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Index by Author: Volume 62, Issue 5 (November 1996) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Åberg, Bengt [Abstract] [Full Text]; Agrawal, Nandkishor B. [Abstract] [Full Text]; Aharon, Alon S. [Abstract] [Full Text]; Akins, Cary W. [Full Text]; Akins, Cary W. [Full Text]; Akins, Cary W. [Full Text]; Al-Saedi, Saad [Abstract] [Full Text]; Allmendinger, Philip D. [Abstract] [Full Text]; Altorki, Nasser K. [Abstract] [Full Text]; Anderson, Richard P. [Full Text]; Angelini, Gianni D. [Abstract] [Full Text]; Attar, Safuh [Full Text]; Ay, Ilknur [Abstract] [Full Text]
B: Badel, Pierre [Abstract] [Full Text]; Banks, David [Abstract] [Full Text]; Bapat, Vinayak N. [Abstract] [Full Text]; Bauer, Hans H. [Abstract] [Full Text]; Bauersfeld, Urs [Abstract] [Full Text]; Baumgartner, William A. [Abstract] [Full Text]; Beer, David G. [Abstract] [Full Text]; Berger, Stuart [Abstract] [Full Text]; Bergsland, Jacob [Abstract] [Full Text]; Bernstein, R. Varick [Full Text]; Berry, Gerald J. [Abstract] [Full Text]; Beyens, Thierry [Abstract] [Full Text]; Bhabra, Moninder S. [Abstract] [Full Text]; Bhan, Anil [Full Text]; Binns, Oliver A. R. [Abstract] [Full Text]; Bitkover, Catarina Y. [Abstract] [Full Text]; Blanche, Carlos [Abstract] [Full Text]; Blue, Mary E. [Abstract] [Full Text]; Bonnell, Mark R. [Abstract] [Full Text]; Bové, Thierry [Abstract] [Full Text]; Boyle, Edward M., Jr [Abstract] [Full Text]; Brock, Malcolm V. [Abstract] [Full Text]; Brodman, Richard F. [Abstract] [Full Text]; Brodman, Richard F. [Full Text]; Browdie, David A. [Full Text]; Buchanan, Scott A. [Abstract] [Full Text]; Bushnell, Lamar J. [Abstract] [Full Text]; Byrne, John G. [Abstract] [Full Text]
C: Calafiore, Antonio M. [Abstract] [Full Text]; Cameron, Duke E. [Abstract] [Full Text]; Carrel, Thierry [Abstract] [Full Text]; Carrier, Michel [Full Text]; Ccp, [Abstract] [Full Text]; Cesnjevar, Robert A. [Abstract] [Full Text]; Chang, Paul A. [Abstract] [Full Text]; Chen, Chunguang [Abstract] [Full Text]; Chen, Feng-Feng [Abstract] [Full Text]; Chen, Lih C. [Abstract] [Full Text]; Christenson, Jan T. [Abstract] [Full Text]; Chung, Jane Y. [Abstract] [Full Text]; Çiçek, Sertaç [Abstract] [Full Text]; Cohen, Mabelle [Abstract] [Full Text]; Cope, Jeffrey T. [Abstract] [Full Text]; Cosgrove, Delos M., III [Abstract] [Full Text]; Czer, Lawrence S. C. [Abstract] [Full Text]
D: D'Agostino, Richard S. [Abstract] [Full Text]; D'Armini, Andrea M. [Abstract] [Full Text]; Daly, Richard C. [Abstract] [Full Text]; Das, Ashish Kumar [Abstract] [Full Text]; David, Tirone E. [Full Text]; Davies, Gerald G. [Full Text]; De Lima, Nuno F. [Abstract] [Full Text]; DeBois, William [Abstract] [Full Text]; Demanet, Hélène [Abstract] [Full Text]; Demirkiliç, Ufuk [Abstract] [Full Text]; Dessy, Hugue [Abstract] [Full Text]; Deuvaert, Frank E. [Abstract] [Full Text]; Deville, Andrée [Abstract] [Full Text]; Di Bisceglie, Maurizio [Abstract] [Full Text]; Di Paolo, Nicola [Abstract] [Full Text]; DiBernardo, Louis R. [Abstract] [Full Text]; DiSesa, Verdi J. [Abstract] [Full Text]; Drinkwater, Davis C., Jr [Abstract] [Full Text]
E: Earle, Nan R. [Abstract] [Full Text]; Egan, Thomas M. [Abstract] [Full Text]; Eisen, Howard J. [Abstract] [Full Text]; Eugene, John [Full Text]; Everett, Jeffrey E. [Abstract] [Full Text]
F: Fann, James I. [Abstract] [Full Text]; Fedderly, Raymond T. [Abstract] [Full Text]; Felix, Heidi [Abstract] [Full Text]; Flaherty, James [Abstract] [Full Text]; Floten, H. Storm [Abstract] [Full Text]; Fooks, Gregory S. [Full Text]; Frame, Rosemary [Full Text]; Frame, Rosemary [Abstract] [Full Text]; Frazier, O. H. [Abstract] [Full Text]; Frommelt, Michele A. [Abstract] [Full Text]; Frommelt, Peter C. [Abstract] [Full Text]; Fujita, Tomoyuki [Abstract] [Full Text]; Fukushima, Norihide [Abstract] [Full Text]; Fulmer, Alison [Abstract] [Full Text]; Furukawa, Satoshi [Abstract] [Full Text]
G: Gårdlund, Bengt [Abstract] [Full Text]; Garosi, Guido [Abstract] [Full Text]; Gasser, Bernard [Abstract] [Full Text]; Gates, Richard N. [Abstract] [Full Text]; Gaynor, J. William [Abstract] [Full Text]; Ghiribelli, Claudia [Abstract] [Full Text]; Giddins, Niels G. [Abstract] [Full Text]; Girgis, Reda E. [Abstract] [Full Text]; Glaeser, Donald H. [Abstract] [Full Text]; Glickstein, Julie S. [Abstract] [Full Text]; Gold, Jeffrey P. [Abstract] [Full Text]; Goldstein, Jacques P. [Abstract] [Full Text]; Gott, Vincent L. [Full Text]; Gotti, Giuseppe [Abstract] [Full Text]; Gupta, Narendra Kumar [Full Text]
H: Hakimi, Mehdi [Abstract] [Full Text]; Hall, Timothy S. [Abstract] [Full Text]; Hamilton, Andrew [Abstract] [Full Text]; Hancock, Betty J. [Abstract] [Full Text]; Hanley, Frank L. [Abstract] [Full Text]; Hanley, Frank L. [Abstract] [Full Text]; Hardikar, Ashutosh A. [Abstract] [Full Text]; Harker, Laurence A. [Full Text]; Hartley, Craig J. [Abstract] [Full Text]; Hartz, Renee S. [Abstract] [Full Text]; Hawkins, Lois [Abstract] [Full Text]; He, Guo-Wei [Full Text]; Helm, Robert E. [Abstract] [Full Text]; Hetzer, Roland [Full Text]; Hibi, Michiaki [Abstract] [Full Text]; Hibi, Michiaki [Abstract] [Full Text]; Hickey, Paul R. [Abstract] [Full Text]; Hiroura, Manabu [Abstract] [Full Text]; Hooper, Timothy L. [Abstract] [Full Text]; Hoover, Eddie L. [Abstract] [Full Text]; Hopkinson, David N. [Abstract] [Full Text]; Horber, Patrick [Abstract] [Full Text]; Horstkotte, Dieter [Full Text]; Hosokawa, Hidekazu [Abstract] [Full Text]
I: Iannettoni, Mark D. [Abstract] [Full Text]; Idiong, Nnanake [Abstract] [Full Text]; Imagawa, Hiroshi [Abstract] [Full Text]; Inutsuka, Koji [Abstract] [Full Text]; Isom, O. Wayne [Abstract] [Full Text]; Issenberg, Henry J. [Abstract] [Full Text]
J: Jacobsson, Hans [Abstract] [Full Text]; Janssen, Gerhard H. [Abstract] [Full Text]; Jeevanandam, Valluvan [Abstract] [Full Text]; Jessurun, Jose [Abstract] [Full Text]; Johnston, Michael V. [Abstract] [Full Text]; Joshi, Vijaya [Abstract] [Full Text]
K: Kadoba, Keishi [Abstract] [Full Text]; Kagisaki, Koji [Abstract] [Full Text]; Kan, Jean S. [Abstract] [Full Text]; Kawahara, Katsunobu [Abstract] [Full Text]; Kawamura, Mitsuo [Abstract] [Full Text]; Kawamura, Mitsuo [Abstract] [Full Text]; Kawaue, Yasushi [Abstract] [Full Text]; Kessel, Maryanne W. [Abstract] [Full Text]; Kessler, Romain [Abstract] [Full Text]; Khachane, Vasant B. [Abstract] [Full Text]; Kirshbom, Paul M. [Abstract] [Full Text]; Kitamura, Soichiro [Abstract] [Full Text]; Klemperer, John D. [Abstract] [Full Text]; Kretschmer, Stephan [Abstract] [Full Text]; Krieger, Karl H. [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Kuzuhara, Shigeki [Abstract] [Full Text]
L: Lachat, Mario [Abstract] [Full Text]; Lai, Wu-Wei [Abstract] [Full Text]; Laks, Hillel [Abstract] [Full Text]; Lang, Samuel [Abstract] [Full Text]; Lange, Mary S. [Abstract] [Full Text]; Lanza, Louis A. [Abstract] [Full Text]; Larsson, Stig A. [Abstract] [Full Text]; Laschinger, John C. [Abstract] [Full Text]; Lawrie, Gerald M. [Abstract] [Full Text]; Lee, Jeongryl [Abstract] [Full Text]; Lee, Stanley S. [Abstract] [Full Text]; Lemasters, John J. [Abstract] [Full Text]; Lemke, Robert P. [Abstract] [Full Text]; Levin, Howard R. [Abstract] [Full Text]; Levinson, Mark M. [Full Text]; Levitsky, Sidney [Abstract] [Full Text]; Lewis, David A. [Abstract] [Full Text]; Li, Zheng [Abstract] [Full Text]; Litwin, S. Bert [Abstract] [Full Text]; Lobdell, Kevin W. [Abstract] [Full Text]; Lodge, Andrew J. [Abstract] [Full Text]; Lowenstein, Charles J. [Abstract] [Full Text]
M: Massard, Gilbert [Abstract] [Full Text]; Matloff, Jack M. [Abstract] [Full Text]; Matsuda, Hikaru [Abstract] [Full Text]; Mauney, Michael C. [Abstract] [Full Text]; Mayer, John E., Jr [Abstract] [Full Text]; McClurken, James B. [Abstract] [Full Text]; McElhinney, Doff B. [Abstract] [Full Text]; McElhinney, Doff B. [Abstract] [Full Text]; McManus, Terrence S. [Abstract] [Full Text]; McPherson, David D. [Full Text]; Meliones, Jon N. [Abstract] [Full Text]; Meyer, Pierre [Abstract] [Full Text]; Michael, Lloyd H. [Abstract] [Full Text]; Miller, D. Craig [Abstract] [Full Text]; Miller, George E., Jr [Full Text]; Minatoya, Kenji [Abstract] [Full Text]; Mitchell, R. Scott [Abstract] [Full Text]; Miura, Satoru [Abstract] [Full Text]; Miura, Takuya [Abstract] [Full Text]; Mohiuddin, Muhammad [Abstract] [Full Text]; Moore, KathleenA. [Abstract] [Full Text]; Moore, Phillip [Abstract] [Full Text]; Morand, Georges [Abstract] [Full Text]; Morris, James J. [Abstract] [Full Text]; Morris, Randall E. [Abstract] [Full Text]; Mulder, Donald G. [Full Text]; Mullany, Charles J. [Abstract] [Full Text]; Müller, Johannes [Full Text]; Murakami, Fumihiko [Abstract] [Full Text]; Murase, Mitsuya [Abstract] [Full Text]; Mussatto, Kathleen A. [Abstract] [Full Text]
N: Naftel, David C. [Full Text]; Naik, Surendra K. [Abstract] [Full Text]; Namikawa, Shoji [Abstract] [Full Text]; Narang, Sanjeet [Full Text]; Narita, Yugo [Abstract] [Full Text]; Navia, José L. [Abstract] [Full Text]; Nelson, David P. [Abstract] [Full Text]; Nessim, Sharon [Abstract] [Full Text]; Neufeld, Ellis J. [Abstract] [Full Text]; Nezu, Kunimoto [Abstract] [Full Text]; Niederhäuser, Urs [Abstract] [Full Text]; Nishida, Takuji [Abstract] [Full Text]; Nitschke, Michael [Abstract] [Full Text]; Northington, Frances A. [Abstract] [Full Text]
O: O'Hair, Daniel P. [Full Text]; Odell, John A. [Abstract] [Full Text]; Odim, Jonah N. K. [Abstract] [Full Text]; Ohri, Sunil K. [Abstract] [Full Text]; Okabayashi, Hitoshi [Abstract] [Full Text]; Okabayashi, Kan [Abstract] [Full Text]; Onoda, Koji [Abstract] [Full Text]; Ooshima, Hideki [Abstract] [Full Text]; Orringer, Mark B. [Abstract] [Full Text]; Orszulak, Thomas A. [Abstract] [Full Text]; Owlia, Dariush [Abstract] [Full Text]; Oyer, Philip E. [Abstract] [Full Text]; Oz, Mehmet C. [Abstract] [Full Text]
P: Pais, Prem [Full Text]; Paladini, Piero [Abstract] [Full Text]; Palmer, Mitchell N. [Abstract] [Full Text]; Park, John [Abstract] [Full Text]; Pelech, Andrew N. [Abstract] [Full Text]; Pennell, Dudley J. [Abstract] [Full Text]; Peterson, Powers [Abstract] [Full Text]; Pierce, William S. [Full Text]; Porwal, Manish M. [Abstract] [Full Text]; Prendergast, Thomas W. [Abstract] [Full Text]
R: Rainer, W. Gerald [Full Text]; Reddy, Konda Subba [Abstract] [Full Text]; Reddy, V. Mohan [Abstract] [Full Text]; Reddy, V. Mohan [Abstract] [Full Text]; Redmond, J. Mark [Abstract] [Full Text]; Reichenspurner, Hermann [Abstract] [Full Text]; Reitz, Bruce A. [Abstract] [Full Text]; Reitz, Bruce A. [Abstract] [Full Text]; Restuccia, Joseph D. [Abstract] [Full Text]; Reuse, Jeanine [Abstract] [Full Text]; Rhudis, Ehud [Abstract] [Full Text]; Rich, Stuart [Abstract] [Full Text]; Richenbacher, Wayne E. [Full Text]; Ringel, Richard E. [Abstract] [Full Text]; Robbins, Robert C. [Abstract] [Full Text]; Robbins, Robert C. [Abstract] [Full Text]; Roberts, J. Kirk [Abstract] [Full Text]; Roeslin, Norbert [Abstract] [Full Text]; Rose, Eric A. [Full Text]; Rose, Eric A. [Abstract] [Full Text]; Rosengart, Todd K. [Abstract] [Full Text]; Ross, Robert D. [Abstract] [Full Text]; Rossi, Michael A. [Abstract] [Full Text]
S: Saldanha, Richard [Full Text]; Salerno, Tomas A. [Abstract] [Full Text]; Salzano, Richard P., Jr [Abstract] [Full Text]; Sato, Hiroki [Abstract] [Full Text]; Sawabata, Noriyoshi [Abstract] [Full Text]; Schaff, Hartzell V. [Abstract] [Full Text]; Schermerhorn, Marc L. [Abstract] [Full Text]; Schmuziger, Martin [Abstract] [Full Text]; Sell, Timothy L. [Abstract] [Full Text]; Selle, Jay G. [Abstract] [Full Text]; Shahian, David M. [Abstract] [Full Text]; Sharma, Rajesh [Full Text]; Shaw, Trudi E. [Abstract] [Full Text]; Shen, Zhenya [Abstract] [Full Text]; Shimpo, Hideto [Abstract] [Full Text]; Shin'oka, Toshiharu [Abstract] [Full Text]; Shiraishi, Takeshi [Abstract] [Full Text]; Shirakura, Ryota [Abstract] [Full Text]; Shirakusa, Takayuki [Abstract] [Full Text]; Shockey, Kimberly S. [Abstract] [Full Text]; Shumway, Norman E. [Abstract] [Full Text]; Shumway, Sara J. [Abstract] [Full Text]; Shure, Deborah [Full Text]; Silverman, Norman H. [Abstract] [Full Text]; Simonet, François [Abstract] [Full Text]; Singh, Girija [Full Text]; Siquiera, Carmelindo, Jr [Abstract] [Full Text]; Skaryak, Lynne A. [Abstract] [Full Text]; Slater, James P. [Abstract] [Full Text]; Smith, Peter L. C. [Abstract] [Full Text]; Snider, John M. [Abstract] [Full Text]; Soltero, Ernesto R. [Abstract] [Full Text]; Spiess, Bruce D. [Abstract] [Full Text]; Srikrishna, Srirangapatnam Vardaraj [Full Text]; Starr, Albert [Abstract] [Full Text]; Stinson, Edward B. [Abstract] [Full Text]; Sutherland, Fraser W. H. [Abstract] [Full Text]; Suwanjindar, Pan [Abstract] [Full Text]; Svensson, Lars G. [Abstract] [Full Text]
T: Taira, Akira [Abstract] [Full Text]; Takachi, Toshirou [Abstract] [Full Text]; Takao, Motoshi [Abstract] [Full Text]; Takeshima, Shigeto [Abstract] [Full Text]; Taketani, Satoshi [Abstract] [Full Text]; Takkenberg, Johanna J. M. [Abstract] [Full Text]; Tendolkar, Anil G. [Abstract] [Full Text]; Terada, Yasushi [Full Text]; Theodore, James [Abstract] [Full Text]; Thomas, Stephen [Abstract] [Full Text]; Tkebuchava, Tengis [Abstract] [Full Text]; Toda, Riichiro [Abstract] [Full Text]; Todd, Barbara A. [Abstract] [Full Text]; Todd, James [Abstract] [Full Text]; Tojo, Takashi [Abstract] [Full Text]; Tomita, Yasuhiro [Abstract] [Full Text]; Toyohira, Hitoshi [Abstract] [Full Text]; Trento, Alfredo [Abstract] [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]; Tripp, Henry F. [Abstract] [Full Text]; Tuncer, Meral [Abstract] [Full Text]; Turina, Marko I. [Abstract] [Full Text]; Turina, Marko I. [Abstract] [Full Text]; Turpie, Alexander G. G. [Full Text]; Tweddell, James S. [Abstract] [Full Text]
U: Uchida, Naomichi [Abstract] [Full Text]; Ungerleider, Ross M. [Abstract] [Full Text]; Usui, Akihiko [Abstract] [Full Text]; Usui, Akihiko [Abstract] [Full Text]
V: Vaage, Jarle [Abstract] [Full Text]; Valen, Guro [Abstract] [Full Text]; Van Wylen, David G. L. [Abstract] [Full Text]; Venugopal, Panangipalli [Full Text]; Verrier, Edward D. [Abstract] [Full Text]; Viart, Pierre [Abstract] [Full Text]; Vinten-Johansen, Jakob [Abstract] [Full Text]; Voltolini, Luca [Abstract] [Full Text]; von der Emde, Juergen [Abstract] [Full Text]; von Segesser, Ludwig K. [Abstract] [Full Text]
W: Walters, Henry L., III [Abstract] [Full Text]; Wanibuchi, Yasuhiko [Full Text]; Ward, Cameron [Abstract] [Full Text]; Warner, Orlando J. [Abstract] [Full Text]; Weder, Walter [Abstract] [Full Text]; Weinberg, Alan D. [Abstract] [Full Text]; Whyte, Richard I. [Abstract] [Full Text]; Wihlm, Jean-Marie [Abstract] [Full Text]; Williams, Mark W. [Abstract] [Full Text]; Williamson, Warren A. [Abstract] [Full Text]; Wilson, Barbara G. [Abstract] [Full Text]; Wilson, Shawn W. [Abstract] [Full Text]; Wittekind, Christian [Abstract] [Full Text]; Wu, Ming-Ho [Abstract] [Full Text]
Y: Yada, Isao [Abstract] [Full Text]; Yan, Jing-Jou [Abstract] [Full Text]; Yildiz, OGuzhan [Abstract] [Full Text]; Yokota, Tadaaki [Abstract] [Full Text]; Yoshida, Katsuhiko [Abstract] [Full Text]; Yuda, Toshiyuki [Abstract] [Full Text]; Yun, Kwok L. [Abstract] [Full Text]
Z: Zhao, Zhi-Qing [Abstract] [Full Text]; Zund, Gregor [Abstract] [Full Text]