ATS -- Index by Author (60 [1])

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Index by Author: Volume 60, Issue 1 (July 1995) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abboud, Nabil [Abstract] [Full Text]; Adams, David C. [Abstract] [Full Text]; Akar, Haci [Full Text]; Akhter, Mohammed [Full Text]; Alkhulaifi, Abdul M. [Abstract] [Full Text]; Andréassian, Bernard [Abstract] [Full Text]; Angelini, Gianni D. [Abstract] [Full Text]; Ardehali, Abbas [Abstract] [Full Text]; Armstrong, Brenda E. [Abstract] [Full Text]; Arom, Kit V. [Abstract] [Full Text]; Autschbach, Rüdiger [Abstract] [Full Text]
B: Banerjee, Amit [Full Text]; Baretti, Rufus [Abstract] [Full Text]; Baryalei, Mersa [Abstract] [Full Text]; Bauer, Spomenko [Abstract] [Full Text]; Bavaria, Joseph E. [Abstract] [Full Text]; Beattie, Edward J., Jr [Abstract] [Full Text]; Benfield, John R. [Abstract] [Full Text]; Benoit, Charles H. [Abstract] [Full Text]; Beyersdorf, Friedhelm [Abstract] [Full Text]; Bharati, Saroja [Abstract] [Full Text]; Bianchi, Joe D. [Abstract] [Full Text]; Binns, Oliver A. R. [Abstract] [Full Text]; Birdi, Inderpaul [Abstract] [Full Text]; Bittner, Hartmuth B. [Abstract] [Full Text]; Black, Michael D. [Abstract] [Full Text]; Bohn, Desmond [Abstract] [Full Text]; Bolling, Steven F. [Abstract] [Full Text]; Boone, Sharon A. [Full Text]; Borst, Hans-Georg [Abstract] [Full Text]; Borst, Hans-Georg [Abstract] [Full Text]; Bradley, Scott M. [Abstract] [Full Text]; Brodman, Richard F. [Full Text]; Bryan, Alan J. [Abstract] [Full Text]; Buchanan, Scott A. [Abstract] [Full Text]; Buehner, Beate [Abstract] [Full Text]; Bull, Catherine [Abstract] [Full Text]; Burt, Michael E. [Abstract] [Full Text]
C: Calhoon, John H. [Abstract] [Full Text]; Calhoon, John H. [Abstract] [Full Text]; Cascade, Philip N. [Abstract] [Full Text]; Ccp, [Abstract] [Full Text]; Chen, Edward P. [Abstract] [Full Text]; Chiemmongkoltip, Pipit [Abstract] [Full Text]; Chiu, Ray C.-J. [Abstract] [Full Text]; Christenson, Wayne [Abstract] [Full Text]; Clements, Fiona M. [Abstract] [Full Text]; Cohen, Daniel M. [Full Text]; Coles, John G. [Abstract] [Full Text]; Cope, Jeffrey T. [Abstract] [Full Text]; Cox, James L. [Abstract] [Full Text]; Craver, Joseph M. [Abstract] [Full Text]; Creswell, Lawrence L. [Abstract] [Full Text]; Croughwell, Narda D. [Full Text]; Curtis, Jack J. [Abstract] [Full Text]
D: DaGsali, Sabri [Full Text]; Daily, Bill B. [Abstract] [Full Text]; Dalichau, Harald [Abstract] [Full Text]; Danielson, Gordon K. [Abstract] [Full Text]; Davis, Robert D. [Abstract] [Full Text]; De Gasperis, Carlo [Full Text]; De Graaff, Casper S. [Abstract] [Full Text]; de Leval, Marc R. [Abstract] [Full Text]; Deanfield, John E. [Abstract] [Full Text]; DeLeon, Serafin Y. [Abstract] [Full Text]; DeLima, Nuno F. [Abstract] [Full Text]; Demirtas, M. Murat [Full Text]; Demmy, Todd L. [Abstract] [Full Text]; Detterbeck, Frank C. [Abstract] [Full Text]; Dietl, Charles A. [Abstract] [Full Text]; Drinkwater, Davis C., Jr [Abstract] [Full Text]; Driscoll, David J. [Abstract] [Full Text]
E: Eckel, Lothar [Abstract] [Full Text]; Eckstein, Friedrich Stefan [Abstract] [Full Text]; Edgerton, T. Arthur [Abstract] [Full Text]; Edwards, Niloo M. [Abstract] [Full Text]; Edwards, William D. [Abstract] [Full Text]; Egan, Thomas M. [Abstract] [Full Text]; Ehrlich, Marek [Abstract] [Full Text]; Elliott, Martin J. [Abstract] [Full Text]; Emery, Robert W. [Abstract] [Full Text]; Ewy, Marvin F. [Abstract] [Full Text]
F: Falk, Volkmar [Abstract] [Full Text]; Felger, Mark C. [Abstract] [Full Text]; Fetter, John E. [Abstract] [Full Text]; Fisher, Elizabeth A. [Abstract] [Full Text]; Flachsbart, Keith D. [Abstract] [Full Text]; Floch, Neil R. [Abstract] [Full Text]; Freedom, Robert M. [Abstract] [Full Text]; Frist, The Honorable William H. [Full Text]; Frost, Adaani [Abstract] [Full Text]
G: Gall, Stanley A., Jr [Abstract] [Full Text]; Gates, Richard N. [Abstract] [Full Text]; Gaynor, J. William [Abstract] [Full Text]; Ghosh, Probal K. [Full Text]; Goldstraw, Peter [Full Text]; Goldstraw, Peter [Abstract] [Full Text]; Gott, John Parker [Abstract] [Full Text]; Grabenwoeger, Martin [Abstract] [Full Text]; Grannis, Frederic W., Jr [Abstract] [Full Text]; Greason, Kevin L. [Abstract] [Full Text]; Grote, Jochen [Abstract] [Full Text]; Gruenwald, Colleen [Abstract] [Full Text]; Guyton, Robert A. [Abstract] [Full Text]
H: Haines, G. Kenneth, III [Abstract] [Full Text]; Hammond, William G. [Abstract] [Full Text]; Hannan, Robert L. [Abstract] [Full Text]; Hardesty, Robert L. [Abstract] [Full Text]; Harr, Charles D. [Abstract] [Full Text]; Harvey, James C. [Abstract] [Full Text]; Havel, Michael [Abstract] [Full Text]; Hawkins, John A. [Abstract] [Full Text]; Heinemann, Markus K. [Abstract] [Full Text]; Hemp, James R. [Abstract] [Full Text]; Hiratzka, Loren F. [Full Text]; Hochwald, Steven N. [Abstract] [Full Text]; Holen, Einfrid Åm [Abstract] [Full Text]; Hopkins, Richard A. [Abstract] [Full Text]; Horner, Simon M. [Abstract] [Full Text]
I: Iannettoni, Mark D. [Abstract] [Full Text]; Ilbawi, Michel N. [Abstract] [Full Text]; Istad, Reidar [Abstract] [Full Text]; Izzat, Mohammad Bashar [Abstract] [Full Text]
J: Janssen, Douglas P. B. [Abstract] [Full Text]; Johnson, Jeremy R. [Abstract] [Full Text]; Johnson, Scott B. [Abstract] [Full Text]; Johnson, Scott B. [Abstract] [Full Text]; Jonassen, Amy E. [Abstract] [Full Text]; Jones, Ellis L. [Abstract] [Full Text]; Joob, Axel W. [Abstract] [Full Text]; Jurmann, Michael J. [Abstract] [Full Text]; Justicz, Alexander G. [Abstract] [Full Text]
K: Kabeer, Meerasahib [Full Text]; Kaczer, Elias [Abstract] [Full Text]; Kao, Race L. [Abstract] [Full Text]; Kaplan, Mehmet [Full Text]; Kaplon, Richard J. [Abstract] [Full Text]; Karl, Tom R. [Abstract] [Full Text]; Katz, Nevin M. [Abstract] [Full Text]; Kazerooni, Ella A. [Abstract] [Full Text]; Kendall, Simon W. H. [Abstract] [Full Text]; Khanna, Sudershan K. [Full Text]; Kies, Merrill S. [Abstract] [Full Text]; Kim, Joo Hyun [Abstract] [Full Text]; Klepetko, Walter [Abstract] [Full Text]; Konishi, Yutaka [Abstract] [Full Text]; Kouchoukos, Nicholas T. [Abstract] [Full Text]; Krishnan, Muthu S. [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Kupilik, Natascha [Abstract] [Full Text]; Kwiatkowski, Pawel [Abstract] [Full Text]
L: Laks, Hillel [Abstract] [Full Text]; Langenburg, Scott E. [Abstract] [Full Text]; Lapsley, Marta [Abstract] [Full Text]; Levin, Serle K. [Abstract] [Full Text]; Levy, Warren J. [Abstract] [Full Text]
M: Matsumoto, Masahiko [Abstract] [Full Text]; Mauney, Michael C. [Abstract] [Full Text]; Maxwell, J. Matthew [Abstract] [Full Text]; McCann, Richard L. [Abstract] [Full Text]; McGough, Edwin C. [Abstract] [Full Text]; Menahem, Samuel [Abstract] [Full Text]; Micalizzi, Ezio [Full Text]; Michler, Robert E. [Abstract] [Full Text]; Michler, Robert E. [Abstract] [Full Text]; Mill, Michael R. [Abstract] [Full Text]; Miller, O. Lawayne [Abstract] [Full Text]; Miller, O. Lawayne [Abstract] [Full Text]; Minich, L. Luann [Abstract] [Full Text]; Miwa, Senri [Abstract] [Full Text]; Mohr, Friedrich W. [Abstract] [Full Text]; Moidl, Reinhard [Abstract] [Full Text]; Moreno-Cabral, Ricardo J. [Abstract] [Full Text]; Mortiz, Anton [Abstract] [Full Text]; Moulton, Michael J. [Abstract] [Full Text]; Mügge, Andreas [Abstract] [Full Text]; Murkin, John M. [Full Text]; Murphy, Suzan F. [Abstract] [Full Text]; Musiani, Antonello [Full Text]; Mutch, W. Alan C. [Full Text]
N: Nayak, Vijaya M. [Full Text]; Nesbitt, Jonathan C. [Full Text]; Newman, Mark F. [Full Text]; Nielsen, James L. [Abstract] [Full Text]; Nomura, Fumikazu [Abstract] [Full Text]; Novick, Richard J. [Abstract] [Full Text]
O: Orringer, Mark B. [Abstract] [Full Text]; Øvrum, Eivind [Abstract] [Full Text]; Ow, E. Phillip [Abstract] [Full Text]; Owen, Clarence H. [Abstract] [Full Text]
P: Parekh, Vikas I. [Abstract] [Full Text]; Park, Kay-Hyun [Abstract] [Full Text]; Patterson, G. Alexander [Abstract] [Full Text]; Pawade, Ash [Abstract] [Full Text]; Penny, Daniel J. [Abstract] [Full Text]; Perry, Michael C. [Abstract] [Full Text]; Petersen, Rebecca J. [Abstract] [Full Text]; Pifarré, Roque [Abstract] [Full Text]; Popper, Robert W. [Abstract] [Full Text]; Port, Jeffrey L. [Abstract] [Full Text]; Puga, Francisco J. [Abstract] [Full Text]; Pugsley, Wilf B. [Abstract] [Full Text]
Q: Quinones, Jose A. [Abstract] [Full Text]; Quint, Leslie E. [Abstract] [Full Text]
R: Rebeyka, Ivan M. [Abstract] [Full Text]; Rees, Philip G. [Abstract] [Full Text]; Regragui, Idriss A. [Abstract] [Full Text]; Reves, Joseph G. [Full Text]; Rho, Joon Ryang [Abstract] [Full Text]; Richter, Richard C. [Abstract] [Full Text]; Ringdal, Mari-Anne L. [Abstract] [Full Text]; Rokkas, Chris K. [Abstract] [Full Text]; Rosenbloom, Michael [Abstract] [Full Text]; Ruttenberg, Herbert D. [Abstract] [Full Text]
S: Sako, Edward Y. [Abstract] [Full Text]; Sako, Edward Y. [Full Text]; Sako, Edward Y. [Abstract] [Full Text]; Sandhu, Aqeel A. [Abstract] [Full Text]; Sandhu, Aqeel A. [Abstract] [Full Text]; Schäfers, Hans-Joachim [Abstract] [Full Text]; Schäfers, Hans-Joachim [Abstract] [Full Text]; Scheidt, Albert [Abstract] [Full Text]; Schilte, Piet P. M. [Abstract] [Full Text]; Schwartz, Arthur E. [Abstract] [Full Text]; Schwartz, Marc [Abstract] [Full Text]; Shen, Yannan [Abstract] [Full Text]; Shields, Thomas W. [Abstract] [Full Text]; Shockey, Kim S. [Abstract] [Full Text]; Simon, Paul [Abstract] [Full Text]; Sistino, Joseph J. [Abstract] [Full Text]; Stark, Jaroslav [Abstract] [Full Text]; Stitt, Larry [Abstract] [Full Text]; Sturtevant, Jane E. [Abstract] [Full Text]; Sullivan, Ian D. [Abstract] [Full Text]; Sung, Sook Whan [Abstract] [Full Text]; Swain, Julie A. [Full Text]; Swanton, R. Howard [Abstract] [Full Text]; Szarnicki, Robert J. [Abstract] [Full Text]
T: Tangen, Geir [Abstract] [Full Text]; Tani, Lloyd Y. [Abstract] [Full Text]; Tarnoff, Harold [Abstract] [Full Text]; Taylor, Frederick H. [Abstract] [Full Text]; Taylor, James F. N. [Abstract] [Full Text]; Tesluk, Henry [Abstract] [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]; Trinkle, J. Kent [Abstract] [Full Text]; Trinkle, J. Kent [Abstract] [Full Text]; Trusler, George A. [Abstract] [Full Text]; Turley, Kevin [Abstract] [Full Text]
U: Ungerleider, Ross M. [Abstract] [Full Text]
V: Van Dijk, Hans A. [Abstract] [Full Text]; van Son, Jacques A. M. [Abstract] [Full Text]; Van Trigt, Peter, III [Abstract] [Full Text]; Victor, Solomon [Full Text]; Vitullo, Dolores A. [Abstract] [Full Text]
W: Wagman, Lawrence D. [Abstract] [Full Text]; Wagner, Robert B. [Full Text]; Wallace, Robert B. [Abstract] [Full Text]; Walley, Virginia M. [Full Text]; Walsh, Garrett L. [Full Text]; Walther, Thomas [Abstract] [Full Text]; Wang, Hong-Yue [Abstract] [Full Text]; Weintraub, William S. [Abstract] [Full Text]; Whyte, Richard I. [Abstract] [Full Text]; Williams, William G. [Abstract] [Full Text]; Wittpenn, Gregory P. [Abstract] [Full Text]; Wong, Kit [Abstract] [Full Text]
Y: Young, William L. [Abstract] [Full Text]; Yuasa, Sadatoshi [Abstract] [Full Text]
Z: Zibaitis, Audrius [Abstract] [Full Text]; Zollinger, Richard W., II [Abstract] [Full Text]