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Index by Author: Volume 65, Issue 4 (April 1998) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abbasoglu, Osman [Abstract] [Full Text]; Abe, Tomio [Full Text]; Actis, Ricardo [Abstract] [Full Text]; Akins, Cary W. [Abstract] [Full Text]; Allen, Bradley S. [Abstract] [Full Text]; Allen, Margaret D. [Abstract] [Full Text]; Allen, Steven J. [Abstract] [Full Text]; Almeida, Dirceu R. [Abstract] [Full Text]; Ancalmo, Nelson [Full Text]; Ancalmo, Nelson [Full Text]; Andou, Akio [Abstract] [Full Text]; Andou, Akio [Abstract] [Full Text]; Aoe, Motoi [Abstract] [Full Text]; Aoe, Motoi [Abstract] [Full Text]; Arrants, Jack E. [Abstract] [Full Text]; Artman, Michael [Abstract] [Full Text]; Ashton, Robert C., Jr [Full Text]; Asplund, Sheryl L. [Abstract] [Full Text]; Ataka, Keiji [Abstract] [Full Text]; Atay, Yüksel [Abstract] [Full Text]; Azami, Takasi [Abstract] [Full Text]; Aziz, Salim [Abstract] [Full Text]
B: Badhwar, Vinay [Abstract] [Full Text]; Bailey, Leonard L. [Abstract] [Full Text]; Baldovinos, Ary [Abstract] [Full Text]; Baldwin, John C. [Abstract] [Full Text]; Banerjee, Anirban [Abstract] [Full Text]; Bao, Yusheng [Abstract] [Full Text]; Barsotti, Pierre [Abstract] [Full Text]; Benedetti, Enrico [Abstract] [Full Text]; Beranek, Jiri T. [Full Text]; Bernard, Sheilah A. [Abstract] [Full Text]; Berti, Ferruccio [Abstract] [Full Text]; Biglioli, Paolo [Abstract] [Full Text]; Bischoff, Irene [Abstract] [Full Text]; Borger, Michael A. [Abstract] [Full Text]; Borst, Cornelius [Abstract] [Full Text]; Brasil, Luiz A. [Abstract] [Full Text]; Buffolo, Enio [Abstract] [Full Text]; Buket, Suat [Abstract] [Full Text]; Busby, John R. [Full Text]; Busby, John R. [Full Text]; Buxton, Brian F. [Abstract] [Full Text]
C: Cain, Brian S. [Abstract] [Full Text]; Camproux, Anne-Claude [Abstract] [Full Text]; Carbognani, Paolo [Full Text]; Carrel, Thierry [Abstract] [Full Text]; Carvalho, Antonio C. [Abstract] [Full Text]; Cephas, Gerald A. [Abstract] [Full Text]; Çetindag, Bülent [Abstract] [Full Text]; Chachques, Juan C. [Full Text]; Chami, Youssef G. [Abstract] [Full Text]; Chan, Anthony T. [Abstract] [Full Text]; Chatzimichalis, Antonis [Abstract] [Full Text]; Cheng, Tsung O. [Full Text]; Chiu, Ray C.-J. [Abstract] [Full Text]; Chiu, Ray C.-J. [Abstract] [Full Text]; Cihan, Hasan B. [Abstract] [Full Text]; Claudon, Bertrand [Abstract] [Full Text]; Cochran, Richard P. [Abstract] [Full Text]; Cohen, Gideon [Abstract] [Full Text]; Colvin, Stephen B. [Abstract] [Full Text]; Colvin, Stephen B. [Abstract] [Full Text]; Cooley, Denton A. [Abstract] [Full Text]; Cosgrove, Delos M., III [Abstract] [Full Text]; Cromartie, Robert Samuel, III [Abstract] [Full Text]; Cupps, Brian P. [Abstract] [Full Text]
D: Daebritz, Sabine [Abstract] [Full Text]; Dainese, Luca [Abstract] [Full Text]; Danilowicz, Delores A. [Abstract] [Full Text]; Date, Hiroshi [Abstract] [Full Text]; Date, Hiroshi [Abstract] [Full Text]; David, Tirone E. [Abstract] [Full Text]; Dávila-Román, Victor G. [Abstract] [Full Text]; Davis, Karen L. [Abstract] [Full Text]; de la Riviere, Aart Brutel [Full Text]; DeCastro, Maria A. [Abstract] [Full Text]; del Rio, Michael J. [Abstract] [Full Text]; Delcourt, Annick [Abstract] [Full Text]; DeLucia, Alphonse [Abstract] [Full Text]; Dixit, Anand S. [Abstract] [Full Text]; Donovan, Carolyn L. [Abstract] [Full Text]; Dorent, Richard [Abstract] [Full Text]; Döring, Volker [Abstract] [Full Text]; Dorman, B. Hugh [Abstract] [Full Text]; Doty, John R. [Abstract] [Full Text]
E: Eckersberger, Franz [Abstract] [Full Text]; Edmisten, Timothy D. [Abstract] [Full Text]; Eizenberg, Norman [Abstract] [Full Text]; El-Khouri, Hanna M. [Abstract] [Full Text]; End, Adelheid [Abstract] [Full Text]; Endou, Shigehito [Abstract] [Full Text]; Esposito, Rick [Abstract] [Full Text]; Evora, Paulo R.B. [Abstract] [Full Text]
F: Fabré, Jan [Abstract] [Full Text]; Fabre, Olivier H. [Abstract] [Full Text]; Faidutti, Bernard [Abstract] [Full Text]; Ferguson, Edward R. [Abstract] [Full Text]; Fishman, Douglas S. [Abstract] [Full Text]; Foster, Gary P. [Abstract] [Full Text]; Francischelli, David [Abstract] [Full Text]; Frazier, O.H. [Abstract] [Full Text]; Funai, Hiroko [Full Text]; Furukawa, Hiroshi [Abstract] [Full Text]; Fuse, Katsuo [Full Text]
G: Gall, Kenneth L. [Abstract] [Full Text]; Galloway, Aubrey C. [Abstract] [Full Text]; Gandjbakhch, Iradj [Abstract] [Full Text]; Gardner, Timothy J. [Full Text]; Geissler, Hans J. [Abstract] [Full Text]; Godart, François R. [Abstract] [Full Text]; Goldin, Marshall D. [Abstract] [Full Text]; Goldstein, Robert M. [Abstract] [Full Text]; Gomes, Walter J. [Abstract] [Full Text]; Gonwa, Thomas A. [Abstract] [Full Text]; Goto, Keiji [Abstract] [Full Text]; Greene, Peter S. [Full Text]; Grossi, Eugene A. [Abstract] [Full Text]; Gründeman, Paul F. [Abstract] [Full Text]; Gundry, Steven R. [Abstract] [Full Text]; Gurbuz, A. Tayfun [Abstract] [Full Text]
H: Hachida, Mitsuhiro [Abstract] [Full Text]; Hamasaki, Takafumi [Abstract] [Full Text]; Hammond, Graeme L. [Abstract] [Full Text]; Hamulu, Ahmet [Abstract] [Full Text]; Hanayama, Naoji [Abstract] [Full Text]; Hanley, Frank L. [Abstract] [Full Text]; Harken, Alden H. [Abstract] [Full Text]; Hayashida, Naoki [Abstract] [Full Text]; Hayat, Javed [Full Text]; Hebbar, Latha [Abstract] [Full Text]; Heijmen, Robin H. [Abstract] [Full Text]; Helou, Joe [Abstract] [Full Text]; Higashiyama, Masahiko [Full Text]; Hiramatsu, Takeshi [Abstract] [Full Text]; Hofer, Bradley O. [Abstract] [Full Text]; Holman, William L. [Abstract] [Full Text]; Holt, John B. [Abstract] [Full Text]; Hoshi, Hironobu [Abstract] [Full Text]; Hoshino, Shuichi [Abstract] [Full Text]; Houck, Ward V. [Abstract] [Full Text]; Huegel, Werner [Abstract] [Full Text]; Hughes, G. Chad [Abstract] [Full Text]; Husberg, Bo S. [Abstract] [Full Text]
I: Imai, Yasuharu [Abstract] [Full Text]; Inselmann, Gerhard [Abstract] [Full Text]; Isselbacher, Eric M. [Abstract] [Full Text]; Ivanov, Joan [Abstract] [Full Text]; Iwata, Yusuke [Abstract] [Full Text]
J: Jacka, Michael J. [Abstract] [Full Text]; Jenni, Rolf [Abstract] [Full Text]; Jeyarajah, D. Rohan [Abstract] [Full Text]; Johnson, William H., III [Abstract] [Full Text]; Juvonen, Tatu [Full Text]
K: Kadipasaoglu, Kamuran A. [Abstract] [Full Text]; Kalangos, Afksendiyos [Abstract] [Full Text]; Kallenbach, Klaus [Abstract] [Full Text]; Kandioler, Daniela [Abstract] [Full Text]; Karl, Tom [Full Text]; Kawahito, Koji [Full Text]; Kay, Philip H. [Full Text]; Kessler, Romain [Abstract] [Full Text]; Keutel, Juergen [Abstract] [Full Text]; Kim, Richard W. [Abstract] [Full Text]; Kimura, Michio [Abstract] [Full Text]; Kishima, Hiroki [Abstract] [Full Text]; Kitamura, Soichiro [Full Text]; Klintmalm, Goran B. [Abstract] [Full Text]; Knaepen, Paul J. [Full Text]; Knight, Wade L. [Full Text]; Kodama, Ken [Full Text]; Konstantinov, Igor E. [Abstract] [Full Text]; Kormos, Robert L. [Abstract] [Full Text]; Kouchoukos, Nicholas T. [Abstract] [Full Text]; Koyanagi, Hitoshi [Abstract] [Full Text]; Kozarek, Richard A. [Abstract] [Full Text]; Krause, Tyrone J. [Full Text]; Krömer, Elisabeth [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Kunzelman, Karyn S. [Abstract] [Full Text]; Künzli, Andreas [Abstract] [Full Text]
L: Landolfo, Kevin P. [Abstract] [Full Text]; Layden, Thomas J. [Abstract] [Full Text]; Lazar, Harold L. [Abstract] [Full Text]; Lee, Andrew [Abstract] [Full Text]; Lee, Evelyn M. [Abstract] [Full Text]; Leger, Philippe [Abstract] [Full Text]; Leijala, Mauri [Abstract] [Full Text]; Lemole, Gerald M. [Full Text]; Levy, Marlon F. [Abstract] [Full Text]; Li, Debiao [Abstract] [Full Text]; Liddicoat, John R. [Abstract] [Full Text]; Low, Donald E. [Abstract] [Full Text]; Lowe, James E. [Abstract] [Full Text]; Lu, Hua [Abstract] [Full Text]; Luison, Fabio [Abstract] [Full Text]
M: MacPhaden, Alan [Abstract] [Full Text]; March, Robert J. [Abstract] [Full Text]; Marcsek, Peter [Abstract] [Full Text]; Marshall, Robert D. [Abstract] [Full Text]; Martin, William [Abstract] [Full Text]; Massad, Malek G. [Abstract] [Full Text]; Massard, Gilbert [Abstract] [Full Text]; Matsubayashi, Keiji [Abstract] [Full Text]; Matsuda, Hikaru [Abstract] [Full Text]; Matsumura, Akihide [Abstract] [Full Text]; Mattila, Ilkka [Abstract] [Full Text]; McCarthy, James F. [Abstract] [Full Text]; McElhinney, Doff B. [Abstract] [Full Text]; McQuiston, Ann-Marie [Abstract] [Full Text]; Mehlhorn, Uwe [Abstract] [Full Text]; Meldrum, Daniel R. [Abstract] [Full Text]; Meng, Xianzhong [Abstract] [Full Text]; Messmer, Bruno J. [Abstract] [Full Text]; Miki, Shigehito [Abstract] [Full Text]; Miller, Jeffrey S. [Abstract] [Full Text]; Minami, Masato [Abstract] [Full Text]; Mirhoseini, Mahmood [Abstract] [Full Text]; Misawa, Yoshio [Abstract] [Full Text]; Misawa, Yoshio [Full Text]; Miyoshi, Shinichiro [Abstract] [Full Text]; Morishita, Kiyofumi [Full Text]; Morrison, John [Abstract] [Full Text]; Motomura, Tadashi [Abstract] [Full Text]; Mott, Brian D. [Abstract] [Full Text]; Moulton, Michael J. [Abstract] [Full Text]; Moustakidis, Pavlos [Abstract] [Full Text]; Muehler, Eberhard G. [Abstract] [Full Text]; Mukaida, Takahiro [Abstract] [Full Text]; Müller, Michael Rolf [Abstract] [Full Text]; Murith, Nicolas [Abstract] [Full Text]; Murrah, C. Patrick [Abstract] [Full Text]; Mutschler, Ernst [Abstract] [Full Text]
N: Nagashima, Hiroaki [Abstract] [Full Text]; Nair, R. Unnikrishnan [Abstract] [Full Text]; Nakagiri, Keitarou [Abstract] [Full Text]; Nakahara, Kazuya [Abstract] [Full Text]; Nakamura, Katsuhiko [Abstract] [Full Text]; Nakamura, Masanao [Abstract] [Full Text]; Nakano, Toshihide [Abstract] [Full Text]; Naunheim, Keith S. [Abstract] [Full Text]; Nellessen, Ullrich [Abstract] [Full Text]; Nishigaki, Kyoichi [Abstract] [Full Text]; Nomoto, Takuya [Abstract] [Full Text]; Novick, William M. [Abstract] [Full Text]
O: O’Brien, Mark F. [Abstract] [Full Text]; Obata, Kazuya [Abstract] [Full Text]; Ogino, Hitoshi [Abstract] [Full Text]; Oh, Joong Hwan [Abstract] [Full Text]; Ohkado, Akihiko [Abstract] [Full Text]; Ojard-Chillet, Jean [Abstract] [Full Text]; Okada, Masayoshi [Abstract] [Full Text]; Omori, Ken-ichi [Abstract] [Full Text]; Oswal, Dilip [Full Text]; Ouchi, Takayuki [Abstract] [Full Text]; Oz, Mehmet C. [Full Text]
P: Palma, J. Honório [Abstract] [Full Text]; Parry, Andrew J. [Abstract] [Full Text]; Pasque, Michael K. [Abstract] [Full Text]; Pathi, Vivek L. [Abstract] [Full Text]; Pavie, Alain [Abstract] [Full Text]; Pearson, Paul J. [Abstract] [Full Text]; Pelletier, Marc P. [Abstract] [Full Text]; Pennington, D. Glenn [Full Text]; Pezzella, A. Thomas [Full Text]; Pfammatter, Jean-Pierre [Abstract] [Full Text]; Pfister, Albert J. [Full Text]; Picard, Michael H. [Abstract] [Full Text]; Pierce, Connie A. [Abstract] [Full Text]; Pollak, Raymond [Abstract] [Full Text]; Polvani, Gian Luca [Abstract] [Full Text]; Pompilio, Giulio [Abstract] [Full Text]; Porqueddu, Massimo [Abstract] [Full Text]; Porte, Henri L. [Abstract] [Full Text]; Posacioglu, Hakan [Abstract] [Full Text]; Prabhakar, Ganga [Abstract] [Full Text]
R: Radovancevic, Branislav [Abstract] [Full Text]; Rainio, Pekka [Full Text]; Raman, Jai S. [Abstract] [Full Text]; Rand, Richard P. [Abstract] [Full Text]; Rao, Vivek [Abstract] [Full Text]; Ratliff, Norman B. [Abstract] [Full Text]; Rayhrer, Constanze S. [Abstract] [Full Text]; Razzouk, Anees J. [Abstract] [Full Text]; Reardon, Michael J. [Abstract] [Full Text]; Reardon, Patrick R. [Abstract] [Full Text]; Reddy, V. Mohan [Abstract] [Full Text]; Reed, Carolyn E. [Full Text]; Replogle, Robert L. [Full Text]; Resano, Fernando G. [Full Text]; Rey, Christian [Abstract] [Full Text]; Richenbacher, Wayne E. [Abstract] [Full Text]; Rimpiläinen, Jussi [Full Text]; Ristich, Julianne [Abstract] [Full Text]; Rivers, Samuel [Abstract] [Full Text]; Rivetti, Luiz Antonio [Full Text]; Rose, Geoffrey A. [Abstract] [Full Text]; Rossoni, Giuseppe [Abstract] [Full Text]; Rusca, Michele [Full Text]
S: Sakakibara, Yuzuru [Full Text]; Sala, Andrea [Abstract] [Full Text]; Sardari, Frederic F. [Abstract] [Full Text]; Saribülbül, Osman [Abstract] [Full Text]; Sasajima, Tadahiro [Abstract] [Full Text]; Satta, Jari [Full Text]; Sauvage, Lester R. [Abstract] [Full Text]; Schaff, Hartzell V. [Abstract] [Full Text]; Schneider, Jakob [Abstract] [Full Text]; Schnetzler, Bruno [Abstract] [Full Text]; Schwartz, Daniel S. [Abstract] [Full Text]; Scully, Hugh E. [Abstract] [Full Text]; Seccombe, John F. [Abstract] [Full Text]; Selinger, Laszlo [Abstract] [Full Text]; Seo, Kazuhiro [Abstract] [Full Text]; Shames, Brian D. [Abstract] [Full Text]; Shapiro, Leonard M. [Abstract] [Full Text]; Sharp, W. John [Abstract] [Full Text]; Sharpe, David A.C. [Abstract] [Full Text]; Shattuck, O. Howard [Abstract] [Full Text]; Shemin, Richard J. [Abstract] [Full Text]; Shi, Qun [Abstract] [Full Text]; Shibano, Ryuichi [Abstract] [Full Text]; Shiiku, Chikara [Full Text]; Shimazaki, Yasuhisa [Abstract] [Full Text]; Shimizu, Nobuyoshi [Abstract] [Full Text]; Shimizu, Nobuyoshi [Abstract] [Full Text]; Shiraishi, Kiminori [Abstract] [Full Text]; Silber, Rolf [Abstract] [Full Text]; Slovis, Arnold J. [Abstract] [Full Text]; Smith, Craig R. [Full Text]; Smith, Susan E. [Abstract] [Full Text]; Solli, Piergiorgio [Full Text]; Solymoss, Susan [Abstract] [Full Text]; Sotoda, Yoko [Abstract] [Full Text]; Souda, Ryo [Abstract] [Full Text]; Spaggiari, Lorenzo [Full Text]; Spahn, Donat R. [Abstract] [Full Text]; Spinale, Francis G. [Abstract] [Full Text]; Spruell, Russell D. [Abstract] [Full Text]; Stanger, Paul [Abstract] [Full Text]; Stuart, R. Scott [Abstract] [Full Text]; Sukehiro, Shungo [Abstract] [Full Text]; Szabo, Barna A. [Abstract] [Full Text]
T: Takami, Koji [Full Text]; Takanashi, Yoshinori [Abstract] [Full Text]; Takeda, Shin-ichi [Abstract] [Full Text]; Tashiro, Tadashi [Abstract] [Full Text]; Taylor, Paul C. [Abstract] [Full Text]; Tellides, George [Abstract] [Full Text]; Terada, Masatsugu [Abstract] [Full Text]; Testa, Giuliano [Abstract] [Full Text]; Togami, Izumi [Abstract] [Full Text]; Tomimatsu, Hirofumi [Abstract] [Full Text]; Tominaga, Ryuji [Abstract] [Full Text]; Torchiana, David F. [Abstract] [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]; Tüchler, Heinz [Abstract] [Full Text]; Turina, Marko I. [Abstract] [Full Text]
U: Ueda, Yuichi [Abstract] [Full Text]; Ugurlu, Baran S. [Abstract] [Full Text]; Ungacta, Felix F. [Abstract] [Full Text]; Utsumi, Tomoki [Abstract] [Full Text]
V: van Dalen, Rob [Abstract] [Full Text]; van Swieten, Henry A. [Full Text]; Vander Salm, Thomas J. [Full Text]; Vazquez-Jimenez, Jaime F. [Abstract] [Full Text]; Veeragandham, Ramesh S. [Abstract] [Full Text]; Verlaan, Cees W.J. [Abstract] [Full Text]; Verrier, Edward D. [Abstract] [Full Text]; Vincent, Josef G. [Full Text]; Vogt, Paul R. [Abstract] [Full Text]; von Segesser, Ludwig K. [Abstract] [Full Text]
W: Wagner, William R. [Abstract] [Full Text]; Wakiyama, Hidetaka [Abstract] [Full Text]; Wallsh, Eugene [Full Text]; Warters, R. David [Abstract] [Full Text]; Watson, Donald C. [Abstract] [Full Text]; Weisel, Richard D. [Abstract] [Full Text]; Weissberg, Dov [Full Text]; Wells, Francis C. [Abstract] [Full Text]; Werner, Klaus [Abstract] [Full Text]; Wheatley, David J. [Abstract] [Full Text]; Widmann, Mark D. [Abstract] [Full Text]; Wihlm, Jean-Marie [Abstract] [Full Text]; Wiley, Thelma [Abstract] [Full Text]; Wilhelm, Carl R. [Abstract] [Full Text]; Willmette, Christene A. [Abstract] [Full Text]; Wolner, Ernst [Abstract] [Full Text]; Wozniak, Thomas C. [Abstract] [Full Text]; Wu, Moses Hong-De [Abstract] [Full Text]; Wuamett, James D. [Abstract] [Full Text]; Wurtz, Alain J. [Abstract] [Full Text]
Y: Yamagiwa, Iwao [Abstract] [Full Text]; Yamashita, Chojiro [Abstract] [Full Text]; Yamashita, Motohiro [Abstract] [Full Text]; Yasui, Hisataka [Abstract] [Full Text]; Yokouchi, Hideoki [Full Text]; Yoshimura, Tosiki [Abstract] [Full Text]; Young, Jeffrey S. [Abstract] [Full Text]
Z: Zellner, James L. [Abstract] [Full Text]