takamoto, Shinichi [Abstract] [Full Text]; Takanashi, Yoshinori [Abstract] [Full Text]; Tan, Peter P.C. [Abstract] [Full Text]; Tanaka, Shigeo [Abstract] [Full Text]; Tanamai, Supreecha [Abstract] [Full Text]; Tanemoto, Kazuo [Abstract] [Full Text]; Tang, Augustine T.M. [Abstract] [Full Text]; Tang, Nelson L.S. [Abstract] [Full Text]; Tani, Lloyd Y. [Abstract] [Full Text]; Taylor, Ruth L. [Abstract] [Full Text]; Terada, Masatsugu [Abstract] [Full Text]; Tevaearai, Hendrick T. [Abstract] [Full Text]; Theron, Jacques [Full Text]; Titus, Jack L. [Abstract] [Full Text]; Tomai, Fabrizio [Abstract] [Full Text]; Tsui, Steven S. [Abstract] [Full Text]; Turani, Franco [Abstract] [Full Text]; Turina, Marko I. [Full Text]; Turley, Kevin [Full Text]
U: Ueyama, Katsushi [Abstract] [Full Text]; Ungerleider, Ross M. [Abstract] [Full Text]; Uphus, Dirk [Abstract] [Full Text]; Urschel, Harold C., Jr [Full Text]
V: Vala, Dominique [Abstract] [Full Text]; Van Leuven, Marc [Abstract] [Full Text]; Venugopal, Panangipalli [Full Text]; Venugopal, Panangipalli [Abstract] [Full Text]; Verrier, Edward D. [Full Text]; Viganó, Mario [Abstract] [Full Text]; Vogel, Michael [Abstract] [Full Text]; Vogel, Michael [Abstract] [Full Text]; von Segesser, Ludwig K. [Abstract] [Full Text]; Vosa, Carlo [Abstract] [Full Text]
W: Wagenknecht, Dawn R. [Abstract] [Full Text]; Waldhausen, John A. [Full Text]; Waldman, J. Deane [Full Text]; Wall, Matthew J., Jr [Full Text]; Wan, Innes Y.P. [Abstract] [Full Text]; Wan, Song [Abstract] [Full Text]; Wan-Jun, Luo [Full Text]; Warinsirikul, Wiwat [Abstract] [Full Text]; Warner, Kenneth G. [Abstract] [Full Text]; Warren, Andrew E. [Abstract] [Full Text]; Watanabe, Go [Abstract] [Full Text]; Wechsler, Andrew S. [Abstract] [Full Text]; Weisel, Richard D. [Abstract] [Full Text]; Weisel, Richard D. [Abstract] [Full Text]; Weissberg, Dov [Full Text]; Weng, Yugo [Abstract] [Full Text]; Wied, Markus [Abstract] [Full Text]; Wolf, Randall K. [Abstract] [Full Text]
Y: Yamamoto, Fumio [Abstract] [Full Text]; Yamashiro, Toshiyuki [Abstract] [Full Text]; Yamashita, Akio [Abstract] [Full Text]; Yim, Anthony P.C. [Abstract] [Full Text]; Yokoyama, Hitoshi [Abstract] [Full Text]
Z: Zattera, Giuseppe F. [Full Text]; Zupancich, Enrico [Abstract] [Full Text]; Zurbrügg, Heinz Robert [Abstract] [Full Text]; Zwischenberger, Joseph B. [Full Text]; Zwischenberger, Joseph B. [Abstract] [Full Text]