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Index by Author: Volume 63, Issue 1 (January 1997) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Adachi, Seiji [Abstract] [Full Text]; Adachi, Seiji [Abstract] [Full Text]; Afrane, Barima [Full Text]; Agócs, László [Abstract] [Full Text]; Ahmed, Abdelaziz [Abstract] [Full Text]; Aklog, Lishan [Full Text]; Al Khudhairi, Dhafir M. [Abstract] [Full Text]; Al-Halees, Zohair [Full Text]; Alekseev, Alexey E. [Abstract] [Full Text]; Allan, Andrew [Abstract] [Full Text]; Amemiya, Kuniko [Abstract] [Full Text]; Amemiya, Kuniko [Abstract] [Full Text]; Amsel, Bram J. [Full Text]; Andrews, David R. [Abstract] [Full Text]; Aoki, Atsushi [Abstract] [Full Text]; Ashraf, Saeed [Abstract] [Full Text]; Ask, Per [Abstract] [Full Text]; Ayres, Bruce [Abstract] [Full Text]
B: Bacha, Emile A. [Abstract] [Full Text]; Bailey, Marci S. [Abstract] [Full Text]; Bakris, Nicholas C. [Abstract] [Full Text]; Banerjee, Anirban [Abstract] [Full Text]; Banks, David [Abstract] [Full Text]; BAppSc, [Abstract] [Full Text]; BAppSc, [Abstract] [Full Text]; BAppSc, [Abstract] [Full Text]; Baptiste, Reginald C. [Abstract] [Full Text]; Baufreton, Christophe [Abstract] [Full Text]; Baumgartner, Fritz J. [Abstract] [Full Text]; Begliomini, Bruno [Abstract] [Full Text]; Bellows, Stephen D. [Abstract] [Full Text]; Bennett, J. Graeme [Abstract] [Full Text]; Bhadelia, Rafeeque A. [Abstract] [Full Text]; Blau, Nathan [Abstract] [Full Text]; Bonchek, Lawrence I. [Full Text]; Borches, Daniel [Abstract] [Full Text]; Borkon, A. Michael [Abstract] [Full Text]; Borsari, Alan [Abstract] [Full Text]; Borsari, Alan [Abstract] [Full Text]; Borst, Hans-Georg [Abstract] [Full Text]; Borst, Hans-Georg [Abstract] [Full Text]; Bortolotti, Uberto [Full Text]; Boyle, Edward M., Jr [Abstract] [Full Text]; Brockmeier, Vibeke [Abstract] [Full Text]; Burgueros, Margarita [Abstract] [Full Text]; Burke, Redmond P. [Full Text]; Burt, Michael E. [Abstract] [Full Text]
C: Calhoon, John H. [Abstract] [Full Text]; Cameron, Duke E. [Full Text]; Carter, Richard [Abstract] [Full Text]; Casimir-Ahn, Henrik [Abstract] [Full Text]; Chambers, David J. [Abstract] [Full Text]; Chang, Chau-Hsiung [Abstract] [Full Text]; Chapelier, Alain R. [Abstract] [Full Text]; Chatrath, Ranjit [Abstract] [Full Text]; Chen, Frederick Y. [Full Text]; Chiang, Cheng-Wen [Abstract] [Full Text]; Chu, Jaw-Ji [Abstract] [Full Text]; Cleveland, Joseph C., Jr [Abstract] [Full Text]; Cohn, Lawrence H. [Full Text]; Collins, Peter D. [Abstract] [Full Text]; Cooley, Denton A. [Abstract] [Full Text]; Cope, Jeffrey T. [Abstract] [Full Text]; Cortelli, Michael [Abstract] [Full Text]; Coselli, Joseph S. [Abstract] [Full Text]; Couper, Gregory S. [Full Text]; Cowan, Dalia [Abstract] [Full Text]; Cremer, Joachim [Abstract] [Full Text]
D: D'Ovidio, Franco [Abstract] [Full Text]; Dain, Bradley J. [Abstract] [Full Text]; Dajee, Amrit [Abstract] [Full Text]; Dartevelle, Philippe G. [Abstract] [Full Text]; Dartevelle, Philippe G. [Abstract] [Full Text]; Daubeney, Piers E. F. [Full Text]; de Figueiredo, Luiz Poli [Abstract] [Full Text]; de Montpreville, Vincent Thomas [Abstract] [Full Text]; Dekker, Egbart [Full Text]; Desai, Jatin B. [Abstract] [Full Text]; Deuson, Travis E. [Abstract] [Full Text]; Di Biasi, Pietro [Full Text]; Di Simone, Massimo P. [Abstract] [Full Text]; Diehl, James T. [Full Text]; Dregelid, Einar [Abstract] [Full Text]; Dresler, Carolyn M. [Abstract] [Full Text]; Dresler, Christoph [Abstract] [Full Text]; Dulmet, Elisabeth M. [Abstract] [Full Text]
E: Eckel, Lothar [Full Text]; Eckstein, Friedrich S. [Abstract] [Full Text]; Edney, Mark T. [Abstract] [Full Text]; Eguchi, Shoji [Abstract] [Full Text]; Eguchi, Shoji [Abstract] [Full Text]; El-Barbary, Mahmoud [Full Text]; Engelman, Richard M. [Full Text]; Espada, Rafael [Abstract] [Full Text]; Eugene, John [Abstract] [Full Text]; Euler, David E. [Full Text]
F: Falk, Volkmar [Full Text]; Falk, Volkmar [Abstract] [Full Text]; Fosse, Erik [Abstract] [Full Text]; Fraser, Charles D., Jr [Abstract] [Full Text]; Fullerton, David A. [Full Text]
G: García-Guereta, Luis [Abstract] [Full Text]; Gazzaniga, Alan B. [Abstract] [Full Text]; Ghalili, Kourosh C. [Abstract] [Full Text]; Giaid, Adel [Abstract] [Full Text]; Glick, Philip L. [Full Text]; Gogia, Harmohinder S. [Abstract] [Full Text]; Gold, Jeffrey P. [Full Text]; Gonzalez, Virginia [Abstract] [Full Text]; Gorton, Michael E. [Abstract] [Full Text]; Gott, John Parker [Abstract] [Full Text]; Grant, Florence J. [Abstract] [Full Text]; Grech, Ever D. [Abstract] [Full Text]; Grunkemeier, Gary L. [Full Text]; Guyton, Robert A. [Abstract] [Full Text]
H: Haasler, George B. [Abstract] [Full Text]; Häberle, Leo [Abstract] [Full Text]; Hale, Sharon L. [Abstract] [Full Text]; Haller, J. Alex, Jr [Full Text]; Hammerness, Paul G. [Abstract] [Full Text]; Harboe, Morten [Abstract] [Full Text]; Harken, Alden H. [Abstract] [Full Text]; Hata, Masaki [Abstract] [Full Text]; Haverich, Axel [Full Text]; Hawson, Geoffrey A. T. [Abstract] [Full Text]; Hayashi, Jun-ichi [Abstract] [Full Text]; Hayashi, Jun-ichi [Abstract] [Full Text]; He, Guo-Wei [Abstract] [Full Text]; He, Guo-Wei [Full Text]; Hill, Gary E. [Abstract] [Full Text]; Ho, Siew Yen [Abstract] [Full Text]; Høgåsen, Kolbjørn [Abstract] [Full Text]; Hramiec, John E. [Abstract] [Full Text]; Hussain, Arif [Abstract] [Full Text]
I: Irish, Michael S. [Full Text]
J: Jansen, Piet G. M. [Abstract] [Full Text]; Jiménez, José [Abstract] [Full Text]; Johnson, Marion C. [Abstract] [Full Text]; Johnson, Scott B. [Abstract] [Full Text]; Jovanovic, Aleksander [Abstract] [Full Text]; Jurmann, Michael J. [Abstract] [Full Text]; Just, Sarah J. E. [Abstract] [Full Text]
K: Kaminishi, Yuichiro [Full Text]; Kamlot, Andreas [Abstract] [Full Text]; Kapur, Pierina [Full Text]; Katsuyama, Kazuhiko [Abstract] [Full Text]; Kawachi, Yoshito [Abstract] [Full Text]; Kay, Gregory L. [Abstract] [Full Text]; Kayaleh, Raouf [Abstract] [Full Text]; Keck, Karl-Yngve [Abstract] [Full Text]; Khan, Jamal H. [Abstract] [Full Text]; Killen, Duncan A. [Abstract] [Full Text]; Kim, Shin Y. [Full Text]; Kirby, Randall P. [Abstract] [Full Text]; Kitayama, Hitoshi [Abstract] [Full Text]; Kleiman, Neal S. [Abstract] [Full Text]; Kliem, Volker [Abstract] [Full Text]; Kloner, Robert A. [Abstract] [Full Text]; Kohno, Hiroyuki [Abstract] [Full Text]; Komatsu, Sakuzo [Abstract] [Full Text]; Komatsu, Sakuzo [Abstract] [Full Text]; Kon, Mark W. S. [Abstract] [Full Text]; Kotsis, Lajos [Abstract] [Full Text]; Kovács, Judit [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Kwiatkowski, Pawel [Abstract] [Full Text]
L: Landa, Daniel W. [Abstract] [Full Text]; Larbalestier, Robert I. [Abstract] [Full Text]; Lawrence, David R. [Abstract] [Full Text]; Lazzari, Andrea [Abstract] [Full Text]; Le Besnerais, Paul [Abstract] [Full Text]; LeClerc, Jean-Louis [Abstract] [Full Text]; LeMaire, Scott A. [Abstract] [Full Text]; Lin, Fen-Chiung [Abstract] [Full Text]; Lin, Pyng Jing [Abstract] [Full Text]; Liu, Hui-Ping [Abstract] [Full Text]; Loisance, Daniel Y. [Abstract] [Full Text]; Lönn, Urban [Abstract] [Full Text]; Lonquist, James L. [Abstract] [Full Text]; López, Jóse R. [Abstract] [Full Text]; Lucktong, Tananchai [Abstract] [Full Text]
M: Macchiarini, Paolo [Abstract] [Full Text]; Magara, Tatsuo [Abstract] [Full Text]; Margulis, Alvaro [Abstract] [Full Text]; Marsh, Neville A. [Abstract] [Full Text]; Martin, Paul G. [Abstract] [Full Text]; Masuda, Masahisa [Abstract] [Full Text]; Masuda, Masahisa [Abstract] [Full Text]; Masuda, Munetaka [Abstract] [Full Text]; Matsumoto, Terufumi [Abstract] [Full Text]; Matsuo, Hiroshi [Abstract] [Full Text]; Matsuo, Hiroshi [Abstract] [Full Text]; Mattioli, Sandro [Abstract] [Full Text]; Mauney, Michael C. [Abstract] [Full Text]; Maurer, L. Herbert [Abstract] [Full Text]; Mayumi, Hisanori [Abstract] [Full Text]; McIntyre, Robert C., Jr [Full Text]; Mehta, Atul C. [Abstract] [Full Text]; Meldrum, Daniel R. [Abstract] [Full Text]; Menasché, Philippe [Full Text]; Michler, Robert E. [Abstract] [Full Text]; Miller, O. Lawayne [Abstract] [Full Text]; Minanov, Oktavijan P. [Abstract] [Full Text]; Mitsuhashi, Syoichi [Full Text]; Moen, Oddvar [Abstract] [Full Text]; Mohr, Friedrich W. [Abstract] [Full Text]; Mollnes, Tom Eirik [Abstract] [Full Text]; Moulijn, Adrian C. [Full Text]; Murphy, Charles O. [Abstract] [Full Text]
N: Nadeem, Faris [Abstract] [Full Text]; Nair, Unnikrishnan [Abstract] [Full Text]; Nakamoto, Susumu [Abstract] [Full Text]; Nakano, Susumu [Abstract] [Full Text]; Nakano, Susumu [Abstract] [Full Text]; Nakashima, Atsuhiro [Abstract] [Full Text]; Nakazima, Nobuyuki [Abstract] [Full Text]; Naunheim, Keith S. [Full Text]; Neelakandan, B. [Full Text]; Nojima, Takehisa [Abstract] [Full Text]; Nollert, Georg [Full Text]; Nugent, William C. [Abstract] [Full Text]
O: O'Brien, Mark F. [Abstract] [Full Text]; Oates, Elizabeth [Abstract] [Full Text]; Oku, Hidetaka [Abstract] [Full Text]; Oldhafer, Karl [Abstract] [Full Text]; Olin, Christian [Abstract] [Full Text]; Onoe, Masahiko [Abstract] [Full Text]; Otaki, Masaki [Abstract] [Full Text]
P: Packer, Jay M. [Abstract] [Full Text]; Paladini, Rolando [Abstract] [Full Text]; Pan-Chih, [Abstract] [Full Text]; Parsonnet, Victor [Full Text]; Patel, Ramesh L. [Abstract] [Full Text]; Patterson, G. Alexander [Abstract] [Full Text]; Penkoske, Patricia A. [Full Text]; Perrin, Emma J. [Abstract] [Full Text]; Peterzén, Bengt [Abstract] [Full Text]; Piehler, Jeffrey M. [Abstract] [Full Text]; Pifarré, Roque [Full Text]; Pohlman, Timothy H. [Abstract] [Full Text]; Popilskis, Sulli [Abstract] [Full Text]
R: Ramasubrahmanyam, Gutti [Full Text]; Rani, Guntuboina Usha [Full Text]; Rao, Dasari Prasada [Full Text]; Ray, Michael J. [Abstract] [Full Text]; Reed, William A. [Abstract] [Full Text]; Reis, Alex [Abstract] [Full Text]; Replogle, Robert L. [Full Text]; Rietjens, Mario [Abstract] [Full Text]; Rigas, James R. [Abstract] [Full Text]; Ritter, Jon H. [Abstract] [Full Text]; Robbins, Richard A. [Abstract] [Full Text]; Ross, Eric [Abstract] [Full Text]; Ross, Howard M. [Abstract] [Full Text]; Rossbach, Mario M. [Abstract] [Full Text]; Rowland, Robert T. [Abstract] [Full Text]; Rutberg, Hans [Abstract] [Full Text]
S: Saito, Haruo [Abstract] [Full Text]; Sakakibara, Yuzuru [Full Text]; Sako, Edward Y. [Abstract] [Full Text]; Sako, Y. [Full Text]; Salati, Maurizio [Full Text]; Santoli, Carmine [Full Text]; Santos, Clyde Dos [Abstract] [Full Text]; Saunders, Nigel R. [Abstract] [Full Text]; Schäfers, Jochen [Abstract] [Full Text]; Scheule, Albertus M. [Abstract] [Full Text]; Scrofani, Roberto [Full Text]; Sellke, Frank W. [Abstract] [Full Text]; Serrick, Cyril [Abstract] [Full Text]; Sharkawy, Mohammed El [Abstract] [Full Text]; Shen, Win K. [Abstract] [Full Text]; Shennib, Hani [Abstract] [Full Text]; Shockey, Kimberly S. [Abstract] [Full Text]; Siddiqi, Ather J. [Abstract] [Full Text]; Simkhovich, Boris Z. [Abstract] [Full Text]; Slater, A. David [Full Text]; Söderlind, Kristina [Abstract] [Full Text]; Stamler, Alon [Abstract] [Full Text]; Stark, Jaroslav [Full Text]; Starr, Albert [Full Text]; Strüber, Martin [Full Text]; Sudo, Yoshio [Abstract] [Full Text]; Sugita, Takaaki [Abstract] [Full Text]; Svensson, Lars G. [Full Text]; Sykes, Mellick T. [Abstract] [Full Text]
T: Tabayashi, Koichi [Abstract] [Full Text]; Tabayashi, Koichi [Abstract] [Full Text]; Tabayashi, Koichi [Abstract] [Full Text]; Takach, Thomas J. [Abstract] [Full Text]; Takahara, Yoshiharu [Abstract] [Full Text]; Takamiya, Makoto [Abstract] [Full Text]; Takamiya, Makoto [Abstract] [Full Text]; Takeuchi, Eiji [Abstract] [Full Text]; Takeuchi, Eiji [Abstract] [Full Text]; Talwalker, Nirupama G. [Abstract] [Full Text]; Tan, Peter P.C. [Abstract] [Full Text]; Taylor, Janice A. [Abstract] [Full Text]; Terzic, Andre [Abstract] [Full Text]; Theuer, Charles [Abstract] [Full Text]; Thijs, Caroliene M. [Abstract] [Full Text]; Tian, Yi [Abstract] [Full Text]; Tofukuji, Motohisa [Abstract] [Full Text]; Tovar, Eduard A. [Abstract] [Full Text]; Tovar, Eduardo A. [Abstract] [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]; Trivedi, Uday H. [Abstract] [Full Text]; Tsai, Feng-Chun [Abstract] [Full Text]; Turtle, Mark R. J. [Abstract] [Full Text]
U: Ueda, Masao [Abstract] [Full Text]; Uthoff, Kai [Abstract] [Full Text]; Uthoff, Kay [Abstract] [Full Text]
V: van Son, Jacques A. M. [Full Text]; van Son, Jacques A. M. [Abstract] [Full Text]; Vander Salm, Thomas J. [Abstract] [Full Text]; Velthuis, Henkte [Abstract] [Full Text]; Venge, Per [Abstract] [Full Text]; Venn, Graham E. [Abstract] [Full Text]; Verani, Mario S. [Abstract] [Full Text]; Verheul, Hans A. [Full Text]; Verrier, Edward D. [Abstract] [Full Text]; Vincent, Jean-Louis [Abstract] [Full Text]
W: Wahlers, Thorsten [Abstract] [Full Text]; Wahlers, Thorsten [Abstract] [Full Text]; Wan, Song [Abstract] [Full Text]; Wang, Steven Y. [Abstract] [Full Text]; Watarida, Shoji [Abstract] [Full Text]; Watterson, Kevin G. [Abstract] [Full Text]; Webber, Steven A. [Full Text]; Wendel, Hans P. [Abstract] [Full Text]; Wick, Mark R. [Abstract] [Full Text]; Wilcox, George [Abstract] [Full Text]; Wildevuur, Charles R. H. [Abstract] [Full Text]; Wilson, Roger S. [Abstract] [Full Text]; Wollert, Hans-George [Full Text]; Wranne, Bengt [Abstract] [Full Text]; Wu, Delon [Abstract] [Full Text]; Wulff, John [Abstract] [Full Text]
Y: Yasuda, Keishu [Abstract] [Full Text]; Yasuda, Keishu [Abstract] [Full Text]; Yasuda, Ryuzaburo [Abstract] [Full Text]; Yasui, Hisataka [Abstract] [Full Text]; Yozu, Ryohei [Abstract] [Full Text]; Yozu, Ryohei [Abstract] [Full Text]
Z: Zacharias, Anoar [Full Text]; Zehr, Kenton J. [Full Text]; Zhang, Qui-Wei [Abstract] [Full Text]; Ziemer, Gerhard [Abstract] [Full Text]; Zuguchi, Masayuki [Abstract] [Full Text]; Zuleika, A. M. Mehrun [Abstract] [Full Text]