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Index by Author: Volume 64, Issue 6 (December 1997) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abe, Tomio [Abstract] [Full Text]; Abels, Robert I. [Abstract] [Full Text]; Alamanni, Francesco [Abstract] [Full Text]; Albert, Wolfgang [Abstract] [Full Text]; Aldea, Gabriel S. [Abstract] [Full Text]; Alpard, Scott K. [Abstract] [Full Text]; Alvarez, John M. [Full Text]; Alving, Barbara M. [Abstract] [Full Text]; Anand, Sanjay K. [Abstract] [Full Text]; Andersen, Kai [Abstract] [Full Text]; Anderson, Michael T. [Abstract] [Full Text]; Antona, Carlo [Abstract] [Full Text]; Argenziano, Michael [Abstract] [Full Text]; Arman, Bulent [Abstract] [Full Text]; Arom, Kit V. [Full Text]; Ashraf, Saeed [Abstract] [Full Text]; Asoh, Hiroshi [Abstract] [Full Text]; Awad, John A. [Full Text]
B: Backer, Carl L. [Full Text]; Banks, David [Abstract] [Full Text]; Barstad, R. Marius [Abstract] [Full Text]; Bartram, Ulrike [Abstract] [Full Text]; Baumgartner, Fritz J. [Full Text]; Baumgartner, William A. [Abstract] [Full Text]; Bavaria, Joseph E. [Abstract] [Full Text]; Bel, Alain [Abstract] [Full Text]; Béland, Marie J. [Abstract] [Full Text]; Berland, Jacques [Abstract] [Full Text]; Bessou, Jean Paul [Abstract] [Full Text]; Biblo, Lee A. [Abstract] [Full Text]; Bidani, Akhil [Abstract] [Full Text]; Biglioli, Paolo [Abstract] [Full Text]; Binns, Oliver A. R. [Abstract] [Full Text]; Black, Michael D. [Abstract] [Full Text]; Blin, Dominique [Abstract] [Full Text]; Blue, Mary E. [Abstract] [Full Text]; Bocage, Jean-Philippe [Full Text]; Bolling, Steven F. [Abstract] [Full Text]; Bolling, Steven F. [Abstract] [Full Text]; Borrel, Elisabeth [Abstract] [Full Text]; Borst, Hans Georg [Abstract] [Full Text]; Bouchart, François [Abstract] [Full Text]; Brock, Malcolm V. [Abstract] [Full Text]; Brockman, Stanley K. [Abstract] [Full Text]; Brunsting, Louis A., III [Abstract] [Full Text]; Brunston, Robert L., Jr [Abstract] [Full Text]; Burdon, Thomas A. [Abstract] [Full Text]; Burgos, Raul [Abstract] [Full Text]; Bussolati, Ovidio [Abstract] [Full Text]; Buxton, Brian [Full Text]
C: Caccavale, Robert J. [Full Text]; Calafiore, Antonio M. [Full Text]; Campbell, David N. [Abstract] [Full Text]; Cardenas, Victor J., Jr [Abstract] [Full Text]; Carlson, Mark D. [Abstract] [Full Text]; Castedo, Evaristo [Full Text]; Castedo, Evaristo [Abstract] [Full Text]; Catanese, Katharine A. [Abstract] [Full Text]; Cecere, Renzo [Abstract] [Full Text]; Celik, Muharrem [Abstract] [Full Text]; Chavanon, Olivier [Abstract] [Full Text]; Chitwood, W. Randolph, Jr [Abstract] [Full Text]; Cialfi, Alessandro [Abstract] [Full Text]; Clarke, David R. [Abstract] [Full Text]; Combs, D. Thomas [Abstract] [Full Text]; Cooley, Denton A. [Full Text]; Cooley, Denton A. [Full Text]; Cope, Jeffrey T. [Abstract] [Full Text]; Cornel, Garry [Abstract] [Full Text]; Corno, Antonio F. [Full Text]; Costantini, Otto [Abstract] [Full Text]; Cowan, Dahlia [Abstract] [Full Text]; Cracowski, Jean-Luc [Abstract] [Full Text]; Cristóbal, Carmen [Abstract] [Full Text]
D: D'Ambra, Michael N. [Abstract] [Full Text]; Dall'Asta, Valeria [Abstract] [Full Text]; Danby, Christopher A. [Abstract] [Full Text]; Danna, Paolo [Abstract] [Full Text]; Darrah, William C. [Abstract] [Full Text]; Dauber, James H. [Abstract] [Full Text]; De Canniere, Didier [Abstract] [Full Text]; De Giacomo, Tiziano [Abstract] [Full Text]; Deeb, G. Michael [Abstract] [Full Text]; DeRose, Joseph J., Jr [Abstract] [Full Text]; Deslauriers, Jean [Full Text]; Despotis, George J. [Full Text]; Devillier, Philippe [Abstract] [Full Text]; Di Mattia, Daniel G. [Abstract] [Full Text]; DiSesa, Verdi J. [Abstract] [Full Text]; Dubar, Arnaud [Abstract] [Full Text]; Duncan, J. Michael [Full Text]; Durand, Michel [Abstract] [Full Text]; Duriez, Micheline [Abstract] [Full Text]
E: Elbeery, Joseph R. [Abstract] [Full Text]; Entress, Anthony [Abstract] [Full Text]
F: Faris, Bouchaib [Abstract] [Full Text]; Fazi, Paola [Abstract] [Full Text]; Ferraris, Victor A. [Abstract] [Full Text]; Ferraris, Zoë Alaina [Abstract] [Full Text]; Feuerstein, Burt G. [Abstract] [Full Text]; Flaishman, Isac [Abstract] [Full Text]; Flameng, Willem J. [Abstract] [Full Text]; Fosse, Erik [Abstract] [Full Text]; Frazier, O. H. [Full Text]; Freedom, Robert M. [Abstract] [Full Text]; Friesen, Robert H. [Abstract] [Full Text]; Fukada, Johji [Abstract] [Full Text]; Fukuyama, Yasuro [Abstract] [Full Text]
G: Gallagher, Marsha A. [Abstract] [Full Text]; Gazzola, Gian C. [Abstract] [Full Text]; Geha, Alexander S. [Abstract] [Full Text]; Geiran, Odd R. [Abstract] [Full Text]; Geller, Charles M. [Abstract] [Full Text]; Gokaslan, Ziya L. [Abstract] [Full Text]; Goodnough, Lawrence T. [Full Text]; Gray, Richard J. [Abstract] [Full Text]; Griffith, Bartley P. [Abstract] [Full Text]; Grünenfelder, Jürg [Abstract] [Full Text]; Guarino, Enrico [Abstract] [Full Text]; Guibert, Lionel [Abstract] [Full Text]; Guilfoyle, Mary [Abstract] [Full Text]; Guiraudon, Gerard M. [Abstract] [Full Text]
H: Haas-Hubscher, Catherine [Abstract] [Full Text]; Haciibrahimoglu, Gokhan [Abstract] [Full Text]; Håkanson, Erik [Abstract] [Full Text]; Halezeroglu, Semih [Abstract] [Full Text]; Hammel, Dieter [Abstract] [Full Text]; Handy, John R., Jr [Abstract] [Full Text]; Hanley, Frank L. [Abstract] [Full Text]; Hanley, Frank L. [Abstract] [Full Text]; Hanlon, J. Timothy [Abstract] [Full Text]; Hasegawa, Junichi [Abstract] [Full Text]; Haverich, Axel [Abstract] [Full Text]; Herrmann, Mathias [Abstract] [Full Text]; Hetzer, Roland [Abstract] [Full Text]; Hillman, Robert [Abstract] [Full Text]; Horii, Taiko [Full Text]; Hummel, Manfred [Abstract] [Full Text]; Hurt, Raymond [Full Text]
I: Iannettoni, Mark D. [Abstract] [Full Text]; Ichinose, Yukito [Abstract] [Full Text]; Iemura, Junzo [Abstract] [Full Text]; Izzat, M. Bashar [Full Text]
J: Jackson, Mark R. [Abstract] [Full Text]; Jacobs, Alice K. [Abstract] [Full Text]; Jansens, Jean-Luc [Abstract] [Full Text]; Johnson, Raleigh F. [Abstract] [Full Text]; Johnson, Scott B. [Full Text]; Johnston, Michael V. [Abstract] [Full Text]; Jones, James W. [Abstract] [Full Text]; Judson, Marc A. [Abstract] [Full Text]
K: Kameda, Yoichi [Abstract] [Full Text]; Kanazawa, Toshiyuki [Abstract] [Full Text]; Kaplan, David [Abstract] [Full Text]; Karavite, Dean [Abstract] [Full Text]; Katsuda, Yasaburo [Abstract] [Full Text]; Katsuyama, Kazuhiko [Full Text]; Kaufman, Marla S. [Abstract] [Full Text]; Kawada, Noriyasu [Abstract] [Full Text]; Kawata, Tetsuji [Abstract] [Full Text]; Keenan, Robert J. [Abstract] [Full Text]; Keles, Murat [Abstract] [Full Text]; Kerber, Sebastian [Abstract] [Full Text]; Kern, John A. [Abstract] [Full Text]; Kidwell, Francis E. [Abstract] [Full Text]; Kim, Hugh C. [Abstract] [Full Text]; King, R. Christopher [Abstract] [Full Text]; Kitamura, Soichiro [Abstract] [Full Text]; Kitayama, Hitoshi [Abstract] [Full Text]; Komatsu, Kanshi [Abstract] [Full Text]; Konstantakos, Anastasios K. [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Kwon, Christopher C. [Abstract] [Full Text]
L: Lamberti, John J. [Abstract] [Full Text]; Lancaster, Diane [Abstract] [Full Text]; Lange, Mary S. [Abstract] [Full Text]; Laubach, Victor E. [Abstract] [Full Text]; Lazar, Harold L. [Abstract] [Full Text]; Lazzara, Robert R. [Abstract] [Full Text]; Le Clerc, Jean-Louis [Abstract] [Full Text]; Lee, Jai H. [Abstract] [Full Text]; Lemma, Massimo [Abstract] [Full Text]; Lessana, Arrigo [Full Text]; Levasseur, Philippe [Abstract] [Full Text]; Levin, Howard R. [Abstract] [Full Text]; Lewis, Ralph J. [Full Text]; Littenberg, Benjamin [Full Text]; Loebe, Matthias [Abstract] [Full Text]; Loick, Heinz Michael [Abstract] [Full Text]; Lowenstein, Charles J. [Abstract] [Full Text]; Lynch, Karen E. [Abstract] [Full Text]
M: Mackall, Judith A. [Abstract] [Full Text]; Mackenzie, James W. [Full Text]; Macris, Michael P. [Full Text]; Maes, Alex [Abstract] [Full Text]; Magdeleinat, Pierre [Abstract] [Full Text]; Mainwaring, Richard D. [Abstract] [Full Text]; Mallion, Jean-Michel [Abstract] [Full Text]; Marsh, William L., Jr [Abstract] [Full Text]; Martin, Paul G. [Abstract] [Full Text]; Marx, Gerald R. [Abstract] [Full Text]; Matsumoto, Terufumi [Abstract] [Full Text]; McCabe, John C. [Abstract] [Full Text]; McCutcheon, Ian E. [Abstract] [Full Text]; McElhinney, Doff B. [Abstract] [Full Text]; McElhinney, Doff B. [Abstract] [Full Text]; McLellan, Bruce A. [Abstract] [Full Text]; Mello, Dennis M. [Abstract] [Full Text]; Menasché, Philippe [Abstract] [Full Text]; Menasché, Philippe [Full Text]; Mezzadri, Paola [Abstract] [Full Text]; Milbrandt, Todd A. [Abstract] [Full Text]; Mineo, Michael T. [Abstract] [Full Text]; Mizuguchi, Kazumi [Abstract] [Full Text]; Monaghan, Hilary [Abstract] [Full Text]; Monro, James L. [Full Text]; Montero, Carlos Garcia [Full Text]; Mori, Atsumi [Full Text]; Morishita, Kiyohumi [Abstract] [Full Text]; Morris, Rohinton J. [Abstract] [Full Text]; Morrison, Robert J. [Abstract] [Full Text]; Mortelmans, Luc [Abstract] [Full Text]; Moskowitz, Alan J. [Abstract] [Full Text]; Mouas, Christian [Abstract] [Full Text]; Mouton-Schleifer, Dominique [Abstract] [Full Text]; Munnell, Edward R. [Full Text]; Murray, Kevin D. [Abstract] [Full Text]; Murrell, Helen K. [Abstract] [Full Text]; Myerowitz, P. David [Abstract] [Full Text]
N: Nakajima, Yasuhiko [Full Text]; Nakamura, Yuzuru [Abstract] [Full Text]; Neal, Andy [Abstract] [Full Text]; Nesbitt, Jonathan C. [Abstract] [Full Text]; Nishioka, Hiroaki [Abstract] [Full Text]; Niwaya, Kazuo [Abstract] [Full Text]; Nuyts, Johan [Abstract] [Full Text]
O: Oku, Hidetaka [Abstract] [Full Text]; Omari, Bassam O. [Full Text]; Orringer, Mark B. [Abstract] [Full Text]; Otaki, Mashaki [Abstract] [Full Text]; Oteo, Juan Francisco [Abstract] [Full Text]; Oz, Mehmet C. [Abstract] [Full Text]; Oz, Mehmet C. [Abstract] [Full Text]
P: Pae, Walter E., Jr [Full Text]; Parolari, Alessandro [Abstract] [Full Text]; Parry, Andrew J. [Abstract] [Full Text]; Parvin, Curtis A. [Full Text]; Pasic, Miralem [Abstract] [Full Text]; Pasque, Michael K. [Abstract] [Full Text]; Perrault, Louis P. [Full Text]; Pescarmona, Edoardo O. [Abstract] [Full Text]; Peters, William S. [Abstract] [Full Text]; Peuhkurinen, Keijo J. [Full Text]; Peynet, Jacqueline [Abstract] [Full Text]; Pigula, Frank A. [Abstract] [Full Text]; Pochettino, Alberto [Abstract] [Full Text]; Putnam, Joe B., Jr [Abstract] [Full Text]
Q: Quan, Kara J. [Abstract] [Full Text]; Quint, Leslie E. [Abstract] [Full Text]
R: Rawitscher, Robert [Abstract] [Full Text]; Reddy, V. Mohan [Abstract] [Full Text]; Redonnet, Michel [Abstract] [Full Text]; Regnard, Jean-François [Abstract] [Full Text]; Rendina, Erino A. [Abstract] [Full Text]; Rescigno, Giuseppe [Full Text]; Ricci, Costante [Abstract] [Full Text]; Richardson, R. Mark [Abstract] [Full Text]; Robertson, John M. [Full Text]; Roda, Jorge [Full Text]; Rodriguez, Rosendo A. [Abstract] [Full Text]; Rolf, Sheri [Abstract] [Full Text]; Rose, Eric A. [Abstract] [Full Text]; Rosenfeldt, Franklin L. [Abstract] [Full Text]; Roth, Jack A. [Abstract] [Full Text]
S: Sala, Roberto [Abstract] [Full Text]; Salati, Maurizio [Abstract] [Full Text]; Salvaggio, Antonino [Abstract] [Full Text]; Samuels, Fania L. [Abstract] [Full Text]; Samuels, Louis E. [Abstract] [Full Text]; Santamore, William P. [Full Text]; Santoli, Carmine [Abstract] [Full Text]; Scheld, Hans H. [Abstract] [Full Text]; Schmid, Christof [Abstract] [Full Text]; Schnaper, Harold [Abstract] [Full Text]; Schrump, David S. [Abstract] [Full Text]; Schwaiger, Markus [Full Text]; Semelhago, Lloyd [Abstract] [Full Text]; Senol, Canan [Abstract] [Full Text]; Serrano-Fiz, Santiago [Full Text]; Shapira, Oz M. [Abstract] [Full Text]; Sharpe, Michael D. [Abstract] [Full Text]; Shea, Michael [Abstract] [Full Text]; Shemin, Richard J. [Abstract] [Full Text]; Shiraishi, Shoichirou [Full Text]; Shivalkar, Bharati [Abstract] [Full Text]; Shockey, Kimberly S. [Abstract] [Full Text]; Siegel, Lawrence C. [Abstract] [Full Text]; Sievers, Jennifer [Abstract] [Full Text]; Silverman, Norman H. [Abstract] [Full Text]; Sisler, Glenn E. [Full Text]; Smith, Julian A. [Abstract] [Full Text]; Soyer, Robert [Abstract] [Full Text]; Spaggiari, Lorenzo [Abstract] [Full Text]; Spence, Paul A. [Full Text]; Spiessens, Bart [Abstract] [Full Text]; Splinter, William M. [Abstract] [Full Text]; Stevens, John H. [Abstract] [Full Text]; Storm, Waldemar [Full Text]; Subramanian, Valavanur A. [Abstract] [Full Text]; Suma, Hisayoshi [Full Text]; Sun, Benjamin C. [Abstract] [Full Text]; Svedjeholm, Rolf [Abstract] [Full Text]; Svennevig, Jan L. [Abstract] [Full Text]; Swisher, Stephen G. [Abstract] [Full Text]; Szymanski, Irma [Abstract] [Full Text]
T: Tahta, Stephen A. [Abstract] [Full Text]; Taniguchi, Shigeki [Abstract] [Full Text]; Tao, Weike [Abstract] [Full Text]; Tchervenkov, Christo I. [Abstract] [Full Text]; Tebar, Eduardo [Abstract] [Full Text]; Tian, Yi [Abstract] [Full Text]; Tominaga, Ryuji [Abstract] [Full Text]; Tomita, Yukihiro [Abstract] [Full Text]; Tønnessen, Tor-Inge [Abstract] [Full Text]; Tornabene, Michael A. [Abstract] [Full Text]; Traber, Daniel L. [Abstract] [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]; Troncoso, Juan C. [Abstract] [Full Text]; Tseng, Elaine E. [Abstract] [Full Text]
U: Ugarte, Juan [Abstract] [Full Text]; Ugarte, Juan [Full Text]; Ugarte, Manuel [Abstract] [Full Text]; Umana, Juan P. [Abstract] [Full Text]; Unger, Philippe [Abstract] [Full Text]; Uva, Miguel Sousa [Full Text]; Uysal, Aziz [Abstract] [Full Text]
V: Van Buren, Charles T. [Full Text]; Van Camp, Joseph R. [Abstract] [Full Text]; Van Praagh, Richard [Abstract] [Full Text]; Van Schil, Paul E. [Full Text]; VanHaecke, Johan [Abstract] [Full Text]; vanSonnenberg, Eric [Abstract] [Full Text]; Vatne, Karleif [Abstract] [Full Text]; Vegna, Maria Luce [Abstract] [Full Text]; Venuta, Federico [Abstract] [Full Text]; Vlahakes, Gus J. [Abstract] [Full Text]; Vlessis, Angelo A. [Abstract] [Full Text]
W: Walsh, Garrett L. [Abstract] [Full Text]; Warnecke, Henning [Abstract] [Full Text]; Wassef, Michel [Abstract] [Full Text]; Watarida, Shoji [Full Text]; Waterford, Robert R. [Abstract] [Full Text]; Watterson, Kevin G. [Abstract] [Full Text]; Weerasena, Nihal A. [Abstract] [Full Text]; Weinberg, Alan D. [Abstract] [Full Text]; Whyte, Richard I. [Abstract] [Full Text]; Wilhelm, Markus J. [Abstract] [Full Text]; Williams, David M. [Abstract] [Full Text]; Williams, Deborah L. [Abstract] [Full Text]; Wittich, Gerhard R. [Abstract] [Full Text]
Y: Yamagishi, Masaaki [Abstract] [Full Text]; Yano, Tokujiro [Abstract] [Full Text]; Yasko, Alan W. [Abstract] [Full Text]; Yasui, Hisataka [Abstract] [Full Text]; Yim, Anthony P. C. [Full Text]; Ying, Alan J. [Abstract] [Full Text]; Ylitalo, Kari V. [Full Text]; Yokoyama, Hideki [Abstract] [Full Text]; Young, Eddy K. [Abstract] [Full Text]; Yousem, Samuel A. [Abstract] [Full Text]; Yusen, Roger D. [Full Text]
Z: Zellner, James L. [Abstract] [Full Text]; Zenati, Marco A. [Abstract] [Full Text]; Zimmerman, Jerry J. [Full Text]; Zinzindohoue, Franck [Abstract] [Full Text]; Zwischenberger, Joseph B. [Abstract] [Full Text]; Zwischenberger, Joseph B. [Abstract] [Full Text]