ATS -- Index by Author (62 [2])

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Index by Author: Volume 62, Issue 2 (August 1996) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abuchaim, Décio [Abstract] [Full Text]; Ad, Niv [Full Text]; Adams, David H. [Abstract] [Full Text]; Addonizio, Linda J. [Abstract] [Full Text]; Akamatsu, Hideki [Abstract] [Full Text]; Akins, Cary W. [Full Text]; Al-Ebrahim, Khalid E. [Full Text]; Aldea, Gabriel S. [Abstract] [Full Text]; Alexi-Meskishvili, Vladimir [Abstract] [Full Text]; Alhan, H. Cem [Abstract] [Full Text]; Allen, Mark S. [Abstract] [Full Text]; Allen, Rosemary B. [Abstract] [Full Text]; Alwan, Kifah [Abstract] [Full Text]; Annecchino, Francesco P. [Abstract] [Full Text]; Aponte, Reynaldo L. [Abstract] [Full Text]; Apostolopoulou, Sotiria [Abstract] [Full Text]; Aranki, Sary F. [Abstract] [Full Text]; Arbulu, Agustin [Full Text]; Arom, Kit V. [Abstract] [Full Text]; Asimakis, Gregory K. [Abstract] [Full Text]; Asou, Toshihide [Abstract] [Full Text]
B: Babic, Ankica [Abstract] [Full Text]; Baldwin, Robert T. [Abstract] [Full Text]; Bannister, Kyra H. [Abstract] [Full Text]; Barak, Jacob [Full Text]; Beckel, Nicole [Abstract] [Full Text]; Benckart, Daniel H. [Abstract] [Full Text]; Bender, Harvey W., Jr [Full Text]; Benfield, John R. [Full Text]; Benoit, Charles H. [Abstract] [Full Text]; Berger, Stuart [Abstract] [Full Text]; Berkheimer, Marie D. [Abstract] [Full Text]; Berry, Gerald J. [Abstract] [Full Text]; Birk, Einat [Full Text]; Bolman, R. Morton, III [Abstract] [Full Text]; Boonstra, Piet W. [Abstract] [Full Text]; Briffa, Norman P. [Abstract] [Full Text]; Brooks, Vina Isach [Abstract] [Full Text]; Brunelli, Federico [Abstract] [Full Text]; Buffolo, Enio [Full Text]; Burdon, Thomas A. [Abstract] [Full Text]; Butler, John [Abstract] [Full Text]
C: Çakalagaoglu, Cantürk [Abstract] [Full Text]; Carey, Joseph S. [Full Text]; Casaday, Floyd M. [Abstract] [Full Text]; Casali, Giovanni [Abstract] [Full Text]; Casimir-Ahn, Henrik [Abstract] [Full Text]; Cerfolio, Robert J. [Abstract] [Full Text]; Champlin, Anna [Abstract] [Full Text]; Chien, Sufan [Abstract] [Full Text]; Chikada, Masahide [Abstract] [Full Text]; Chisdak, Michael W. [Abstract] [Full Text]; Cho, Yong D. [Abstract] [Full Text]; Chocron, Sidney [Abstract] [Full Text]; Christakis, George T. [Abstract] [Full Text]; Clair, Mark J. [Abstract] [Full Text]; Clarke, Stephen [Abstract] [Full Text]; Clement, François [Abstract] [Full Text]; Cohen, Gideon [Abstract] [Full Text]; Cohn, Lawrence H. [Abstract] [Full Text]; Collins, John J., Jr [Abstract] [Full Text]; Conti, Vincent R. [Abstract] [Full Text]; Cooley, Denton A. [Abstract] [Full Text]; Cooper, Michael [Abstract] [Full Text]; Cordier, Anne [Abstract] [Full Text]; Cosgrove, Delos M., III [Abstract] [Full Text]; Costa, Francisco Diniz Affonso da [Abstract] [Full Text]; Costa, Iseu Affonso da [Abstract] [Full Text]; Coulden, Richard [Abstract] [Full Text]; Couper, Gregory S. [Abstract] [Full Text]; Cox, Monty H. [Abstract] [Full Text]; Crawford, Fred A., Jr [Full Text]; Crawford, Fred A., Jr [Abstract] [Full Text]; Crupi, Giancarlo [Abstract] [Full Text]; Crystal, Ronald G. [Abstract] [Full Text]
D: Daenen, Willem J. [Full Text]; Dähnert, Ingo [Abstract] [Full Text]; Davis, Elizabeth A. [Abstract] [Full Text]; De Giacomo, Tiziano [Full Text]; De Leyn, Paul R. J. [Abstract] [Full Text]; De Salazar, Alvaro O. [Full Text]; Deschamps, Claude [Abstract] [Full Text]; Dietl, Charles A. [Abstract] [Full Text]; Dobell, Anthony R. C. [Full Text]; Donahue, Bryan C. [Abstract] [Full Text]; Doursounian, Mheir [Abstract] [Full Text]; Dunn, Julie A. [Abstract] [Full Text]
E: Eberl, Thomas [Abstract] [Full Text]; Egan, Thomas M. [Full Text]; Eguchi, Shoji [Abstract] [Full Text]; Elkins, Ronald C. [Abstract] [Full Text]; Emery, Ann M. [Abstract] [Full Text]; Emery, Robert W. [Abstract] [Full Text]; Etievent, Joseph-Philippe [Abstract] [Full Text]
F: Faraco, Djalma Luiz [Abstract] [Full Text]; Fedderly, Raymond T. [Abstract] [Full Text]; Ferguson, Mark K. [Abstract] [Full Text]; Ferguson, Mark K. [Abstract] [Full Text]; Ferguson, T. Bruce, Jr [Abstract] [Full Text]; Fisk, R. Leighton [Full Text]; Flameng, Willem J. [Abstract] [Full Text]; Flameng, Willem J. [Full Text]; Flavin, Thomas F. [Abstract] [Full Text]; Friedberg, David Z. [Abstract] [Full Text]; Frommelt, Michele A. [Abstract] [Full Text]; Frommelt, Peter C. [Abstract] [Full Text]; Fukae, Kouji [Abstract] [Full Text]; Furuse, Akira [Abstract] [Full Text]
G: Gallagher, Michael W. [Abstract] [Full Text]; Garcia, Lázaro [Abstract] [Full Text]; Gaspar, Rogério [Abstract] [Full Text]; Gilbert, Christian L. [Abstract] [Full Text]; Gillis, D. Alex [Abstract] [Full Text]; Ginsberg, Robert J. [Abstract] [Full Text]; Gnaiger, Erich [Abstract] [Full Text]; Goar, Frederick G. St. [Abstract] [Full Text]; Gonzalez, Jose A. [Full Text]; Gordon, Paul J. [Abstract] [Full Text]; Granfeldt, Hans [Abstract] [Full Text]; Gu, Y. J. [Abstract] [Full Text]
H: Hahn, Rebecca T. [Abstract] [Full Text]; Hanley, Frank L. [Abstract] [Full Text]; Hashim, Sabet W. [Full Text]; Haworth, Sheila G. [Abstract] [Full Text]; Heitmiller, Richard F. [Abstract] [Full Text]; Hendrickson, Steven C. [Abstract] [Full Text]; Hengster, Paul [Abstract] [Full Text]; Herold, Manfred [Abstract] [Full Text]; Hetzer, Roland [Abstract] [Full Text]; Hsu, Daphne T. [Abstract] [Full Text]; Hui, Jia-J. [Abstract] [Full Text]; Huyzen, Robert J. [Abstract] [Full Text]
I: Idiz, Mustafa [Abstract] [Full Text]; Ikonomidis, John S. [Abstract] [Full Text]; Ikram, Shahid [Abstract] [Full Text]; Ishino, Kozo [Abstract] [Full Text]; Isom, O. Wayne [Abstract] [Full Text]
J: Jacobs, Marshall L. [Abstract] [Full Text]; Jamieson, Morgan P. G. [Abstract] [Full Text]; Jannis, Nicole C. P. [Abstract] [Full Text]; Järvinen, Antero [Abstract] [Full Text]; Jha, Neerod K. [Abstract] [Full Text]; John, Lindsay C. H. [Abstract] [Full Text]
K: Kado, Hideaki [Abstract] [Full Text]; Kaili, Djamel [Abstract] [Full Text]; Kawauchi, Motohiro [Abstract] [Full Text]; Kayacioglu, Ilyas [Abstract] [Full Text]; Kessel, Maryanne W. [Abstract] [Full Text]; Keto, Pekka [Abstract] [Full Text]; Kichuk, Maryanne R. [Abstract] [Full Text]; Kieta, Derek R. [Abstract] [Full Text]; Klein, Judith R. [Abstract] [Full Text]; Ko, Wilson [Abstract] [Full Text]; Koger, Kim E. [Abstract] [Full Text]; Koike, Teruaki [Abstract] [Full Text]; Komai, Hiroyoshi [Abstract] [Full Text]; Komeda, Masashi [Abstract] [Full Text]; Koza, Michael J. [Abstract] [Full Text]; Kroshus, Timothy J. [Abstract] [Full Text]; Kshettry, Vibhu R. [Abstract] [Full Text]; Kugan, G. [Abstract] [Full Text]; Kurita, Yuzo [Abstract] [Full Text]
L: Lajos, Thomas Z. [Abstract] [Full Text]; Lakéhal, Mohamed [Abstract] [Full Text]; Lane, Mary M. [Abstract] [Full Text]; Lange, Peter E. [Abstract] [Full Text]; Lasley, Robert D. [Full Text]; Launois, Bernard [Abstract] [Full Text]; Lazar, Harold L. [Abstract] [Full Text]; LeClerc, Jean-Louis [Abstract] [Full Text]; Lee, Jeffrey D. [Abstract] [Full Text]; Lerut, Toni E. [Abstract] [Full Text]; Levin, L. Scott [Abstract] [Full Text]; Lewis, Alan B. [Abstract] [Full Text]; Lewis, David A. [Abstract] [Full Text]; Lewis, Ralph J. [Full Text]; Lick, Scott D. [Abstract] [Full Text]; Liddicoat, John R. [Abstract] [Full Text]; Litwin, S. Bert [Abstract] [Full Text]; Logan, Robert W. [Abstract] [Full Text]; Lönn, Urban [Abstract] [Full Text]; Luciani, Giovanni Battista [Abstract] [Full Text]
M: MacArthur, Kenneth J. D. [Abstract] [Full Text]; Mack, Charles A. [Abstract] [Full Text]; Magovern, Christopher J. [Abstract] [Full Text]; Malledant, Yannick [Abstract] [Full Text]; Margreiter, Raimund [Abstract] [Full Text]; McCue, Carolyn [Abstract] [Full Text]; McElhinney, Doff B. [Abstract] [Full Text]; Mentzer, Robert M., Jr [Full Text]; Merlo, Maurizio [Abstract] [Full Text]; Meunier, Bernard [Abstract] [Full Text]; Meyns, Bart P. [Full Text]; Mignosa, Carmelo [Abstract] [Full Text]; Mikhail, Adel A. [Full Text]; Miller, Joseph I., Jr [Full Text]; Misko, Thomas P. [Abstract] [Full Text]; Mitchell, R. Scott [Abstract] [Full Text]; Miyaji, Kagami [Abstract] [Full Text]; Miyamura, Haruo [Abstract] [Full Text]; Mooney, Michael R. [Abstract] [Full Text]; Morea, Christopher J. [Abstract] [Full Text]; Mukherjee, Rupak [Abstract] [Full Text]; Murphy, John D. [Abstract] [Full Text]; Mussatto, Kathleen A. [Abstract] [Full Text]; Musumeci, Francesco [Abstract] [Full Text]
N: Nackaerts, Yolande H. [Abstract] [Full Text]; Nair, Shivkumar [Full Text]; Nashef, Samer A. M. [Abstract] [Full Text]; Naunheim, Keith S. [Abstract] [Full Text]; Nissen, Mark D. [Abstract] [Full Text]; Norwood, William I., Jr [Abstract] [Full Text]
O: O, Seung-Jun [Abstract] [Full Text]; O'Gara, Paul [Abstract] [Full Text]; Odell, John A. [Full Text]; Ogino, Hitoshi [Abstract] [Full Text]; Olak, Jemi [Abstract] [Full Text]; Ono, Minoru [Abstract] [Full Text]; Ott, David A. [Abstract] [Full Text]; Øvrum, Eivind [Full Text]; Oz, Mehmet C. [Abstract] [Full Text]
P: Pairolero, Peter C. [Abstract] [Full Text]; Pak, Alexander [Abstract] [Full Text]; Passik, Cary S. [Full Text]; Pathi, Vivek L. [Abstract] [Full Text]; Paton, Robert D. [Abstract] [Full Text]; Pelech, Andrew N. [Abstract] [Full Text]; Peters, William S. [Abstract] [Full Text]; Peterzén, Bengt [Abstract] [Full Text]; Petsikas, Dimitri [Abstract] [Full Text]; Pharr, William F. [Abstract] [Full Text]; Pifarré, Roque [Abstract] [Full Text]; Pizarro, Christian [Abstract] [Full Text]; Poffo, Robinson [Abstract] [Full Text]; Pollock, James C. S. [Abstract] [Full Text]; Pompili, Mario F. [Abstract] [Full Text]
Q: Quaegebeur, Jan M. [Abstract] [Full Text]; Quigley, Robert L. [Abstract] [Full Text]
R: Rao, Vivek [Abstract] [Full Text]; Reddy, V. Mohan [Abstract] [Full Text]; Reeder, Laurie B. [Abstract] [Full Text]; Rega, Filip R. L. [Abstract] [Full Text]; Reitknecht, Felice L. [Abstract] [Full Text]; Reitz, Bruce A. [Abstract] [Full Text]; Rendina, Erino A. [Full Text]; Reul, George J. [Abstract] [Full Text]; Rhomberg, Martin [Abstract] [Full Text]; Ribakove, Greg H. [Abstract] [Full Text]; Ricci, Costante [Full Text]; Rizzo, Robert J. [Abstract] [Full Text]; Robicsek, Francis [Full Text]; Robinson, M. Clive [Abstract] [Full Text]; Roge, Claude [Abstract] [Full Text]; Rome, Jonathan J. [Abstract] [Full Text]; Rosengart, Todd K. [Abstract] [Full Text]; Ross, David B. [Abstract] [Full Text]; Rutberg, Hans [Abstract] [Full Text]; Rychik, Jack [Abstract] [Full Text]
S: Sabik, Joseph F. [Abstract] [Full Text]; Salerno, Tomas A. [Abstract] [Full Text]; Salerno, Tomas A. [Full Text]; Salley, Robert K. [Abstract] [Full Text]; Salvenmoser, Willi [Abstract] [Full Text]; Savage, Edward B. [Abstract] [Full Text]; Scanlon, Paul D. [Abstract] [Full Text]; Schil, Paul E. Van [Abstract] [Full Text]; Schröcksnadel, Hans [Abstract] [Full Text]; Sergeant, Paul T. [Full Text]; Seymour, Anne-Marie L. [Abstract] [Full Text]; Shamji, Farid M. [Abstract] [Full Text]; Shapira, Oz M. [Abstract] [Full Text]; Sharma, Bal K. [Abstract] [Full Text]; Sharma, Ramesh K. [Abstract] [Full Text]; Shemin, Richard J. [Abstract] [Full Text]; Shiokawa, Yuichi [Abstract] [Full Text]; Shukla, Vinayak [Abstract] [Full Text]; Siegel, Lawrence C. [Abstract] [Full Text]; Smith, Peter K. [Abstract] [Full Text]; Smolenski, Ryszard T. [Abstract] [Full Text]; Snir, Eitan [Full Text]; Spiliopoulos, Yorgos [Abstract] [Full Text]; Spinale, Francis G. [Abstract] [Full Text]; Starnes, Vaughn A. [Abstract] [Full Text]; Stasik, Christian [Abstract] [Full Text]; Steinlechner, Rosmarie [Abstract] [Full Text]; Stellingwerf, Pieter [Abstract] [Full Text]; Stevens, John H. [Abstract] [Full Text]; Sugawara, Masa-aki [Abstract] [Full Text]; Sullivan, Patrick M. [Abstract] [Full Text]; Suri, Rajendar K. [Abstract] [Full Text]
T: Taberlet, Christian [Abstract] [Full Text]; Takach, Thomas J. [Abstract] [Full Text]; Takeda, Makoto [Abstract] [Full Text]; Takizawa, Tsuneyo [Abstract] [Full Text]; Tangen, Geir [Full Text]; Tarcan, Sümer [Abstract] [Full Text]; Tarnoff, Harold [Abstract] [Full Text]; Tayyareci, Gülsah [Abstract] [Full Text]; Temes, R. Thomas [Abstract] [Full Text]; Terashima, Masanori [Abstract] [Full Text]; Terrell, Mark R. [Abstract] [Full Text]; Terzi, Amedeo [Abstract] [Full Text]; Thomas, John P. [Abstract] [Full Text]; Todd, Thomas R. J. [Abstract] [Full Text]; Toomasian, John M. [Abstract] [Full Text]; Toubin, Gérard [Abstract] [Full Text]; Trastek, Victor F. [Abstract] [Full Text]; Treanor, Patrick [Abstract] [Full Text]; Turley, Kerry M. [Abstract] [Full Text]; Turley, Kevin [Abstract] [Full Text]; Tweddell, James S. [Abstract] [Full Text]; Tyndall, Michael [Abstract] [Full Text]
U: Uhlemann, Frank [Abstract] [Full Text]
V: Vachiery, Jean-Luc [Abstract] [Full Text]; Vaidya, Apurv B. [Full Text]; Van Marck, Eric A. [Abstract] [Full Text]; van Oeveren, Willem [Abstract] [Full Text]; Van Raemdonck, Dirk E. M. [Abstract] [Full Text]; Venuta, Federico [Full Text]; Vercauteren, Sven R. [Abstract] [Full Text]; Verkkala, Kalervo [Abstract] [Full Text]; Vermeire, Paul A. [Abstract] [Full Text]; Vidne, Bernardo A. [Full Text]; Vierra, Mark A. [Abstract] [Full Text]; Vincent, Jean-Louis [Abstract] [Full Text]; Voutilainen, Sari [Abstract] [Full Text]
W: Walenga, Jeanine M. [Abstract] [Full Text]; Wallwork, John [Abstract] [Full Text]; Wampler, Richard K. [Abstract] [Full Text]; Wan, Song [Abstract] [Full Text]; Watanabe, Hiroshi [Abstract] [Full Text]; Webber, Eric M. [Abstract] [Full Text]; Wei, Feiyan [Abstract] [Full Text]; Weisel, Richard D. [Abstract] [Full Text]; Wells, Winfield J. [Abstract] [Full Text]; Weng, Yuguo [Abstract] [Full Text]; Wernly, Jorge A. [Abstract] [Full Text]; Williams, Marcus G. [Abstract] [Full Text]; Williams, Mathew R. [Abstract] [Full Text]; Wong, Rose S. [Abstract] [Full Text]; Woods, Edward L. [Abstract] [Full Text]; Worrall, Neil K. [Abstract] [Full Text]; Wu, Guanghan [Abstract] [Full Text]
Y: Yacoub, Magdi H. [Abstract] [Full Text]; Yasui, Hisataka [Abstract] [Full Text]; Yigiter, Besim [Abstract] [Full Text]
Z: Zhang, Futing [Abstract] [Full Text]; Zhang, John [Abstract] [Full Text]; Ziolkowska, Lidia [Abstract] [Full Text]; Zuazo, Joseba [Full Text]; Zych, Marek [Abstract] [Full Text]