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Index by Author: Volume 64, Issue 1 (July 1997) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abolhoda, Amir [Abstract] [Full Text]; Addonizio, V. Paul [Abstract] [Full Text]; Adler, Zvi [Abstract] [Full Text]; Ahmad, Rashid M. [Abstract] [Full Text]; Al-Ebrahim, Khalid E. [Full Text]; Alavi, Mosen [Abstract] [Full Text]; Alexander, Daniel [Abstract] [Full Text]; Allen, Keith B. [Abstract] [Full Text]; Allen, Steven J. [Abstract] [Full Text]; Amanzio, Martina [Abstract] [Full Text]; Amato, Joseph J. [Full Text]; Ambrose, Paul G. [Abstract] [Full Text]; Ando, Makoto [Abstract] [Full Text]; Ando, Motomi [Abstract] [Full Text]; Antkowiak, Joseph G. [Abstract] [Full Text]; Aota, Masaki [Abstract] [Full Text]; Aron, Michelle [Abstract] [Full Text]; Atkins, B. Zane [Abstract] [Full Text]
B: Baltz, Janet [Abstract] [Full Text]; Ban, Toshihiko [Abstract] [Full Text]; Banks, David [Abstract] [Full Text]; Banning, Adrian P. [Abstract] [Full Text]; Bar-El, Yaron [Abstract] [Full Text]; Barsotti, Pierre [Abstract] [Full Text]; Bauersachs, Rupert [Abstract] [Full Text]; Baumann, William R. [Abstract] [Full Text]; Baumgartner, William A. [Full Text]; Beall, Arthur C., Jr [Abstract] [Full Text]; Benedetti, Fabrizio [Abstract] [Full Text]; Bengur, A. Resai [Abstract] [Full Text]; Bergsland, Jacob [Full Text]; Bernard, Stephen A. [Abstract] [Full Text]; Beyer, A. James, III [Abstract] [Full Text]; Beyersdorf, Friedhelm [Full Text]; Bhabra, Moninder S. [Abstract] [Full Text]; Blakeman, Bradford P. [Abstract] [Full Text]; Blakeman, Bradford P. [Full Text]; Blanche, Carlos [Full Text]; Bonkohara, Yukihiro [Abstract] [Full Text]; Bowles, Christopher W. [Abstract] [Full Text]; Bradley, Scott M. [Full Text]; Bradley, Scott M. [Abstract] [Full Text]; Brandt, Michael [Abstract] [Full Text]; Brooks, Ari [Abstract] [Full Text]; Brown, IvanW., Jr [Full Text]; Brown, James M. [Abstract] [Full Text]; Browne, Barry J. [Abstract] [Full Text]; Budinger, Thomas F. [Abstract] [Full Text]; Burger, Wolfram [Abstract] [Full Text]; Burt, Michael E. [Abstract] [Full Text]; Burt, Michael E. [Abstract] [Full Text]; Butler, Bruce D. [Abstract] [Full Text]
C: Cadman, Christopher [Abstract] [Full Text]; Calafiore, Antonio M. [Full Text]; Campalani, Gianfranco [Full Text]; Carraway, Robert P. [Abstract] [Full Text]; Casadio, Caterina [Abstract] [Full Text]; Ccp, [Abstract] [Full Text]; Chan, Barry B. K. [Full Text]; Chen, Frederick Y. [Abstract] [Full Text]; Chen, Hongyi [Abstract] [Full Text]; Chen, Weiliam [Abstract] [Full Text]; Cheng, Huiming [Abstract] [Full Text]; Chiavarelli, Mario [Abstract] [Full Text]; Choh, Joong H. [Abstract] [Full Text]; Choy, Isaac O. [Abstract] [Full Text]; Christlieb, Ignacio Y. [Full Text]; Clarke, David R [Full Text]; Clements, Ronald H. [Abstract] [Full Text]; Cohen, Amram J. [Abstract] [Full Text]; Cohn, Lawrence H. [Abstract] [Full Text]; Cohn, William E. [Abstract] [Full Text]; Conlan, A. Alan [Abstract] [Full Text]; Cooley, Denton A. [Abstract] [Full Text]; Cooper, Joel D. [Abstract] [Full Text]; Cope, Jeffrey T. [Abstract] [Full Text]; Coselli, Joseph S. [Abstract] [Full Text]; Cosgrove, Delos M., III [Abstract] [Full Text]; Crawford, Fred A., Jr [Abstract] [Full Text]; Cremer, Jochen [Abstract] [Full Text]; Cunningham, Joseph N., Jr [Abstract] [Full Text]
D: Davis, Karen L. [Abstract] [Full Text]; De Groot, Mark [Full Text]; de Vivie, E. Rainer [Abstract] [Full Text]; DeCampli, William M. [Abstract] [Full Text]; Degens, Hans [Abstract] [Full Text]; deGuzman, Brian J. [Abstract] [Full Text]; Detterbeck, Frank C. [Abstract] [Full Text]; Döring, Volker [Abstract] [Full Text]; Dorsey, Lynne M. A. [Abstract] [Full Text]; Douglas, James M., Jr [Abstract] [Full Text]; Duncan, J. Michael [Abstract] [Full Text]; Durrani, Aurangseb [Abstract] [Full Text]
E: Egan, Thomas M. [Abstract] [Full Text]; Eisen, Howard J. [Abstract] [Full Text]; Eishi, Kiyoyuki [Abstract] [Full Text]; Eric Jamieson, W. R. [Full Text]; Erickson, Robert V. [Abstract] [Full Text]
F: Fabri, Brian M. [Full Text]; Filosso, Pier Luigi [Abstract] [Full Text]; Finnerty, JeanMarie [Abstract] [Full Text]; Flege, John B., Jr [Full Text]; Fox, Mark A. [Full Text]; Fraser, Charles D., Jr [Abstract] [Full Text]; Fraser, Charles D., Jr [Abstract] [Full Text]; Frazier, O. H. [Abstract] [Full Text]; Fuentes, Pierre A. [Abstract] [Full Text]; Fullerton, David A. [Abstract] [Full Text]; Furman, Seymour [Full Text]; Furukawa, Satoshi [Abstract] [Full Text]
G: Gal, Anthony A. [Abstract] [Full Text]; Ganjoo, Anoop K. [Full Text]; Garvey, Michael J. [Abstract] [Full Text]; Gaynor, J. William [Abstract] [Full Text]; Geissler, Hans J. [Abstract] [Full Text]; Girardi, Leonard N. [Abstract] [Full Text]; Girardot, Jean-Marie D. [Abstract] [Full Text]; Girardot, Marie-Nadia [Abstract] [Full Text]; Giudicelli, Roger [Abstract] [Full Text]; Glower, Donald D. [Abstract] [Full Text]; Gott, John Parker [Abstract] [Full Text]; Greeley, William J. [Abstract] [Full Text]; Gross, David R. [Abstract] [Full Text]; Grosso, Michael A. [Abstract] [Full Text]; Grover, Fredrick L. [Abstract] [Full Text]; Guyton, Robert A. [Abstract] [Full Text]
H: Hachida, Mitsuhiro [Abstract] [Full Text]; Halberthal, Michael [Abstract] [Full Text]; Hall, James D. [Abstract] [Full Text]; Hallman, Grady L. [Abstract] [Full Text]; Hammermeister, Karl E. [Abstract] [Full Text]; Hanayama, Naoji [Abstract] [Full Text]; Harringer, Wolfgang [Abstract] [Full Text]; Hart, Ellen M. [Abstract] [Full Text]; Hartmann, Andreas [Abstract] [Full Text]; Hatanaka, Nobutaka [Abstract] [Full Text]; Hauptman, Eli [Abstract] [Full Text]; Haverich, Axel [Abstract] [Full Text]; Heath, Bobby J. [Abstract] [Full Text]; Hill, Bradley B. [Abstract] [Full Text]; Hirooka, Kazunobu [Abstract] [Full Text]; Hirt, Stephan W. [Abstract] [Full Text]; Hoffman, B. D. Kion [Abstract] [Full Text]; Holen, Einfrid Åm [Abstract] [Full Text]; Hooper, Timothy L. [Abstract] [Full Text]; Horsley, W. Stewart [Abstract] [Full Text]; Horsley, W. Stewart [Abstract] [Full Text]; Horvath, Keith A. [Abstract] [Full Text]; Hoshino, Shuichi [Abstract] [Full Text]; Howell, Jimmy F. [Abstract] [Full Text]
I: Ichikawa, Hajime [Abstract] [Full Text]; Ilves, Riivo [Full Text]; Imai, Yasuharu [Abstract] [Full Text]; Izzat, M. Bashar [Full Text]; Izzat, M. Bashar [Full Text]
J: Jaggers, James [Abstract] [Full Text]; Jaquiss, Robert D. B. [Abstract] [Full Text]; Jarvis, Jonathan C. [Abstract] [Full Text]; Jeevanandam, Valluvan [Abstract] [Full Text]; Jernigan, Verna [Abstract] [Full Text]; Johnson, Robert G. [Abstract] [Full Text]; Jones, David R. [Abstract] [Full Text]; Jones, David T. [Abstract] [Full Text]; Jones, James W. [Abstract] [Full Text]
K: Kadoba, Keishi [Abstract] [Full Text]; Kaneda, Yoshikazu [Abstract] [Full Text]; Kashii, Tatsuhiko [Abstract] [Full Text]; Katz, Michael G. [Abstract] [Full Text]; Katz, Rama [Abstract] [Full Text]; Kelly, Kevin M. [Abstract] [Full Text]; Keogh, Bruce E. [Abstract] [Full Text]; Kessenich, Amy L. [Abstract] [Full Text]; Kirby, Randall P. [Abstract] [Full Text]; Knauss, Sheryl A. [Abstract] [Full Text]; Kneissl, Georg-Dieter [Abstract] [Full Text]; Kobayashi, Junjiro [Abstract] [Full Text]; Kobayashi, Masashi [Abstract] [Full Text]; Kooker, Karlene [Abstract] [Full Text]; Kosakai, Yoshio [Abstract] [Full Text]; Koutlas, Theodore C. [Abstract] [Full Text]; Koyanagi, Hitoshi [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Kron, Irving L. [Full Text]; Kuntz, Richard E. [Abstract] [Full Text]; Kurusz, Mark [Abstract] [Full Text]; Kusajima, Yoshinori [Abstract] [Full Text]; Kuwata, Keiji [Abstract] [Full Text]
L: Landreneau, Rodney J. [Abstract] [Full Text]; Lanzarotti, Charles [Abstract] [Full Text]; Laurence, Rita G. [Abstract] [Full Text]; Lautz, David B. [Abstract] [Full Text]; Lawrence, David R. [Abstract] [Full Text]; Lee, Allan G. L. [Abstract] [Full Text]; LeMaire, Scott A. [Abstract] [Full Text]; Levy, Robert J. [Abstract] [Full Text]; Li, Jian [Abstract] [Full Text]; Liekweg, Richard J. [Abstract] [Full Text]; Livesay, James J. [Abstract] [Full Text]; Lockwood, Nancy W. [Abstract] [Full Text]; London, Martin J. [Abstract] [Full Text]; Lorber, Abraham [Abstract] [Full Text]; Lu, Hua [Abstract] [Full Text]; Lucke, John C. [Abstract] [Full Text]
M: Machiraju, Venkat R. [Full Text]; Mack, Michael J. [Abstract] [Full Text]; Mack, Michael J. [Abstract] [Full Text]; Maeda, Tomohiro [Abstract] [Full Text]; Maggi, Giuliano [Abstract] [Full Text]; Mansour, Kamal A. [Abstract] [Full Text]; Masai, Takafumi [Abstract] [Full Text]; Massard, Gilbert [Abstract] [Full Text]; Mathie, Robert T. [Abstract] [Full Text]; Matsuda, Hikaru [Abstract] [Full Text]; MaWhinney, Samantha [Abstract] [Full Text]; Mayerfeld, Doni [Abstract] [Full Text]; McCarthy, James F. [Abstract] [Full Text]; McDaniel, Nancy L. [Abstract] [Full Text]; Mee, Roger B. B. [Full Text]; Mehlhorn, Uwe [Abstract] [Full Text]; Miles, Ronald H. [Abstract] [Full Text]; Miller, Charles C., III [Abstract] [Full Text]; Miller, Coleen E. [Abstract] [Full Text]; Milo, Simcha [Abstract] [Full Text]; Minale, Carmine [Abstract] [Full Text]; Mittal, Pramod K. [Abstract] [Full Text]; Mizushima, Yutaka [Abstract] [Full Text]; Molinatti, Massimo [Abstract] [Full Text]; Moores, Darroch W. O. [Full Text]; Morand, Georges [Abstract] [Full Text]; Moyse, Jeffrey [Abstract] [Full Text]
N: Nakano, Kiyoharu [Abstract] [Full Text]; Nawata, Sumihiko [Abstract] [Full Text]; Nelson, Roy L. [Abstract] [Full Text]; Netherland, Donald E. [Abstract] [Full Text]; Neumann, Guntram [Abstract] [Full Text]; Newman, Roxanne [Full Text]; Ng, Bruce [Abstract] [Full Text]; Nicolson, Susan C. [Abstract] [Full Text]; Nolan, Stanton P. [Abstract] [Full Text]; Nolan, Stanton P. [Full Text]; Nomoto, Shin-ichi [Abstract] [Full Text]; Nonoyama, Masaki [Abstract] [Full Text]; Noto, Hirofumi [Abstract] [Full Text]; Nwogu, Chukwumere E. [Abstract] [Full Text]
O: Obayashi, Derek Y. [Abstract] [Full Text]; Ochoa, Laura [Abstract] [Full Text]; Ohata, Toshihiro [Abstract] [Full Text]; Ohkado, Akihiko [Abstract] [Full Text]; Ohno, Kiyoshi [Abstract] [Full Text]; Ohri, Sunil K. [Abstract] [Full Text]; Ohtsuka, Toshiya [Full Text]; Okada, Kenji [Abstract] [Full Text]; Olearchyk, Andrew S. [Abstract] [Full Text]; Oliaro, Alberto [Abstract] [Full Text]; Olshansky, Brian [Abstract] [Full Text]; Ott, David A. [Abstract] [Full Text]; Øvrum, Eivind [Abstract] [Full Text]
P: Palacios-Macedo, Alexis X. [Abstract] [Full Text]; Parker, Leonard A., Jr [Abstract] [Full Text]; Patterson, G. Alexander [Abstract] [Full Text]; Perryman, Richard A. [Abstract] [Full Text]; Pezzella, A. Thomas [Full Text]; Pillai, Ravi [Abstract] [Full Text]; Pischedda, Franco [Abstract] [Full Text]; Pomerantz, Marvin [Full Text]; Pottanat, George [Abstract] [Full Text]; Powell, Saul R. [Abstract] [Full Text]; Prater, Stephen P. [Abstract] [Full Text]; Prendergast, Thomas W. [Abstract] [Full Text]
R: Ramdev, Geeta [Abstract] [Full Text]; Rammos, Kyriakos St. [Abstract] [Full Text]; Rayburn, Samuel T. [Abstract] [Full Text]; Reboud, Eugène [Abstract] [Full Text]; Reed, Carolyn E. [Full Text]; Reifschneider, Hans J. [Abstract] [Full Text]; Reul, George J., Jr [Abstract] [Full Text]; Rice, Beth A. [Abstract] [Full Text]; Richardson, Greg [Abstract] [Full Text]; Riera, Pierre [Abstract] [Full Text]; Robicsek, Francis [Full Text]; Robinson, M. Clive [Abstract] [Full Text]; Ross, Howard M. [Abstract] [Full Text]; Rothe, Karl Wolfgang [Abstract] [Full Text]; Runk, Dianne M. [Abstract] [Full Text]
S: Sade, Robert M. [Abstract] [Full Text]; Saitou, Satoshi [Abstract] [Full Text]; Salerno, Tomas A. [Full Text]; Salmons, Stanley [Abstract] [Full Text]; Samy, Ravi N. [Abstract] [Full Text]; Sanders, Stephen P. [Abstract] [Full Text]; Sarai, Koppany [Full Text]; Sasako, Yoshikado [Abstract] [Full Text]; Sawa, Yoshiki [Abstract] [Full Text]; Schachner, Arie [Abstract] [Full Text]; Schepkin, Victor D. [Abstract] [Full Text]; Schiff, Russell J. [Abstract] [Full Text]; Schlensak, Christian [Full Text]; Schmidt, Sheila E. [Abstract] [Full Text]; Schmitz, Edgar [Abstract] [Full Text]; Schoen, Frederick J. [Abstract] [Full Text]; Schwab, Steven J. [Abstract] [Full Text]; Scruggs, Granger R. [Abstract] [Full Text]; Sellke, Frank W. [Abstract] [Full Text]; Semenkovich, Janice R. [Abstract] [Full Text]; Seo, Kazuhiro [Abstract] [Full Text]; Shaar, Carl J. [Abstract] [Full Text]; Shafei, Hussein [Full Text]; Shah, Himansu R. [Abstract] [Full Text]; Shaw, Trudi E. [Abstract] [Full Text]; Shennib, Hani [Abstract] [Full Text]; Shennib, Hani [Abstract] [Full Text]; Shiraishi, Yuji [Abstract] [Full Text]; Shockey, Kimberly S. [Abstract] [Full Text]; Shroyer, A. Laurie W. [Abstract] [Full Text]; Sievers, Hans-H. [Abstract] [Full Text]; Silvestry, Scott C. [Abstract] [Full Text]; Sirois, Cheryl [Abstract] [Full Text]; Spengler, Ulrike [Abstract] [Full Text]; Splittgerber, Fred H. [Full Text]; Spray, Thomas L. [Abstract] [Full Text]; Steven, James M. [Abstract] [Full Text]; Streitz, John M., Jr [Abstract] [Full Text]; Stroud, Martha R. [Abstract] [Full Text]; Stuart, R. Scott [Full Text]; Sugiyama, Shigeki [Abstract] [Full Text]; Sundaresan, Sudhir [Abstract] [Full Text]
T: Takach, Thomas J. [Abstract] [Full Text]; Takamoto, Shinichi [Abstract] [Full Text]; Takanashi, Yoshinori [Abstract] [Full Text]; Takita, Hiroshi [Abstract] [Full Text]; Tangen, Geir [Abstract] [Full Text]; Taylor, Kenneth M. [Abstract] [Full Text]; Teichberg, Saul [Abstract] [Full Text]; Telfer, Edward A. [Abstract] [Full Text]; Tepper, Joel E. [Abstract] [Full Text]; Terada, Masatsugu [Abstract] [Full Text]; Terada, Yasushi [Full Text]; Thielmeier, Kenneth A. [Abstract] [Full Text]; Thomas, Pascal [Abstract] [Full Text]; Thornby, John I. [Abstract] [Full Text]; Thurer, Robert L. [Abstract] [Full Text]; Till, Christopher B. W. [Abstract] [Full Text]; Todd, Barbara A. [Abstract] [Full Text]; Tortolani, Anthony J. [Abstract] [Full Text]; Trachiotis, Gregory D. [Full Text]; Trulock, Elbert P. [Abstract] [Full Text]
U: Uckmann, Frank P. [Abstract] [Full Text]; Ulmer, Jack L. [Abstract] [Full Text]; Ungerleider, Ross M. [Full Text]; Ungerleider, Ross M. [Abstract] [Full Text]; Urschel, John D. [Abstract] [Full Text]
V: van Doorn, Catharina A. M. [Abstract] [Full Text]; Vaynblat, Mikhail [Abstract] [Full Text]
W: Wagmeister, Lee S. [Abstract] [Full Text]; Wait, Michael A. [Full Text]; Walluscheck, Knut P. [Abstract] [Full Text]; Wang, Hong-Yue [Abstract] [Full Text]; Weintraub, Ronald M. [Abstract] [Full Text]; Weissberg, Dov [Full Text]; Wernovsky, Gil [Abstract] [Full Text]; Whitlark, Joseph D. [Abstract] [Full Text]; Wickstrom, Per H. [Abstract] [Full Text]; Wihlm, Jean-Marie [Abstract] [Full Text]; Wilcox, Deborah [Abstract] [Full Text]; Wolf, Randall K. [Full Text]; Wolfe, Walter G. [Abstract] [Full Text]
X: Xu, Peizhang [Abstract] [Full Text]
Y: Yamaki, Shigeo [Abstract] [Full Text]; Yamamoto, Shigetaka [Abstract] [Full Text]; Yamasaki, Hajime [Abstract] [Full Text]; Yamasaki, Yoshio [Abstract] [Full Text]; Yamashita, Ryouhei [Abstract] [Full Text]; Yim, Anthony P. C. [Full Text]; Yim, Anthony P. C. [Full Text]; Young, J. Nilas [Full Text]; Young, J. Nilas [Abstract] [Full Text]
Z: Zeman, William F. [Abstract] [Full Text]; Zisbrod, Zvi [Abstract] [Full Text]